Holst, S., Kampmann, M., Sprenger, A., Reimer, J. D., Hellebrand, S., Wunderlich, H.-J., &; Weng, X. (2020). Logic Fault Diagnosis of Hidden Delay Defects. IEEE International Test Conference (ITC’20), November 2020.

Kampmann, M., A. Kochte, M., Liu, C., Schneider, E., Hellebrand, S., &; Wunderlich, H.-J. (2019). Built-in Test for Hidden Delay Faults. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 38(10), 1956–1968.

Kampmann, M., &; Hellebrand, S. (2018). Design For Small Delay Test - A Simulation Study. Microelectronics Reliability, 80, 124–133.

Kampmann, M., &; Hellebrand, S. (2018). Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China.

Liu, C., Schneider, E., Kampmann, M., Hellebrand, S., &; Wunderlich, H.-J. (2018). Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. 27th IEEE Asian Test Symposium (ATS’18).https://doi.org/10.1109/ats.2018.00028 

Kampmann, M., &; Hellebrand, S. (2017). X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz.

Kampmann, M., &; Hellebrand, S. (2017). Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. 20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17).https://doi.org/10.1109/ddecs.2017.7934564 

Kampmann, M., &; Hellebrand, S. (2016). X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In 25th IEEE Asian Test Symposium (ATS’16) (pp. 1–6). Hiroshima, Japan: IEEE.https://doi.org/10.1109/ats.2016.20 

Kampmann, M., A. Kochte, M., Schneider, E., Indlekofer, T., Hellebrand, S., &; Wunderlich, H.-J. (2015). Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In 24th IEEE Asian Test Symposium (ATS’15) (pp. 109–114). Mumbai, India: IEEE.https://doi.org/10.1109/ats.2015.26 

Hellebrand, S., Indlekofer, T., Kampmann, M., Kochte, M., Liu, C., &; Wunderlich, H.-J. (2015). Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany.

Hellebrand, S., Indlekofer, T., Kampmann, M., A. Kochte, M., Liu, C., &; Wunderlich, H.-J. (2014). FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects. In IEEE International Test Conference (ITC’14). Seattle, Washington, USA: IEEE.https://doi.org/10.1109/test.2014.7035360