Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.”https://doi.org/10.1109/ats.2010.24__In 19th IEEE Asian Test Symposium (ATS’10), 87–93. Shanghai, China: IEEE, 2010.https://doi.org/10.1109/ats.2010.24 .
LibreCat: /record/12983
DOI: 10.1109/ats.2010.24

Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.”https://doi.org/10.1109/iccd.2010.5647648__In 28th IEEE International Conference on Computer Design (ICCD’10), 480–85. Amsterdam, The Netherlands: IEEE, 2010.https://doi.org/10.1109/iccd.2010.5647648 .
LibreCat: /record/12985
DOI: 10.1109/iccd.2010.5647648

Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.”https://doi.org/10.1109/dft.2010.19__In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 101–8. Kyoto, Japan: IEEE, 2010.https://doi.org/10.1109/dft.2010.19 .
LibreCat: /record/12986
DOI: 10.1109/dft.2010.19

Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure for Test Data Compression.”https://doi.org/10.1109/vts.2010.5469570__In 28th IEEE VLSI Test Symposium (VTS’10), 227–31. Santa Cruz, CA, USA: IEEE, 2010.https://doi.org/10.1109/vts.2010.5469570 .
LibreCat: /record/12988
DOI: 10.1109/vts.2010.5469570

Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper). Chicago, IL, USA, 2010.
LibreCat: /record/13049

Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Robuster Selbsttest Mit Extremer Kompaktierung.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 17–24. Wildbad Kreuth, Germany, 2010.
LibreCat: /record/13050

Hunger, Marc, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, and Bernd Becker. “ATPG-Based Grading of Strong Fault-Secureness.”https://doi.org/10.1109/iolts.2009.5196027__In 15th IEEE International On-Line Testing Symposium (IOLTS’09. Sesimbra-Lisbon, Portugal: IEEE, 2009.https://doi.org/10.1109/iolts.2009.5196027 .
LibreCat: /record/12991
DOI: 10.1109/iolts.2009.5196027

Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?”https://doi.org/10.1109/dft.2009.28__In 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 77. Chicago, IL, USA: IEEE, 2009.https://doi.org/10.1109/dft.2009.28 .
LibreCat: /record/12990
DOI: 10.1109/dft.2009.28

Hunger, Marc, Sybille Hellebrand, Alexander Czutro, Ilia Polian, and Bernd Becker. “Robustheitsanalyse Stark Fehlersicherer Schaltungen Mit SAT-Basierter Testmustererzeugung.” In 3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Stuttgart, Germany, 2009.
LibreCat: /record/13030

Coym, Torsten, Sybille Hellebrand, Stefan Ludwig, Bernd Straube, Hans-Joachim Wunderlich, and Christian G. Zoellin. Ein Verfeinertes Elektrisches Modell Für Teilchentreffer Und Dessen Auswirkung Auf Die Bewertung Der Schaltungsempfindlichkeit. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, 2008.
LibreCat: /record/13033

Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. Testen Mit Rücksetzpunkten - Ein Ansatz Zur Verbesserung Der Ausbeute Bei Robusten Schaltungen. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, 2008.
LibreCat: /record/13035

Oehler, Philipp, Alberto Bosio, Giorgio di Natale, and Sybille Hellebrand. “A Modular Memory BIST for Optimized Memory Repair.”https://doi.org/10.1109/iolts.2008.30__In 14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster). Rhodos, Greece: IEEE, 2008.https://doi.org/10.1109/iolts.2008.30 .
LibreCat: /record/12992
DOI: 10.1109/iolts.2008.30

Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Signature Rollback - A Technique for Testing Robust Circuits.”https://doi.org/10.1109/vts.2008.34__In 26th IEEE VLSI Test Symposium (VTS’08), 125–30. San Diego, CA, USA: IEEE, 2008.https://doi.org/10.1109/vts.2008.34 .
LibreCat: /record/12994
DOI: 10.1109/vts.2008.34

Hunger, Marc, and Sybille Hellebrand. “Verification and Analysis of Self-Checking Properties through ATPG.”https://doi.org/10.1109/iolts.2008.32__In 14th IEEE International On-Line Testing Symposium (IOLTS’08). Rhodos, Greece: IEEE, 2008.https://doi.org/10.1109/iolts.2008.32 .
LibreCat: /record/12993
DOI: 10.1109/iolts.2008.32

Hunger, Marc, and Sybille Hellebrand. “Analyse Selbstprüfender Schaltungen – Nachweis von Fehlersicherheit Und Selbsttestbarkeit Mit ATPG.” In 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Ingolstadt, Germany, 2008.
LibreCat: /record/13031

Oehler, Philipp, Alberto Bosio, Giorgio Di Natale, and Sybille Hellebrand. “Modularer Selbsttest Und Optimierte Reparaturanalyse.” In 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Ingolstadt, Germany, 2008.
LibreCat: /record/13032

Hellebrand, Sybille. Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing. 5th IEEE East-West Design \'26; Test Symposium, Yerevan, Armenia (Invited Talk), 2007.
LibreCat: /record/13038

Ali, Muhammad, Michael Welzl, Sven Hessler, and Sybille Hellebrand. An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips. DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), 2007.
LibreCat: /record/13039

Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007.
LibreCat: /record/13042

Hellebrand, Sybille. Qualitätssicherung Für Nanochips - Wie IT-Produkte Zuverlässig Werden. ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany, 2007.
LibreCat: /record/13043