Holst, S., Kampmann, M., Sprenger, A., Reimer, J. D., Hellebrand, S., Wunderlich, H.-J., &; Weng, X. (2020). Logic Fault Diagnosis of Hidden Delay Defects. IEEE International Test Conference (ITC’20), November 2020.
LibreCat: /record/19421

Kampmann, M., A. Kochte, M., Liu, C., Schneider, E., Hellebrand, S., &; Wunderlich, H.-J. (2019). Built-in Test for Hidden Delay Faults. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 38(10), 1956–1968.
LibreCat: /record/13048

Kampmann, M., &; Hellebrand, S. (2018). Design For Small Delay Test - A Simulation Study. Microelectronics Reliability, 80, 124–133.
LibreCat: /record/13057

Kampmann, M., &; Hellebrand, S. (2018). Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China.
LibreCat: /record/13072

Liu, C., Schneider, E., Kampmann, M., Hellebrand, S., &; Wunderlich, H.-J. (2018). Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. 27th IEEE Asian Test Symposium (ATS’18).https://doi.org/10.1109/ats.2018.00028 
LibreCat: /record/10575
DOI: 10.1109/ats.2018.00028

Kampmann, M., &; Hellebrand, S. (2017). X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz.
LibreCat: /record/13078

Kampmann, M., &; Hellebrand, S. (2017). Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. 20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17).https://doi.org/10.1109/ddecs.2017.7934564 
LibreCat: /record/10576
DOI: 10.1109/ddecs.2017.7934564

Kampmann, M., &; Hellebrand, S. (2016). X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In 25th IEEE Asian Test Symposium (ATS’16) (pp. 1–6). Hiroshima, Japan: IEEE.https://doi.org/10.1109/ats.2016.20 
LibreCat: /record/12975
DOI: 10.1109/ats.2016.20

Kampmann, M., A. Kochte, M., Schneider, E., Indlekofer, T., Hellebrand, S., &; Wunderlich, H.-J. (2015). Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In 24th IEEE Asian Test Symposium (ATS’15) (pp. 109–114). Mumbai, India: IEEE.https://doi.org/10.1109/ats.2015.26 
LibreCat: /record/12976
DOI: 10.1109/ats.2015.26

Hellebrand, S., Indlekofer, T., Kampmann, M., Kochte, M., Liu, C., &; Wunderlich, H.-J. (2015). Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany.
LibreCat: /record/13077

Hellebrand, S., Indlekofer, T., Kampmann, M., A. Kochte, M., Liu, C., &; Wunderlich, H.-J. (2014). FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects. In IEEE International Test Conference (ITC’14). Seattle, Washington, USA: IEEE.https://doi.org/10.1109/test.2014.7035360 
LibreCat: /record/12977
DOI: 10.1109/test.2014.7035360