Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. Testen Mit Rücksetzpunkten - Ein Ansatz Zur Verbesserung Der Ausbeute Bei Robusten Schaltungen. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, 2008.
LibreCat: /record/13035

Oehler, Philipp, Alberto Bosio, Giorgio di Natale, and Sybille Hellebrand. “A Modular Memory BIST for Optimized Memory Repair.”https://doi.org/10.1109/iolts.2008.30__In 14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster). Rhodos, Greece: IEEE, 2008.https://doi.org/10.1109/iolts.2008.30 .
LibreCat: /record/12992
DOI: 10.1109/iolts.2008.30

Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Signature Rollback - A Technique for Testing Robust Circuits.”https://doi.org/10.1109/vts.2008.34__In 26th IEEE VLSI Test Symposium (VTS’08), 125–30. San Diego, CA, USA: IEEE, 2008.https://doi.org/10.1109/vts.2008.34 .
LibreCat: /record/12994
DOI: 10.1109/vts.2008.34

Hunger, Marc, and Sybille Hellebrand. “Verification and Analysis of Self-Checking Properties through ATPG.”https://doi.org/10.1109/iolts.2008.32__In 14th IEEE International On-Line Testing Symposium (IOLTS’08). Rhodos, Greece: IEEE, 2008.https://doi.org/10.1109/iolts.2008.32 .
LibreCat: /record/12993
DOI: 10.1109/iolts.2008.32

Hunger, Marc, and Sybille Hellebrand. “Analyse Selbstprüfender Schaltungen – Nachweis von Fehlersicherheit Und Selbsttestbarkeit Mit ATPG.” In 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Ingolstadt, Germany, 2008.
LibreCat: /record/13031

Oehler, Philipp, Alberto Bosio, Giorgio Di Natale, and Sybille Hellebrand. “Modularer Selbsttest Und Optimierte Reparaturanalyse.” In 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Ingolstadt, Germany, 2008.
LibreCat: /record/13032

Hellebrand, Sybille. Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing. 5th IEEE East-West Design \'26; Test Symposium, Yerevan, Armenia (Invited Talk), 2007.
LibreCat: /record/13038

Ali, Muhammad, Michael Welzl, Sven Hessler, and Sybille Hellebrand. An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips. DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), 2007.
LibreCat: /record/13039

Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007.
LibreCat: /record/13042

Hellebrand, Sybille. Qualitätssicherung Für Nanochips - Wie IT-Produkte Zuverlässig Werden. ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany, 2007.
LibreCat: /record/13043

Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.”https://doi.org/10.1109/dft.2007.43__In 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), 50–58. Rome, Italy: IEEE, 2007.https://doi.org/10.1109/dft.2007.43 .
LibreCat: /record/12995
DOI: 10.1109/dft.2007.43

Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair.”https://doi.org/10.1109/ddecs.2007.4295278__In 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), 185–90. Krakow, Poland: IEEE, 2007.https://doi.org/10.1109/ddecs.2007.4295278 .
LibreCat: /record/12996
DOI: 10.1109/ddecs.2007.4295278

Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy.”https://doi.org/10.1109/ets.2007.10__In 12th IEEE European Test Symposium (ETS’07), 91–96. Freiburg, Germany: IEEE, 2007.https://doi.org/10.1109/ets.2007.10 .
LibreCat: /record/12997
DOI: 10.1109/ets.2007.10

Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” In 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper). Bled, Slovenia, 2007.
LibreCat: /record/13037

Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” Informacije MIDEM, Ljubljana (Invited Paper) 37, no. 4 (124) (2007): 212–19.
LibreCat: /record/13036

Ali, Muhammad, Sven Hessler, Michael Welzl, and Sybille Hellebrand. “An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip.” International Journal on High Performance Systems Architecture 1, no. 2 (2007): 113–23.
LibreCat: /record/13044

Ali, Muhammad, Michael Welzl, Sven Hessler, and Sybille Hellebrand. “A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip.” In 4th International Conference on Information Technology: New Generations (ITNG’07), 1027–32. Las Vegas, Nevada, USA, 2007.
LibreCat: /record/13040

Becker, Bernd, Ilia Polian, Sybille Hellebrand, Bernd Straube, and Hans-Joachim Wunderlich. “Test Und Zuverlässigkeit Nanoelektronischer Systeme.” In 1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Munich, Germany, 2007.
LibreCat: /record/13041

Becker, Bernd, Ilia Polian, Sybille Hellebrand, Bernd Straube, and Hans-Joachim Wunderlich. “DFG-Projekt RealTest - Test Und Zuverlässigkeit Nanoelektronischer Systeme.” It - Information Technology 48, no. 5 (2006): 305–11.
LibreCat: /record/13045

Ali, Muhammad, Michael Welzl, and Sybille Hellebrand. Dynamic Routing: A Prerequisite for Reliable NoCs. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.
LibreCat: /record/13101