@articleWu_Scheytt_2021, title=Analysis and Design of a Charge Sampler With 70-GHz 1-dB Bandwidth in 130-nm SiGe BiCMOS, volume=68, DOI=10.1109/tcsi.2021.3094428, number=9, journal=IEEE Transactions on Circuits and Systems I: Regular Papers, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Wu, Liang and Scheytt, J. Christoph, year=2021, pages=3668–3681 
LibreCat: /record/29210
DOI: 10.1109/tcsi.2021.3094428

@bookWu_2021, series=HNI-Verlagsschriftreihe, title=Ultrabreitbandige Sampler in SiGe-BiCMOS-Technologie für Analog-Digital-Wandler mit zeitversetzter Abtastung, volume=402, author=Wu, Liang, year=2021, collection=HNI-Verlagsschriftreihe 
LibreCat: /record/52664

@inproceedingsWu_Weizel_Scheytt_2020, place=Sevilla, Spain, title=Above 60 GHz Bandwidth 10 GS/s Sampling Rate Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology, DOI=10.1109/ISCAS45731.2020.9180947, booktitle=2020 IEEE International Symposium on Circuits and Systems (ISCAS), publisher=IEEE, author=Wu, Liang and Weizel, Maxim and Scheytt, Christoph, year=2020 
LibreCat: /record/24021
DOI: 10.1109/ISCAS45731.2020.9180947

@inproceedingsWu_Weizel_Scheytt_2019, title=70 GHz Large-signal Bandwidth Sampler Using Current-mode Integrate-and-Hold Circuit in 130 nm SiGe BiCMOS Technology, DOI=10.1109/APMC46564.2019.9038239, booktitle=Asia-Pacific Microwave Conference (APMC), author=Wu, Liang and Weizel, Maxim and Scheytt, Christoph, year=2019 
LibreCat: /record/24049
DOI: 10.1109/APMC46564.2019.9038239

@inproceedingsWu_Weizel_Scheytt_2019, place=Genova, Italy, title=A 70 GHz Small-signal Bandwidth 40 GS/s Track-and-Hold Amplifier in 130 nm SiGe BiCMOS Technology, DOI=10.1109/ICECS46596.2019.8965046, booktitle=26th IEEE International Conference on Electronics Circuits and Systems (ICECS), author=Wu, Liang and Weizel, Maxim and Scheytt, Christoph, year=2019 
LibreCat: /record/24052
DOI: 10.1109/ICECS46596.2019.8965046

@inproceedingsWu_Hussain_Abughannam_Müller_Scheytt_Ecker_2018, place=Italy/Taormina, title=Analog fault simulation automation at schematic level with random sampling techniques, DOI=10.1109/DTIS.2018.8368549, booktitle=2018 13th International Conference on Design &; Technology of Integrated Systems In Nanoscale Era (DTIS)) , publisher=IEEE, author=Wu, Liang and Hussain, Mohammad Khizer and Abughannam, Saed and Müller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang, year=2018 
LibreCat: /record/24196
DOI: 10.1109/DTIS.2018.8368549

@articleScheytt_Wu_2018, title=Integrier und HalteSchaltung , author=Scheytt, Christoph and Wu, Liang, year=2018 
LibreCat: /record/24198

@inproceedingsWu_Abughannam_Müller_Scheytt_Ecker_2017, place=Lausanne, Switzerland, title=SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study, booktitle=2nd Workshop on Resiliency in Embedded Electronic Systems (REES), author=Wu, Liang and Abughannam, Saed and Müller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang, year=2017, pages=68 
LibreCat: /record/24223

@inproceedingsAbughannam_Wu_Müller_Scheytt_Ecker_Novello_2016, title=Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study, booktitle=Analog 2016 - VDE, author=Abughannam, Saed and Wu, Liang and Müller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang and Novello, Christiano, year=2016 
LibreCat: /record/24263

@inproceedingsMüller_Wu_Scheytt_Becker_Schoenberg_2015, place=Amsterdam, Netherland, title=On the Correlation of HW Faults and SW Errors, booktitle=Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), author=Müller, Wolfgang and Wu, Liang and Scheytt, Christoph and Becker, Markus and Schoenberg, Sven, editor=Mueller-Gritschneder, Daniel and Müller, Wolfgang and Mitra, Subhasish, year=2015 
LibreCat: /record/24289