@inproceedingsJafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title=Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations, booktitle=European Test Symposium, The Hague, Netherlands, May 20-24, 2024, publisher=IEEE, author=Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim, pages=6 
LibreCat: /record/52744

@inproceedingsJafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title=Vmin Testing under Variations: Defect vs. Fault Coverage, booktitle=IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, publisher=IEEE, author=Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim, pages=6 
LibreCat: /record/52742

@inproceedingsHellebrand_Sadeghi-Kohan_Wunderlich, title=Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle, booktitle=International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, author=Hellebrand, Sybille and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim, pages=1 
LibreCat: /record/52743

@inproceedingsWunderlich_Jafarzadeh_Hellebrand, title=Robust Test of Small Delay Faults under  PVT-Variations, booktitle=International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, author=Wunderlich, Hans-Joachim and Jafarzadeh, Hanieh and Hellebrand, Sybille, pages=1 
LibreCat: /record/52745

@inproceedingsSadeghi-Kohan_Hellebrand_Wunderlich_2023, title=Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication, DOI=10.1109/dsn-w58399.2023.00056, booktitle=2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2023 
LibreCat: /record/46739
DOI: 10.1109/dsn-w58399.2023.00056

@inproceedingsSadeghi-Kohan_Reimer_Hellebrand_Wunderlich_2023, place=Beijing, China, title=Optimizing the Streaming of Sensor Data with Approximate Communication, booktitle=IEEE Asian Test Symposium (ATS’23), October 2023, author=Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2023 
LibreCat: /record/46738

@inproceedingsJafarzadeh_Klemme_Reimer_Najafi Haghi _Amrouch_Hellebrand _Wunderlich_2023, place=Anaheim, CA, USA, title=Robust Pattern Generation for Small Delay Faults under Process Variations, booktitle=IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023, publisher=IEEE, author=Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria and  Amrouch, Hussam and Hellebrand, Sybille and  Wunderlich, Hans-Joachim, year=2023 
LibreCat: /record/45830

@inproceedingsSprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place=Virtual Conference - Originally Frascati (Rome), Italy, title=Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study, booktitle=IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, author=Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille, year=2020 
LibreCat: /record/19422

@inproceedingsSadeghi-Kohan_Hellebrand_2020, place=Virtual Conference - Originally San Diego, CA, USA, title=Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, DOI=10.1109/vts48691.2020.9107591, booktitle=38th IEEE VLSI Test Symposium (VTS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2020 
LibreCat: /record/29200
DOI: 10.1109/vts48691.2020.9107591

@inproceedingsHolst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020, place=Virtual Conference - Originally Washington, DC, USA, title=Logic Fault Diagnosis of Hidden Delay Defects, booktitle=IEEE International Test Conference (ITC’20), November 2020, author=Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing, year=2020 
LibreCat: /record/19421

@inproceedingsMaaz_Sprenger_Hellebrand_2019, place=Washington, DC, USA, title=A Hybrid Space Compactor for Adaptive X-Handling, booktitle=50th IEEE International Test Conference (ITC), publisher=IEEE, author=Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille, year=2019, pages=1–8 
LibreCat: /record/12918

@inproceedingsRezaeizadeh Rookerd_Sadeghi-Kohan_Navabi_2018, title=Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture, DOI=10.1145/3194554.3194599, booktitle=Proceedings of the 2018 on Great Lakes Symposium on VLSI, publisher=ACM, author=Rezaeizadeh Rookerd, Ramin and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin, year=2018 
LibreCat: /record/29460
DOI: 10.1145/3194554.3194599

@inproceedingsSprenger_Hellebrand_2018, place=Budapest, Hungary, title=Tuning Stochastic Space Compaction to Faster-than-at-Speed Test, DOI=10.1109/ddecs.2018.00020, booktitle=2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits &; Systems (DDECS), publisher=IEEE, author=Sprenger, Alexander and Hellebrand, Sybille, year=2018 
LibreCat: /record/4575
DOI: 10.1109/ddecs.2018.00020

@inproceedingsLiu_Schneider_Kampmann_Hellebrand_Wunderlich_2018, title=Extending Aging Monitors for Early Life and Wear-Out Failure Prevention, DOI=10.1109/ats.2018.00028, booktitle=27th IEEE Asian Test Symposium (ATS’18), author=Liu, Chang and Schneider, Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2018 
LibreCat: /record/10575
DOI: 10.1109/ats.2018.00028

@inproceedingsSadeghi-Kohan_Vafaei_Navabi_2018, title=Near-Optimal Node Selection Procedure for Aging Monitor Placement, DOI=10.1109/iolts.2018.8474120, booktitle=2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Vafaei, Arash and Navabi, Zainalabedin, year=2018 
LibreCat: /record/29459
DOI: 10.1109/iolts.2018.8474120

@inproceedingsDeshmukh_Kunz_Wunderlich_Hellebrand_2017, place=Caesars Palace, Las Vegas, Nevada, USA, title=Special Session on Early Life Failures, DOI=10.1109/vts.2017.7928933, booktitle=35th IEEE VLSI Test Symposium (VTS’17), publisher=IEEE, author=Deshmukh, Jyotirmoy and Kunz, Wolfgang and Wunderlich, Hans-Joachim and Hellebrand, Sybille, year=2017 
LibreCat: /record/12973
DOI: 10.1109/vts.2017.7928933

@inproceedingsKampmann_Hellebrand_2017, title=Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test, DOI=10.1109/ddecs.2017.7934564, booktitle=20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17), publisher=IEEE, author=Kampmann, Matthias and Hellebrand, Sybille, year=2017 
LibreCat: /record/10576
DOI: 10.1109/ddecs.2017.7934564

@inproceedingsJenihhin_Kamkin_Navabi_Sadeghi-Kohan_2017, title=Universal mitigation of NBTI-induced aging by design randomization, DOI=10.1109/ewdts.2016.7807635, booktitle=2016 IEEE East-West Design &; Test Symposium (EWDTS), publisher=IEEE, author=Jenihhin, Maksim and Kamkin, Alexander and Navabi, Zainalabedin and Sadeghi-Kohan, Somayeh, year=2017 
LibreCat: /record/29463
DOI: 10.1109/ewdts.2016.7807635

@inproceedingsKampmann_Hellebrand_2016, place=Hiroshima, Japan, title=X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test, DOI=10.1109/ats.2016.20, booktitle=25th IEEE Asian Test Symposium (ATS’16), publisher=IEEE, author=Kampmann, Matthias and Hellebrand, Sybille, year=2016, pages=1–6 
LibreCat: /record/12975
DOI: 10.1109/ats.2016.20

@inproceedingsKampmann_A. Kochte_Schneider_Indlekofer_Hellebrand_Wunderlich_2015, place=Mumbai, India, title=Optimized Selection of Frequencies for Faster-Than-at-Speed Test, DOI=10.1109/ats.2015.26, booktitle=24th IEEE Asian Test Symposium (ATS’15), publisher=IEEE, author=Kampmann, Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2015, pages=109–114 
LibreCat: /record/12976
DOI: 10.1109/ats.2015.26