Neufeld S, Gerstmann U, Padberg L, et al. Vibrational Properties of the Potassium Titanyl Phosphate Crystal Family. Crystals. 2023;13(10). doi:10.3390/cryst13101423

Brockmeier J, Mackwitz PWM, Rüsing M, et al. Non-Invasive Visualization of Ferroelectric Domain Structures on the Non-Polar y-Surface of KTiOPO4 via Raman Imaging. Crystals. Published online 2021. doi:10.3390/cryst11091086

Spychala KJ, Mackwitz P, Rüsing M, et al. Nonlinear focal mapping of ferroelectric domain walls in LiNbO3: Analysis of the SHG microscopy contrast mechanism. Journal of Applied Physics. Published online 2020. doi:10.1063/5.0025284

Padberg L, Santandrea M, Rüsing M, et al. Characterisation of width-dependent diffusion dynamics in rubidium-exchanged KTP waveguides. Optics Express. Published online 2020. doi:10.1364/oe.397074

Rüsing M, Neufeld S, Brockmeier J, et al. Imaging of 180 ferroelectric domain walls in uniaxial ferroelectrics by confocal Raman spectroscopy: Unraveling the contrast mechanism. Physical Review Materials. 2018;2(10). doi:10.1103/physrevmaterials.2.103801

Spychala KJ, Berth G, Widhalm A, et al. Impact of carbon-ion implantation on the nonlinear optical susceptibility of LiNbO3. OPTICS EXPRESS. 2017;(18):21444--21453. doi:10.1364/OE.25.021444

Hett T, Frers T, Widhalm A, Berth G, Hilleringmann U, Zrenner A. Silicon oxynitride microdisk resonators for integrated waveguide coupling. In: Smart Systems Integration 2016 - International Conference and Exhibition on Integration Issues of Miniaturized Systems, SSI 2016. Munich; 2016:400-403.

Rüsing M, Eigner C, Mackwitz P, Berth G, Silberhorn C, Zrenner A. Identification of ferroelectric domain structure sensitive phonon modes in potassium titanyl phosphate: A fundamental study. Journal of Applied Physics. 2016;119(4). doi:10.1063/1.4940964

Mackwitz P, Rüsing M, Berth G, Widhalm A, Müller K, Zrenner A. Periodic domain inversion in x-cut single-crystal lithium niobate thin film. Applied Physics Letters. 2016;108(15). doi:10.1063/1.4946010

Rüsing M, Wecker T, Berth G, As DJ, Zrenner A. Joint Raman spectroscopy and HRXRD investigation of cubic gallium nitride layers grown on 3C-SiC. physica status solidi (b). 2016;253(4):778-782. doi:10.1002/pssb.201552592

Rüsing M, Sanna S, Neufeld S, et al. Vibrational properties of LiNb1xTaxO3 mixed crystals. Physical Review B. Published online 2016. doi:10.1103/physrevb.93.184305

Sanna S, Neufeld S, Rüsing M, Berth G, Zrenner A, Schmidt WG. Raman scattering efficiency in LiTaO3 and LiNbO3 crystals. Physical Review B. 2015;91(22). doi:10.1103/physrevb.91.224302

Sanna S, Riefer A, Neufeld S, et al. Vibrational Fingerprints of LiNbO3-LiTaO3Mixed Crystals. Ferroelectrics. 2013;447(1):63-68. doi:10.1080/00150193.2013.821893

Rashad M, Rüsing M, Berth G, Lischka K, Pawlis A. CuO and Co3O4 Nanoparticles: Synthesis, Characterizations, and Raman Spectroscopy. Journal of Nanomaterials. 2013;2013:714853. doi:10.1155/2013/714853

Sanna S, Riefer A, Neufeld S, et al. Vibrational fingerprints of LiNbO3-LiTaO3 mixed crystals. In: Proceedings of ISAF-ECAPD-PFM 2012. ; 2012.

Sanna S, Berth G, Hahn W, Widhalm A, Zrenner A, Schmidt WG. Vibrational properties of the LiNbO3 z-surfaces. IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control. 2011;58(9):1751-1756. doi:10.1109/tuffc.2011.2012

Wiedemeier V, Berth G, Zrenner A, et al. In situ characterization of ZnTe epilayer irradiation via time-resolved and power-density-dependent Raman spectroscopy. Semiconductor Science and Technology. 2011;26(10). doi:10.1088/0268-1242/26/10/105023

Frers T, Hett T, Hilleringmann U, Berth G, Widhalm A, Zrenner A. Characterization of SiON integrated waveguides via FTIR and AFM measurements. In: 2011 Semiconductor Conference Dresden. IEEE; 2011. doi:10.1109/scd.2011.6068744

Berth G, Hahn W, Wiedemeier V, Zrenner A, Sanna S, Schmidt WG. Imaging of the Ferroelectric Domain Structures by Confocal Raman Spectroscopy. Ferroelectrics. 2011;420(1):44-48. doi:10.1080/00150193.2011.594774

Garralaga Rojas E, Terheiden B, Plagwitz H, et al. Lift-off of mesoporous layers by electrochemical etching on Si (100) substrates with miscut of 6° off towards (111). Thin Solid Films. 2011;520(1):606-609. doi:10.1016/j.tsf.2011.07.063