Jafarzadeh, Hanieh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Time and Space Optimized Storage-Based BIST under Multiple Voltages and Variations.” In European Test Symposium, The Hague, Netherlands, May 20-24, 2024, 6. IEEE, n.d.

Jafarzadeh, Hanieh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Vmin Testing under Variations: Defect vs. Fault Coverage.” In IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, 6. IEEE, n.d.

Hellebrand, Sybille, Somayeh Sadeghi-Kohan, and Hans-Joachim Wunderlich. “Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle.” In International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, 1, n.d.

Wunderlich, Hans-Joachim, Hanieh Jafarzadeh, and Sybille Hellebrand. “Robust Test of Small Delay Faults under  PVT-Variations.” In International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, 1, n.d.

Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication.”https://doi.org/10.1109/dsn-w58399.2023.00056__In 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W). IEEE, 2023.https://doi.org/10.1109/dsn-w58399.2023.00056 .

Sadeghi-Kohan, Somayeh, Jan Dennis Reimer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimizing the Streaming of Sensor Data with Approximate Communication.” In IEEE Asian Test Symposium (ATS’23), October 2023. Beijing, China, 2023.

Jafarzadeh, Hanieh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi Haghi, Hussam  Amrouch, Sybille Hellebrand, and Hans-Joachim  Wunderlich. “Robust Pattern Generation for Small Delay Faults under Process Variations.” In IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023. Anaheim, CA, USA: IEEE, 2023.

Sprenger, Alexander, Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille Hellebrand. “Variation-Aware Test for Logic Interconnects Using Neural Networks - A Case Study.” In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020. Virtual Conference - Originally Frascati (Rome), Italy, 2020.

Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. “Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects.”https://doi.org/10.1109/vts48691.2020.9107591__In 38th IEEE VLSI Test Symposium (VTS). Virtual Conference - Originally San Diego, CA, USA: IEEE, 2020.https://doi.org/10.1109/vts48691.2020.9107591 .

Holst, Stefan, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, and Xiaoqing Weng. “Logic Fault Diagnosis of Hidden Delay Defects.” In IEEE International Test Conference (ITC’20), November 2020. Virtual Conference - Originally Washington, DC, USA, 2020.

Maaz, Mohammad Urf, Alexander Sprenger, and Sybille Hellebrand. “A Hybrid Space Compactor for Adaptive X-Handling.” In 50th IEEE International Test Conference (ITC), 1–8. Washington, DC, USA: IEEE, 2019.

Rezaeizadeh Rookerd, Ramin, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture.”https://doi.org/10.1145/3194554.3194599__In Proceedings of the 2018 on Great Lakes Symposium on VLSI. ACM, 2018.https://doi.org/10.1145/3194554.3194599 .

Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space Compaction to Faster-than-at-Speed Test.”https://doi.org/10.1109/ddecs.2018.00020__In 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits &; Systems (DDECS). Budapest, Hungary: IEEE, 2018.https://doi.org/10.1109/ddecs.2018.00020 .

Liu, Chang, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.”https://doi.org/10.1109/ats.2018.00028__In 27th IEEE Asian Test Symposium (ATS’18), 2018.https://doi.org/10.1109/ats.2018.00028 .

Sadeghi-Kohan, Somayeh, Arash Vafaei, and Zainalabedin Navabi. “Near-Optimal Node Selection Procedure for Aging Monitor Placement.”https://doi.org/10.1109/iolts.2018.8474120__In 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS). IEEE, 2018.https://doi.org/10.1109/iolts.2018.8474120 .

Deshmukh, Jyotirmoy, Wolfgang Kunz, Hans-Joachim Wunderlich, and Sybille Hellebrand. “Special Session on Early Life Failures.”https://doi.org/10.1109/vts.2017.7928933__In 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE, 2017.https://doi.org/10.1109/vts.2017.7928933 .

Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant Compaction during Faster-than-at-Speed Test.”https://doi.org/10.1109/ddecs.2017.7934564__In 20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17). IEEE, 2017.https://doi.org/10.1109/ddecs.2017.7934564 .

Jenihhin, Maksim, Alexander Kamkin, Zainalabedin Navabi, and Somayeh Sadeghi-Kohan. “Universal Mitigation of NBTI-Induced Aging by Design Randomization.”https://doi.org/10.1109/ewdts.2016.7807635__In 2016 IEEE East-West Design &; Test Symposium (EWDTS). IEEE, 2017.https://doi.org/10.1109/ewdts.2016.7807635 .

Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.”https://doi.org/10.1109/ats.2016.20__In 25th IEEE Asian Test Symposium (ATS’16), 1–6. Hiroshima, Japan: IEEE, 2016.https://doi.org/10.1109/ats.2016.20 .

Kampmann, Matthias, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.”https://doi.org/10.1109/ats.2015.26__In 24th IEEE Asian Test Symposium (ATS’15), 109–14. Mumbai, India: IEEE, 2015.https://doi.org/10.1109/ats.2015.26 .