@articleSadeghi-Kohan_Hellebrand_Wunderlich_2023, title=Workload-Aware Periodic Interconnect BIST, DOI=10.1109/mdat.2023.3298849, journal=IEEE Design &;Test, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2023, pages=1–1 

@articleSadeghi-Kohan_Hellebrand_Wunderlich_2022, title=Stress-Aware Periodic Test of Interconnects, DOI=10.1007/s10836-021-05979-5, journal=Journal of Electronic Testing, publisher=Springer Science and Business Media LLC, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2022 

@articleSprenger_Hellebrand_2019, title=Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test, volume=28, DOI=10.1142/s0218126619400012, number=1, journal=Journal of Circuits, Systems and Computers, publisher=World Scientific Publishing Company, author=Sprenger, Alexander and Hellebrand, Sybille, year=2019, pages=1–23 

@articleKampmann_A. Kochte_Liu_Schneider_Hellebrand_Wunderlich_2019, title=Built-in Test for Hidden Delay Faults, volume=38, number=10, journal=IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), publisher=IEEE, author=Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider, Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2019, pages=1956–1968 

@articleHellebrand_Henkel_Raghunathan_Wunderlich_2018, title=Guest Editors’ Introduction - Special Issue on Approximate Computing, volume=10, DOI=10.1109/les.2018.2789942, number=1, journal=IEEE Embedded Systems Letters, publisher=IEEE, author=Hellebrand, Sybille and Henkel, Joerg and Raghunathan, Anand and Wunderlich, Hans-Joachim, year=2018, pages=1–1 

@articleKampmann_Hellebrand_2018, title=Design For Small Delay Test - A Simulation Study, volume=80, journal=Microelectronics Reliability, author=Kampmann, Matthias and Hellebrand, Sybille, year=2018, pages=124–133 

@articleSadeghi-Kohan_Kamal_Navabi_2017, title=Self-Adjusting Monitor for Measuring Aging Rate and Advancement, volume=8, DOI=10.1109/tetc.2017.2771441, number=3, journal=IEEE Transactions on Emerging Topics in Computing, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Sadeghi-Kohan, Somayeh and Kamal, Mehdi and Navabi, Zainalabedin, year=2017, pages=627–641 

@articleHuang_Liang_Hellebrand_2015, title=A High Performance SEU Tolerant Latch, volume=31, number=4, journal=Journal of Electronic Testing - Theory and Applications (JETTA), publisher=Springer, author=Huang, Zhengfeng and Liang, Huaguo and Hellebrand, Sybille, year=2015, pages=349–359 

@articleHellebrand_Wunderlich_2014, title=SAT-Based ATPG beyond Stuck-at Fault Testing, volume=56, number=4, journal=DeGruyter Journal on Information Technology (it), publisher=DeGruyter, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2014, pages=165–172 

@articleRodriguez Gomez_Cook_Indlekofer_Hellebrand_Wunderlich_2014, title=Adaptive Bayesian Diagnosis of Intermittent Faults, volume=30, number=5, journal=Journal of Electronic Testing - Theory and Applications (JETTA), publisher=Springer, author=Rodriguez Gomez, Laura and Cook, Alejandro and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2014, pages=527–540 

@articleAlizadeh_Behnam_Sadeghi-Kohan_2014, title=A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs, DOI=10.1109/tc.2014.2329687, journal=IEEE Transactions on Computers, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Alizadeh, Bijan and Behnam, Payman and Sadeghi-Kohan, Somayeh, year=2014, pages=1–1 

@articleHopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2011, title=Variation-Aware Fault Modeling, volume=54, number=4, journal=SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer, author=Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2011, pages=1813–1826 

@articleHellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, title=Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance, volume=37, number=4 (124), journal=Informacije MIDEM, Ljubljana (Invited Paper), author=Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd, year=2007, pages=212–219 

@articleAli_Hessler_Welzl_Hellebrand_2007, title=An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip, volume=1, number=2, journal=International Journal on High Performance Systems Architecture, author=Ali, Muhammad and Hessler, Sven and Welzl, Michael and Hellebrand, Sybille, year=2007, pages=113–123 

@articleBecker_Polian_Hellebrand_Straube_Wunderlich_2006, title=DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme, volume=48, number=5, journal=it - Information Technology, author=Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim, year=2006, pages=305–311 

@articleHellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_2002, title=Efficient Online and Offline Testing of Embedded DRAMs, volume=51, DOI=10.1109/tc.2002.1017700, number=7, journal=IEEE Transactions on Computers, publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav, year=2002, pages=801–809 

@articleHellebrand_Liang_Wunderlich_2002, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, volume=18, number=2, journal=Journal of Electronic Testing - Theory and Applications (JETTA), author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2002, pages=157–168 

@articleLiang_Hellebrand_Wunderlich_2002, title=A Mixed-Mode BIST Scheme Based on Folding Compression, volume=17, number=2, journal=Journal on Computer Science and Technology, author=Liang, Huaguo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2002, pages=203–212 

@articleLiang_Hellebrand_Wunderlich_2001, title=Deterministic BIST Scheme Based on Reseeding of Folding Counters, volume=38, number=8, journal=Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan), author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001, pages=931 

@articleHellebrand_Liang_Wunderlich_2001, title=A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters, volume=17, number=3/4, journal=Journal of Electronic Testing - Theory and Applications (JETTA), author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2001, pages=341–349