An MCTS-based Framework for Synthesis of Approximate Circuits
M. Awais, H. Ghasemzadeh Mohammadi, M. Platzner, in: 26th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), 2018, pp. 219–224.
LibreCat: /record/10598
DOI: 10.1109/VLSI-SoC.2018.8645026

Efficient Statistical Parameter Selection for Nonlinear Modeling of Process/Performance Variation
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, G. De Micheli, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems PP (2016) 1–1.
LibreCat: /record/10769
DOI: 10.1109/TCAD.2016.2547908

A Fault-Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, J. Zhang, G.D. Micheli, E. Sanchez, M.S. Reorda, ACM Journal on Emerging Technologies in Computing Systems (2016) 1–13.
LibreCat: /record/15879
DOI: 10.1145/2988234

From Defect Analysis to Gate-Level Fault Modeling of Controllable-Polarity Silicon Nanowires
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, G. De Micheli, IEEE Transactions on Nanotechnology 14 (2015) 1117–1126.
LibreCat: /record/10770
DOI: 10.1109/TNANO.2015.2482359

On the design of a fault tolerant ripple-carry adder with controllable-polarity transistors
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, J. Zhang, G. De Micheli, E. Sanchez, M.S. Reorda, in: 2015 IEEE Computer Society Annual Symposium on VLSI, IEEE, 2015, pp. 491–496.
LibreCat: /record/10771
DOI: 10.1109/ISVLSI.2015.13

Fault modeling in controllable polarity silicon nanowire circuits
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, G. De Micheli, in: Proceedings of the 2015 Design, Automation &; Test in Europe Conference \'26; Exhibition, EDA Consortium, 2015, pp. 453–458.
LibreCat: /record/10772
DOI: 10.7873/DATE.2015.0428

Fast process variation analysis in nano-scaled technologies using column-wise sparse parameter selection
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, M. Yazdani, G. De Micheli, in: 2014 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), IEEE, 2014, pp. 163–168.
LibreCat: /record/10773
DOI: 10.1109/NANOARCH.2014.6880479

A fast TCAD-based methodology for Variation analysis of emerging nano-devices
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, M. Yazdani, G. De Micheli, in: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), IEEE, 2013, pp. 83–88.
LibreCat: /record/10774
DOI: 10.1109/DFT.2013.6653587

Vertically-stacked silicon nanowire transistors with controllable polarity: A robustness study
P.-E. Gaillardon, H. Ghasemzadeh Mohammadi, G. De Micheli, in: 2013 14th Latin American Test Workshop-LATW, IEEE, 2013, pp. 1–6.
LibreCat: /record/10775
DOI: 10.1109/LATW.2013.6562673

Sub-threshold charge recovery circuits
M. Khatir, H. Ghasemzadeh Mohammadi, A. Ejlali, in: Computer Design (ICCD), 2010 IEEE International Conference On, IEEE, 2010, pp. 138–144.
LibreCat: /record/10776
DOI: 10.1109/ICCD.2010.5647815

Signature Self Checking (SSC): A Low-Cost Reliable Control Logic for Pipelined Microprocessors
H. Ghasemzadeh Mohammadi, S.G. Miremadi, A. Ejlali, in: Dependable Computing (PRDC), 2009 IEEE Pacific Rim International Symposium On, IEEE, 2009, pp. 252–255.
LibreCat: /record/10777
DOI: 10.1109/PRDC.2009.69

A cost-effective error detection and roll-back recovery technique for embedded microprocessor control logic
H. Ghasemzadeh Mohammadi, H. Tabkhi, S.G. Miremadi, A. Ejlali, in: 2008 International Conference on Microelectronics, IEEE, 2008, pp. 444–447.
LibreCat: /record/10778
DOI: 10.1109/ICM.2008.5393497