Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Workload-Aware Periodic Interconnect BIST.”https://doi.org/10.1109/mdat.2023.3298849__IEEE Design &;Test, 2023, 1–1.https://doi.org/10.1109/mdat.2023.3298849 .
LibreCat: /record/46264
DOI: 10.1109/mdat.2023.3298849

Jafarzadeh, Hanieh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi Haghi, Hussam  Amrouch, Sybille Hellebrand, and Hans-Joachim  Wunderlich. “Robust Pattern Generation for Small Delay Faults under Process Variations.” In IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023. Anaheim, CA, USA: IEEE, 2023.
LibreCat: /record/45830

Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Stress-Aware Periodic Test of Interconnects.”https://doi.org/10.1007/s10836-021-05979-5__Journal of Electronic Testing, 2022.https://doi.org/10.1007/s10836-021-05979-5 .
LibreCat: /record/29351
DOI: 10.1007/s10836-021-05979-5

Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. EM-Aware Interconnect BIST. Online: European Workshop on Silicon Lifecycle Management, March 18, 2022, 2022.
LibreCat: /record/29890

Sprenger, Alexander, Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille Hellebrand. “Variation-Aware Test for Logic Interconnects Using Neural Networks - A Case Study.” In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020. Virtual Conference - Originally Frascati (Rome), Italy, 2020.
LibreCat: /record/19422

Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects. Ludwigsburg: 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, 2020.
LibreCat: /record/15419

Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. “Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects.”https://doi.org/10.1109/vts48691.2020.9107591__In 38th IEEE VLSI Test Symposium (VTS). Virtual Conference - Originally San Diego, CA, USA: IEEE, 2020.https://doi.org/10.1109/vts48691.2020.9107591 .
LibreCat: /record/29200
DOI: 10.1109/vts48691.2020.9107591

Holst, Stefan, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, and Xiaoqing Weng. “Logic Fault Diagnosis of Hidden Delay Defects.” In IEEE International Test Conference (ITC’20), November 2020. Virtual Conference - Originally Washington, DC, USA, 2020.
LibreCat: /record/19421

Maaz, Mohammad Urf, Alexander Sprenger, and Sybille Hellebrand. A Hybrid Space Compactor for Varying X-Rates. Prien am Chiemsee: 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), 2019.
LibreCat: /record/8112

Sprenger, Alexander, and Sybille Hellebrand. “Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test.”https://doi.org/10.1142/s0218126619400012__Journal of Circuits, Systems and Computers 28, no. 1 (2019): 1–23.https://doi.org/10.1142/s0218126619400012 .
LibreCat: /record/8667
DOI: 10.1142/s0218126619400012

Kampmann, Matthias, Michael A. Kochte, Chang Liu, Eric Schneider, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Test for Hidden Delay Faults.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 38, no. 10 (2019): 1956–68.
LibreCat: /record/13048

Maaz, Mohammad Urf, Alexander Sprenger, and Sybille Hellebrand. “A Hybrid Space Compactor for Adaptive X-Handling.” In 50th IEEE International Test Conference (ITC), 1–8. Washington, DC, USA: IEEE, 2019.
LibreCat: /record/12918

Sprenger, Alexander, and Sybille Hellebrand. Stochastische Kompaktierung für den Hochgeschwindigkeitstest. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.
LibreCat: /record/4576

Hellebrand, Sybille, Joerg Henkel, Anand Raghunathan, and Hans-Joachim Wunderlich. “Guest Editors’ Introduction - Special Issue on Approximate Computing.”https://doi.org/10.1109/les.2018.2789942__IEEE Embedded Systems Letters 10, no. 1 (2018): 1–1.https://doi.org/10.1109/les.2018.2789942 .
LibreCat: /record/12974
DOI: 10.1109/les.2018.2789942

Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability 80 (2018): 124–33.
LibreCat: /record/13057

Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space Compaction to Faster-than-at-Speed Test.”https://doi.org/10.1109/ddecs.2018.00020__In 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits &; Systems (DDECS). Budapest, Hungary: IEEE, 2018.https://doi.org/10.1109/ddecs.2018.00020 .
LibreCat: /record/4575
DOI: 10.1109/ddecs.2018.00020

Liu, Chang, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.”https://doi.org/10.1109/ats.2018.00028__In 27th IEEE Asian Test Symposium (ATS’18), 2018.https://doi.org/10.1109/ats.2018.00028 .
LibreCat: /record/10575
DOI: 10.1109/ats.2018.00028

Deshmukh, Jyotirmoy, Wolfgang Kunz, Hans-Joachim Wunderlich, and Sybille Hellebrand. “Special Session on Early Life Failures.”https://doi.org/10.1109/vts.2017.7928933__In 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE, 2017.https://doi.org/10.1109/vts.2017.7928933 .
LibreCat: /record/12973
DOI: 10.1109/vts.2017.7928933

Kampmann, Matthias, and Sybille Hellebrand. X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
LibreCat: /record/13078

Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant Compaction during Faster-than-at-Speed Test.”https://doi.org/10.1109/ddecs.2017.7934564__In 20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17). IEEE, 2017.https://doi.org/10.1109/ddecs.2017.7934564 .
LibreCat: /record/10576
DOI: 10.1109/ddecs.2017.7934564