Awais, Muhammad, Hassan Ghasemzadeh Mohammadi, and Marco Platzner. “An MCTS-Based Framework for Synthesis of Approximate Circuits.”https://doi.org/10.1109/VLSI-SoC.2018.8645026__In 26th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), 219–24, 2018.https://doi.org/10.1109/VLSI-SoC.2018.8645026 .

Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, and Giovanni De Micheli. “Efficient Statistical Parameter Selection for Nonlinear Modeling of Process/Performance Variation.”https://doi.org/10.1109/TCAD.2016.2547908__IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems PP, no. 99 (2016): 1–1.https://doi.org/10.1109/TCAD.2016.2547908 .

Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, Jian Zhang, Giovanni De Micheli, Ernesto Sanchez, and Matteo Sonza Reorda. “A Fault-Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors.”https://doi.org/10.1145/2988234__ACM Journal on Emerging Technologies in Computing Systems, 2016, 1–13.https://doi.org/10.1145/2988234 .

Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, and Giovanni De Micheli. “From Defect Analysis to Gate-Level Fault Modeling of Controllable-Polarity Silicon Nanowires.”https://doi.org/10.1109/TNANO.2015.2482359__IEEE Transactions on Nanotechnology 14, no. 6 (2015): 1117–26.https://doi.org/10.1109/TNANO.2015.2482359 .

Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, Jian Zhang, Giovanni De Micheli, Eduardo Sanchez, and Matteo Sonza Reorda. “On the Design of a Fault Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors.”https://doi.org/10.1109/ISVLSI.2015.13__In 2015 IEEE Computer Society Annual Symposium on VLSI, 491–96. IEEE, 2015.https://doi.org/10.1109/ISVLSI.2015.13 .

Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, and Giovanni De Micheli. “Fault Modeling in Controllable Polarity Silicon Nanowire Circuits.”https://doi.org/10.7873/DATE.2015.0428__In Proceedings of the 2015 Design, Automation &; Test in Europe Conference \'26; Exhibition, 453–58. EDA Consortium, 2015.https://doi.org/10.7873/DATE.2015.0428 .

Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, Majid Yazdani, and Giovanni De Micheli. “Fast Process Variation Analysis in Nano-Scaled Technologies Using Column-Wise Sparse Parameter Selection.”https://doi.org/10.1109/NANOARCH.2014.6880479__In 2014 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), 163–68. IEEE, 2014.https://doi.org/10.1109/NANOARCH.2014.6880479 .

Ghasemzadeh Mohammadi, Hassan, Pierre-Emmanuel Gaillardon, Majid Yazdani, and Giovanni De Micheli. “A Fast TCAD-Based Methodology for Variation Analysis of Emerging Nano-Devices.”https://doi.org/10.1109/DFT.2013.6653587__In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 83–88. IEEE, 2013.https://doi.org/10.1109/DFT.2013.6653587 .

Gaillardon, Pierre-Emmanuel, Hassan Ghasemzadeh Mohammadi, and Giovanni De Micheli. “Vertically-Stacked Silicon Nanowire Transistors with Controllable Polarity: A Robustness Study.”https://doi.org/10.1109/LATW.2013.6562673__In 2013 14th Latin American Test Workshop-LATW, 1–6. IEEE, 2013.https://doi.org/10.1109/LATW.2013.6562673 .

Khatir, Mehrdad, Hassan Ghasemzadeh Mohammadi, and Alireza Ejlali. “Sub-Threshold Charge Recovery Circuits.”https://doi.org/10.1109/ICCD.2010.5647815__In Computer Design (ICCD), 2010 IEEE International Conference On, 138–44. IEEE, 2010.https://doi.org/10.1109/ICCD.2010.5647815 .

Ghasemzadeh Mohammadi, Hassan, Seyed Ghassem Miremadi, and Alireza Ejlali. “Signature Self Checking (SSC): A Low-Cost Reliable Control Logic for Pipelined Microprocessors.”https://doi.org/10.1109/PRDC.2009.69__In Dependable Computing (PRDC), 2009 IEEE Pacific Rim International Symposium On, 252–55. IEEE, 2009.https://doi.org/10.1109/PRDC.2009.69 .

Ghasemzadeh Mohammadi, Hassan, Hamed Tabkhi, Seyed Ghassem Miremadi, and Alireza Ejlali. “A Cost-Effective Error Detection and Roll-Back Recovery Technique for Embedded Microprocessor Control Logic.”https://doi.org/10.1109/ICM.2008.5393497__In 2008 International Conference on Microelectronics, 444–47. IEEE, 2008.https://doi.org/10.1109/ICM.2008.5393497 .