Kampmann, M., A. Kochte, M., Liu, C., Schneider, E., Hellebrand, S., &; Wunderlich, H.-J. (2019). Built-in Test for Hidden Delay Faults. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 38(10), 1956–1968.
LibreCat: /record/13048

Maaz, M. U., Sprenger, A., &; Hellebrand, S. (2019). A Hybrid Space Compactor for Adaptive X-Handling. 50th IEEE International Test Conference (ITC), 1–8.
LibreCat: /record/12918

Sprenger, A., &; Hellebrand, S. (2018). Stochastische Kompaktierung für den Hochgeschwindigkeitstest. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18).
LibreCat: /record/4576

Hellebrand, S., Henkel, J., Raghunathan, A., &; Wunderlich, H.-J. (2018). Guest Editors’ Introduction - Special Issue on Approximate Computing. IEEE Embedded Systems Letters, 10(1), 1–1.https://doi.org/10.1109/les.2018.2789942 
LibreCat: /record/12974
DOI: 10.1109/les.2018.2789942

Kampmann, M., &; Hellebrand, S. (2018). Design For Small Delay Test - A Simulation Study. Microelectronics Reliability, 80, 124–133.
LibreCat: /record/13057

Sprenger, A., &; Hellebrand, S. (2018). Tuning Stochastic Space Compaction to Faster-than-at-Speed Test. 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits &; Systems (DDECS).https://doi.org/10.1109/ddecs.2018.00020 
LibreCat: /record/4575
DOI: 10.1109/ddecs.2018.00020

Liu, C., Schneider, E., Kampmann, M., Hellebrand, S., &; Wunderlich, H.-J. (2018). Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. 27th IEEE Asian Test Symposium (ATS’18).https://doi.org/10.1109/ats.2018.00028 
LibreCat: /record/10575
DOI: 10.1109/ats.2018.00028

Deshmukh, J., Kunz, W., Wunderlich, H.-J., &; Hellebrand, S. (2017). Special Session on Early Life Failures. In 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE.https://doi.org/10.1109/vts.2017.7928933 
LibreCat: /record/12973
DOI: 10.1109/vts.2017.7928933

Kampmann, M., &; Hellebrand, S. (2017). X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz.
LibreCat: /record/13078

Kampmann, M., &; Hellebrand, S. (2017). Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. 20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17).https://doi.org/10.1109/ddecs.2017.7934564 
LibreCat: /record/10576
DOI: 10.1109/ddecs.2017.7934564

Kampmann, M., &; Hellebrand, S. (2016). X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In 25th IEEE Asian Test Symposium (ATS’16) (pp. 1–6). Hiroshima, Japan: IEEE.https://doi.org/10.1109/ats.2016.20 
LibreCat: /record/12975
DOI: 10.1109/ats.2016.20

Kampmann, M., A. Kochte, M., Schneider, E., Indlekofer, T., Hellebrand, S., &; Wunderlich, H.-J. (2015). Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In 24th IEEE Asian Test Symposium (ATS’15) (pp. 109–114). Mumbai, India: IEEE.https://doi.org/10.1109/ats.2015.26 
LibreCat: /record/12976
DOI: 10.1109/ats.2015.26

Huang, Z., Liang, H., &; Hellebrand, S. (2015). A High Performance SEU Tolerant Latch. Journal of Electronic Testing - Theory and Applications (JETTA), 31(4), 349–359.
LibreCat: /record/13056

Hellebrand, S., Indlekofer, T., Kampmann, M., Kochte, M., Liu, C., &; Wunderlich, H.-J. (2015). Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany.
LibreCat: /record/13077

Hellebrand, S., Indlekofer, T., Kampmann, M., A. Kochte, M., Liu, C., &; Wunderlich, H.-J. (2014). FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects. In IEEE International Test Conference (ITC’14). Seattle, Washington, USA: IEEE.https://doi.org/10.1109/test.2014.7035360 
LibreCat: /record/12977
DOI: 10.1109/test.2014.7035360

Hellebrand, S., &; Wunderlich, H.-J. (2014). SAT-Based ATPG beyond Stuck-at Fault Testing. DeGruyter Journal on Information Technology (It), 56(4), 165–172.
LibreCat: /record/13054

Rodriguez Gomez, L., Cook, A., Indlekofer, T., Hellebrand, S., &; Wunderlich, H.-J. (2014). Adaptive Bayesian Diagnosis of Intermittent Faults. Journal of Electronic Testing - Theory and Applications (JETTA), 30(5), 527–540.
LibreCat: /record/13055

Hellebrand, S. (2013). Analyzing and Quantifying Fault Tolerance Properties. In 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina: IEEE.https://doi.org/10.1109/latw.2013.6562662 
LibreCat: /record/12979
DOI: 10.1109/latw.2013.6562662

Cook, A., Rodriguez Gomez, L., Hellebrand, S., Indlekofer, T., &; Wunderlich, H.-J. (2013). Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina.
LibreCat: /record/13075

Cook, A., Hellebrand, S., E. Imhof, M., Mumtaz, A., &; Wunderlich, H.-J. (2012). Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In 13th IEEE Latin American Test Workshop (LATW’12) (pp. 1–4). Quito, Ecuador: IEEE.https://doi.org/10.1109/latw.2012.6261229 
LibreCat: /record/12980
DOI: 10.1109/latw.2012.6261229