@inproceedingsPannemann_Diekmann_Hilleringmann_Schurmann_Scharnberg_Zaporojtchenko_Adelung_Faupel_2006, title=Encapsulating the active Layer of organic Thin-Film Transistors, DOI=10.1109/polytr.2005.1596488, booktitle=Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics, publisher=IEEE, author=Pannemann, C. and Diekmann, T. and Hilleringmann, Ulrich and Schurmann, U. and Scharnberg, M. and Zaporojtchenko, V. and Adelung, R. and Faupel, F., year=2006 
LibreCat: /record/39842
DOI: 10.1109/polytr.2005.1596488

@articlePannemann_Diekmann_Hilleringmann_2005, title=Degradation of organic field-effect transistors made of pentacene, volume=19, DOI=10.1557/jmr.2004.0267, number=7, journal=Journal of Materials Research, publisher=Springer Science and Business Media LLC, author=Pannemann, Ch. and Diekmann, T. and Hilleringmann, Ulrich, year=2005, pages=1999–2002 
LibreCat: /record/39846
DOI: 10.1557/jmr.2004.0267

@inproceedingsPannemann_Diekmann_Hilleringmann_2005, title=On the degradation of organic field-effect transistors, DOI=10.1109/icm.2004.1434210, booktitle=Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004., publisher=IEEE, author=Pannemann, Ch. and Diekmann, T. and Hilleringmann, Ulrich, year=2005 
LibreCat: /record/39848
DOI: 10.1109/icm.2004.1434210

@articlePannemann_Diekmann_Hilleringmann_2005, title=Degradation of organic field-effect transistors made of pentacene, volume=19, DOI=10.1557/jmr.2004.0267, number=7, journal=Journal of Materials Research, publisher=Springer Science and Business Media LLC, author=Pannemann, Ch. and Diekmann, T. and Hilleringmann, Ulrich, year=2005, pages=1999–2002 
LibreCat: /record/39349
DOI: 10.1557/jmr.2004.0267

@articleScharnberg_Hu_Kanzow_Rätzke_Adelung_Faupel_Pannemann_Hilleringmann_Meyer_Pflaum_2005, title=Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics, volume=86, DOI=10.1063/1.1849845, number=2024104, journal=Applied Physics Letters, publisher=AIP Publishing, author=Scharnberg, M. and Hu, J. and Kanzow, J. and Rätzke, K. and Adelung, R. and Faupel, F. and Pannemann, C. and Hilleringmann, Ulrich and Meyer, S. and Pflaum, J., year=2005 
LibreCat: /record/39574
DOI: 10.1063/1.1849845

@inproceedingsScholz_Müller_Müller_Thurzo_Paez_Mancera_Zahn_Pannemann_Hilleringmann_2005, title=Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry, DOI=10.1117/12.617004, booktitle=SPIE Proceedings, publisher=SPIE, author=Scholz, R. and Müller, A.-D. and Müller, F. and Thurzo, I. and Paez, B. A. and Mancera, L. and Zahn, D. R. T. and Pannemann, C. and Hilleringmann, Ulrich, editor=Bao, Zhenan and Gundlach, David J., year=2005 
LibreCat: /record/39835
DOI: 10.1117/12.617004

@inproceedingsScholz_Müller_Müller_Thurzo_Paez_Mancera_Zahn_Pannemann_Hilleringmann_2005, title=Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry, DOI=10.1117/12.617004, booktitle=SPIE Proceedings, publisher=SPIE, author=Scholz, R. and Müller, A.-D. and Müller, F. and Thurzo, I. and Paez, B. A. and Mancera, L. and Zahn, D. R. T. and Pannemann, C. and Hilleringmann, Ulrich, editor=Bao, Zhenan and Gundlach, David J., year=2005 
LibreCat: /record/39834
DOI: 10.1117/12.617004

@inbookHilleringmann_2004, place=Wiesbaden, title=Ätztechnik, DOI=10.1007/978-3-322-94072-8_5, booktitle=Silizium-Halbleitertechnologie, publisher=Vieweg+Teubner Verlag, author=Hilleringmann, Ulrich, year=2004, pages=65–90 
LibreCat: /record/39850
DOI: 10.1007/978-3-322-94072-8_5

@inproceedingsHilleringmann_Pannemann_2004, title=Imprint structured organic thin film transistors as driving circuit in single-use sensor applications, DOI=10.1117/12.521463, booktitle=Fifth International Symposium on Instrumentation and Control Technology, publisher=SPIE, author=Hilleringmann, Ulrich and Pannemann, C., editor=Zhang, Guangjun and Zhao, Huijie and Wang, Zhongyu, year=2004 
LibreCat: /record/39872
DOI: 10.1117/12.521463

@inproceedingsOtterbach_Hilleringmann_2004, title=Piezoresistive pressure sensors in CVD diamond for high-temperature applications, DOI=10.1117/12.521928, booktitle=Fifth International Symposium on Instrumentation and Control Technology, publisher=SPIE, author=Otterbach, Ralf and Hilleringmann, Ulrich, editor=Zhang, Guangjun and Zhao, Huijie and Wang, Zhongyu, year=2004 
LibreCat: /record/39873
DOI: 10.1117/12.521928

@inproceedingsHilleringmann_Vieregge_Horstmann_2003, title=Masking and etching of silicon and related materials for geometries down to 25 nm, DOI=10.1109/iecon.1999.822171, booktitle=IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.999), publisher=IEEE, author=Hilleringmann, Ulrich and Vieregge, T. and Horstmann, J.T., year=2003 
LibreCat: /record/39887
DOI: 10.1109/iecon.1999.822171

@inproceedingsHorstmann_Hilleringmann_Goser_2003, title=Matching analysis of NMOS-transistors with a channel length down to 30 nm, DOI=10.1109/iecon.1999.822163, booktitle=IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.999), publisher=IEEE, author=Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K., year=2003 
LibreCat: /record/39888
DOI: 10.1109/iecon.1999.822163

@inproceedingsWirth_Hilleringmann_Horstmann_Goser_2003, title=Negative differential resistance in ultrashort bulk MOSFETs, DOI=10.1109/iecon.1999.822164, booktitle=IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.999), publisher=IEEE, author=Wirth, G. and Hilleringmann, Ulrich and Horstmann, J.T. and Goser, K., year=2003 
LibreCat: /record/39885
DOI: 10.1109/iecon.1999.822164

@articlePannemann_Diekmann_Hilleringmann_2003, title=Nanometer scale organic thin film transistors with Pentacene, volume=67–68, DOI=10.1016/s0167-9317(03)00146-1, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Pannemann, Ch. and Diekmann, T. and Hilleringmann, Ulrich, year=2003, pages=845–852 
LibreCat: /record/39851
DOI: 10.1016/s0167-9317(03)00146-1

@articleHilleringmann_Goser_2002, title=Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip, volume=42, DOI=10.1109/16.381978, number=5, journal=IEEE Transactions on Electron Devices, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Hilleringmann, Ulrich and Goser, K., year=2002, pages=841–846 
LibreCat: /record/39904
DOI: 10.1109/16.381978

@articleSchönstein_Müller_Hilleringmann_Goser_2002, title=Characterization of submicron NMOS devices due to visible light emission, volume=21, DOI=10.1016/0167-9317(93)90092-j, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Schönstein, I. and Müller, J. and Hilleringmann, Ulrich and Goser, K., year=2002, pages=363–366 
LibreCat: /record/39912
DOI: 10.1016/0167-9317(93)90092-j

@articleHilleringmann_Goser_2002, title=Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon, volume=19, DOI=10.1016/0167-9317(92)90425-q, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Hilleringmann, Ulrich and Goser, K., year=2002, pages=211–214 
LibreCat: /record/39914
DOI: 10.1016/0167-9317(92)90425-q

@articleBrass_Hilleringmann_Schumacher_2002, title=System integration of optical devices and analog CMOS amplifiers, volume=29, DOI=10.1109/4.297714, number=8, journal=IEEE Journal of Solid-State Circuits, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Brass, E. and Hilleringmann, Ulrich and Schumacher, K., year=2002, pages=1006–1010 
LibreCat: /record/39906
DOI: 10.1109/4.297714

@articleBrass_Hilleringmann_Schumacher_2002, title=System integration of optical devices and analog CMOS amplifiers, volume=29, DOI=10.1109/4.297714, number=8, journal=IEEE Journal of Solid-State Circuits, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Brass, E. and Hilleringmann, Ulrich and Schumacher, K., year=2002, pages=1006–1010 
LibreCat: /record/39907
DOI: 10.1109/4.297714

@articleHorstmann_Hilleringmann_Goser_2002, title=Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique, volume=30, DOI=10.1016/0167-9317(95)00280-4, number=1–4, journal=Microelectronic Engineering, publisher=Elsevier BV, author=Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K., year=2002, pages=431–434 
LibreCat: /record/39899
DOI: 10.1016/0167-9317(95)00280-4