Hilleringmann, Ulrich, T Vieregge, and JT Horstmann. “Nanometer Scale Lateral Structures of MOS Type Layers.” In Proceedings Micro. Tec, 49–53, 2000.
LibreCat: /record/39884

Otterbach, R., and Ulrich Hilleringmann. “High Rate CVD-Diamond Etching for High Temperature Pressure Sensor Applications.” In 29th European Solid-State Device Research Conference, 1:320–23, 1999.
LibreCat: /record/39890

Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Correlation Analysis of the Statistical Electrical Parameter Fluctuations in 50 Nm MOS-Transistors.” In 28th European Solid-State Device Research Conference, 512–15, 1998.
LibreCat: /record/39893

Heinrich, L.M.H., J. Muller, Ulrich Hilleringmann, K.F. Goser, A. Holmes, Do-Hoon Hwang, and R. Stern. “CMOS-Compatible Organic Light-Emitting Diodes.”https://doi.org/10.1109/16.605463__IEEE Transactions on Electron Devices 44, no. 8 (1997): 1249–52.https://doi.org/10.1109/16.605463 .
LibreCat: /record/39896
DOI: 10.1109/16.605463

Muller, J., G. Wirth, Ulrich Hilleringmann, and K. Goser. “Analyses of Sub 1/4-Micron MOS-Transistors by Visible Light Emission.” In ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 947–50, 1996.
LibreCat: /record/39902

Horstmann, J. T., Ulrich Hilleringmann, and K. Goser. “Characterization and Matching Analysis of 50 Nm-NMOS-Transistors.” In ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 253–56, 1996.
LibreCat: /record/39900

Horstmann, JT, Ulrich Hilleringmann, and K Goser. “ESSDERC’96, Bologna, Italy.” In Conf. Dig, Vol. 253, 1996.
LibreCat: /record/39903