@bookStiballe_Reimer_Sadeghi-Kohan_Hellebrand_2024, place=Darmstadt, Germany, title=Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression, publisher=37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024, author=Stiballe, Alisa and Reimer, Jan Dennis and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2024 

@bookGhazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place=Erfurt, Germany, title=On Cryptography Effects on Interconnect Reliability, publisher=35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, author=Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille, year=2023 

@inproceedingsBadran_Sadeghi-Kohan_Reimer_Hellebrand_2023, place=Venice, Italy, title=Approximate Computing: Balancing Performance, Power, Reliability, and Safety, booktitle=28th IEEE European Test Symposium (ETS’23), May 2023, author=Badran, Abdalrhman  and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille, year=2023 

@inproceedingsSadeghi-Kohan_Reimer_Hellebrand_Wunderlich_2023, place=Beijing, China, title=Optimizing the Streaming of Sensor Data with Approximate Communication, booktitle=IEEE Asian Test Symposium (ATS’23), October 2023, author=Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2023 

@inproceedingsJafarzadeh_Klemme_Reimer_Najafi Haghi _Amrouch_Hellebrand _Wunderlich_2023, place=Anaheim, CA, USA, title=Robust Pattern Generation for Small Delay Faults under Process Variations, booktitle=IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023, publisher=IEEE, author=Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria and  Amrouch, Hussam and Hellebrand, Sybille and  Wunderlich, Hans-Joachim, year=2023 

@inproceedingsSprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place=Virtual Conference - Originally Frascati (Rome), Italy, title=Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study, booktitle=IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, author=Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille, year=2020 

@inproceedingsHolst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020, place=Virtual Conference - Originally Washington, DC, USA, title=Logic Fault Diagnosis of Hidden Delay Defects, booktitle=IEEE International Test Conference (ITC’20), November 2020, author=Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing, year=2020