Jafarzadeh, Hanieh, et al. “Time and Space Optimized Storage-Based BIST under Multiple Voltages and Variations.” European Test Symposium, The Hague, Netherlands, May 20-24, 2024, IEEE, p. 6.
LibreCat: /record/52744

Jafarzadeh, Hanieh, et al. “Vmin Testing under Variations: Defect vs. Fault Coverage.” IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, IEEE, p. 6.
LibreCat: /record/52742

Hellebrand, Sybille, et al. “Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle.” International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, p. 1.
LibreCat: /record/52743

Wunderlich, Hans-Joachim, et al. “Robust Test of Small Delay Faults under  PVT-Variations.” International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, p. 1.
LibreCat: /record/52745

Stiballe, Alisa, et al. Modeling Crosstalk-Induced Interconnect Delay with Polynomial Regression. 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024, 2024.
LibreCat: /record/50284

Ustimova, Magdalina, et al. Crosstalk-Aware Simulation of Interconnects Using Artificial Neural Networks. 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024, 2024.
LibreCat: /record/51799

Ghazal, Abdulkarim, et al. On Cryptography Effects on Interconnect Reliability. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023.
LibreCat: /record/35204

Badran, Abdalrhman, et al. “Approximate Computing: Balancing Performance, Power, Reliability, and Safety.” 28th IEEE European Test Symposium (ETS’23), May 2023, 2023.
LibreCat: /record/41875

Sadeghi-Kohan, Somayeh, et al. “Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication.”10.1109/dsn-w58399.2023.00056__2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W), IEEE, 2023, doi:10.1109/dsn-w58399.2023.00056.
LibreCat: /record/46739
DOI: 10.1109/dsn-w58399.2023.00056

Sadeghi-Kohan, Somayeh, et al. “Optimizing the Streaming of Sensor Data with Approximate Communication.” IEEE Asian Test Symposium (ATS’23), October 2023, 2023.
LibreCat: /record/46738

Sadeghi-Kohan, Somayeh, et al. “Workload-Aware Periodic Interconnect BIST.”10.1109/mdat.2023.3298849__IEEE Design &;Test, Institute of Electrical and Electronics Engineers (IEEE), 2023, pp. 1–1, doi:10.1109/mdat.2023.3298849.
LibreCat: /record/46264
DOI: 10.1109/mdat.2023.3298849

Jafarzadeh, Hanieh, et al. “Robust Pattern Generation for Small Delay Faults under Process Variations.” IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023, IEEE, 2023.
LibreCat: /record/45830

Sadeghi-Kohan, Somayeh, et al. “Stress-Aware Periodic Test of Interconnects.”10.1007/s10836-021-05979-5__Journal of Electronic Testing, Springer Science and Business Media LLC, 2022, doi:10.1007/s10836-021-05979-5.
LibreCat: /record/29351
DOI: 10.1007/s10836-021-05979-5

Sadeghi-Kohan, Somayeh, et al. EM-Aware Interconnect BIST. European Workshop on Silicon Lifecycle Management, March 18, 2022, 2022.
LibreCat: /record/29890

Sprenger, Alexander, et al. “Variation-Aware Test for Logic Interconnects Using Neural Networks - A Case Study.” IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, 2020.
LibreCat: /record/19422

Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects. 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, 2020.
LibreCat: /record/15419

Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. “Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects.”10.1109/vts48691.2020.9107591__38th IEEE VLSI Test Symposium (VTS), IEEE, 2020, doi:10.1109/vts48691.2020.9107591.
LibreCat: /record/29200
DOI: 10.1109/vts48691.2020.9107591

Holst, Stefan, et al. “Logic Fault Diagnosis of Hidden Delay Defects.” IEEE International Test Conference (ITC’20), November 2020, 2020.
LibreCat: /record/19421

Maaz, Mohammad Urf, et al. A Hybrid Space Compactor for Varying X-Rates. 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), 2019.
LibreCat: /record/8112

Sprenger, Alexander, and Sybille Hellebrand. “Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test.”10.1142/s0218126619400012__Journal of Circuits, Systems and Computers, vol. 28, no. 1, World Scientific Publishing Company, 2019, pp. 1–23, doi:10.1142/s0218126619400012.
LibreCat: /record/8667
DOI: 10.1142/s0218126619400012