@inproceedingsHolst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020, place=Virtual Conference - Originally Washington, DC, USA, title=Logic Fault Diagnosis of Hidden Delay Defects, booktitle=IEEE International Test Conference (ITC’20), November 2020, author=Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing, year=2020 

@articleKampmann_A. Kochte_Liu_Schneider_Hellebrand_Wunderlich_2019, title=Built-in Test for Hidden Delay Faults, volume=38, number=10, journal=IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), publisher=IEEE, author=Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider, Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2019, pages=1956–1968 

@articleKampmann_Hellebrand_2018, title=Design For Small Delay Test - A Simulation Study, volume=80, journal=Microelectronics Reliability, author=Kampmann, Matthias and Hellebrand, Sybille, year=2018, pages=124–133 

@bookKampmann_Hellebrand_2018, place=19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, title=Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test, author=Kampmann, Matthias and Hellebrand, Sybille, year=2018 

@inproceedingsLiu_Schneider_Kampmann_Hellebrand_Wunderlich_2018, title=Extending Aging Monitors for Early Life and Wear-Out Failure Prevention, DOI=10.1109/ats.2018.00028, booktitle=27th IEEE Asian Test Symposium (ATS’18), author=Liu, Chang and Schneider, Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2018 

@bookKampmann_Hellebrand_2017, place=29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, title=X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz, author=Kampmann, Matthias and Hellebrand, Sybille, year=2017 

@inproceedingsKampmann_Hellebrand_2017, title=Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test, DOI=10.1109/ddecs.2017.7934564, booktitle=20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17), publisher=IEEE, author=Kampmann, Matthias and Hellebrand, Sybille, year=2017 

@inproceedingsKampmann_Hellebrand_2016, place=Hiroshima, Japan, title=X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test, DOI=10.1109/ats.2016.20, booktitle=25th IEEE Asian Test Symposium (ATS’16), publisher=IEEE, author=Kampmann, Matthias and Hellebrand, Sybille, year=2016, pages=1–6 

@inproceedingsKampmann_A. Kochte_Schneider_Indlekofer_Hellebrand_Wunderlich_2015, place=Mumbai, India, title=Optimized Selection of Frequencies for Faster-Than-at-Speed Test, DOI=10.1109/ats.2015.26, booktitle=24th IEEE Asian Test Symposium (ATS’15), publisher=IEEE, author=Kampmann, Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2015, pages=109–114 

@bookHellebrand_Indlekofer_Kampmann_Kochte_Liu_Wunderlich_2015, place=27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, title=Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler, author=Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim, year=2015 

@inproceedingsHellebrand_Indlekofer_Kampmann_A. Kochte_Liu_Wunderlich_2014, place=Seattle, Washington, USA, title=FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects, DOI=10.1109/test.2014.7035360, booktitle=IEEE International Test Conference (ITC’14), publisher=IEEE, author=Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim, year=2014