Titanium disilicide as hot side metallization layer for thermoelectric generators
U. Hilleringmann, M. Schonhoff, F. Assion, in: 2013 Africon, IEEE, 2014.
LibreCat: /record/39518
DOI: 10.1109/afrcon.2013.6757616

Self-organization of nanospheres in trenches on silicon surfaces
K. Brassat, F. Assion, U. Hilleringmann, J. Lindner, Physica Status Solidi (A) 210 (2013) 1485–1489.
LibreCat: /record/4098
DOI: 10.1002/pssa.201200899

Self-organization of nanospheres in trenches on silicon surfaces
K. Brassat, F. Assion, U. Hilleringmann, J.K.N. Lindner, Physica Status Solidi (a) 210 (2013) 1485–1489.
LibreCat: /record/39506
DOI: 10.1002/pssa.201200899

Titanium Disilicide as High-Temperature Contact Material for Thermoelectric Generators
F. Assion, M. Schönhoff, U. Hilleringmann, Journal of Electronic Materials 42 (2013) 1932–1935.
LibreCat: /record/39508
DOI: 10.1007/s11664-013-2478-2

Enhanced organic light-emitting diode based on a columnar liquid crystal by integration in a microresonator
O. Kasdorf, J. Vollbrecht, B. Ohms, U. Hilleringmann, H. Bock, H.-S. Kitzerow, International Journal of Energy Research 38 (2013) 452–458.
LibreCat: /record/39485
DOI: 10.1002/er.3127

Design and implementation of a measurement system for automatically measurement of electrical parameters of thermoelectric generators
D. Petrov, F. Assion, U. Hilleringmann, MRS Proceedings 1490 (2013) 191–196.
LibreCat: /record/39514
DOI: 10.1557/opl.2013.318

Formation and Properties of TiSi<sub>2</sub> as Contact Material for High-Temperature Thermoelectric Generators
F. Assion, M. Schönhoff, U. Hilleringmann, MRS Proceedings 1490 (2013) 97–102.
LibreCat: /record/39523
DOI: 10.1557/opl.2012.1557

Electrical characterization of rubber mixture sheets based on a coaxial probe method in combination with 3D electromagnetic simulation model
K. Kanwar, C. Fischer, V. Geneiss, T. Mager, U. Ballhausen, C. Hedayat, U. Hilleringmann, in: 2012 IEEE International Conference on RFID-Technologies and Applications (RFID-TA), IEEE, 2013.
LibreCat: /record/39524
DOI: 10.1109/rfid-ta.2012.6404507

Enhanced event-driven modeling of a CP-PLL with nonlinearities and nonidealities
C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS), IEEE, 2013.
LibreCat: /record/39511
DOI: 10.1109/mwscas.2013.6674647

Resistivity reduction in flexible dye sensitized solar cells by UV irradiation and carbon nanotubes
U. Hilleringmann, B. Ohms, A. Kleine, in: 2013 IEEE International Conference on Industrial Technology (ICIT), IEEE, 2013.
LibreCat: /record/39509
DOI: 10.1109/icit.2013.6505770

Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor
F.F. Vidor, G. Wirth, F. Assion, K. Wolff, U. Hilleringmann, IEEE Transactions on Nanotechnology 12 (2013) 296–303.
LibreCat: /record/39504
DOI: 10.1109/tnano.2012.2236891

Design and analysis of UHF RFID tag for a rubber transmission belt based on 3D electrical model
K. Kanwar, V. Geneiss, T. Mager, S. Scheele, U. Ballhausen, C. Hedayat, U. Hilleringmann, in: 2013 21st International Conference on Software, Telecommunications and Computer Networks - (SoftCOM 2013), IEEE, 2013.
LibreCat: /record/39516
DOI: 10.1109/softcom.2013.6671864

Designing output-power-optimized thermoelectric generators via analytic and finite element method modelling
F. Assion, C. Fischer, M. Schonhof, U. Hilleringmann, C. Hedayat, in: 2013 IEEE International Conference on Industrial Technology (ICIT), IEEE, 2013.
LibreCat: /record/39515
DOI: 10.1109/icit.2013.6505756

Enhanced organic light-emitting diode based on a columnar liquid crystal by integration in a microresonator
O. Kasdorf, J. Vollbrecht, B. Ohms, U. Hilleringmann, H. Bock, H.-S. Kitzerow, International Journal of Energy Research 38 (2013) 452–458.
LibreCat: /record/39707
DOI: 10.1002/er.3127

Surface tension and its role for vertical wet etching of silicon
A. Brockmeier, F.J.S. Rodriguez, M. Harrison, U. Hilleringmann, Journal of Micromechanics and Microengineering 22 (2012).
LibreCat: /record/39520
DOI: 10.1088/0960-1317/22/12/125012

Surface tension and its role for vertical wet etching of silicon
A. Brockmeier, F.J.S. Rodriguez, M. Harrison, U. Hilleringmann, Journal of Micromechanics and Microengineering 22 (2012).
LibreCat: /record/39522
DOI: 10.1088/0960-1317/22/12/125012

Mikrosystemtechnik auf Silizium
U. Hilleringmann, Mikrosystemtechnik Auf Silizium, Vieweg+Teubner Verlag, Wiesbaden, 2012.
LibreCat: /record/39512
DOI: 10.1007/978-3-322-92766-8

Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors
F.F. Vidor, G.I. Wirth, K. Wolff, U. Hilleringmann, ECS Transactions 39 (2011) 109–115.
LibreCat: /record/39533
DOI: 10.1149/1.3615183

Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric
K. Wolff, U. Hilleringmann, Solid-State Electronics 62 (2011) 110–114.
LibreCat: /record/39527
DOI: 10.1016/j.sse.2011.01.046

Characterization of SiON integrated waveguides via FTIR and AFM measurements
T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, A. Zrenner, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.
LibreCat: /record/39536
DOI: 10.1109/scd.2011.6068744