DeepWind: An Accurate Wind Turbine Condition Monitoring Framework via Deep Learning on Embedded Platforms
H. Ghasemzadeh Mohammadi, R. Arshad, S. Rautmare, S. Manjunatha, M. Kuschel, F.P. Jentzsch, M. Platzner, A. Boschmann, D. Schollbach, in: 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2020.

CIRCA: Towards a Modular and Extensible Framework for Approximate Circuit Generation
L.M. Witschen, T. Wiersema, H. Ghasemzadeh Mohammadi, M. Awais, M. Platzner, Microelectronics Reliability 99 (2019) 277–290.

Jump Search: A Fast Technique for the Synthesis of Approximate Circuits
L.M. Witschen, H. Ghasemzadeh Mohammadi, M. Artmann, M. Platzner, Fourth Workshop on Approximate Computing (AxC 2019) (n.d.).

Jump Search: A Fast Technique for the Synthesis of Approximate Circuits
L.M. Witschen, H. Ghasemzadeh Mohammadi, M. Artmann, M. Platzner, in: Proceedings of the 2019 on Great Lakes Symposium on VLSI  - GLSVLSI ’19, ACM, New York, NY, USA, 2019.

CIRCA: Towards a Modular and Extensible Framework for Approximate Circuit Generation
L.M. Witschen, T. Wiersema, H. Ghasemzadeh Mohammadi, M. Awais, M. Platzner, Third Workshop on Approximate Computing (AxC 2018) (n.d.).

An MCTS-based Framework for Synthesis of Approximate Circuits
M. Awais, H. Ghasemzadeh Mohammadi, M. Platzner, in: 26th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), 2018, pp. 219–224.

Efficient Statistical Parameter Selection for Nonlinear Modeling of Process/Performance Variation
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, G. De Micheli, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems PP (2016) 1–1.

A Fault-Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, J. Zhang, G.D. Micheli, E. Sanchez, M.S. Reorda, ACM Journal on Emerging Technologies in Computing Systems (2016) 1–13.

From Defect Analysis to Gate-Level Fault Modeling of Controllable-Polarity Silicon Nanowires
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, G. De Micheli, IEEE Transactions on Nanotechnology 14 (2015) 1117–1126.

On the design of a fault tolerant ripple-carry adder with controllable-polarity transistors
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, J. Zhang, G. De Micheli, E. Sanchez, M.S. Reorda, in: 2015 IEEE Computer Society Annual Symposium on VLSI, IEEE, 2015, pp. 491–496.

Fault modeling in controllable polarity silicon nanowire circuits
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, G. De Micheli, in: Proceedings of the 2015 Design, Automation &; Test in Europe Conference \'26; Exhibition, EDA Consortium, 2015, pp. 453–458.

Fast process variation analysis in nano-scaled technologies using column-wise sparse parameter selection
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, M. Yazdani, G. De Micheli, in: 2014 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), IEEE, 2014, pp. 163–168.

A fast TCAD-based methodology for Variation analysis of emerging nano-devices
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, M. Yazdani, G. De Micheli, in: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), IEEE, 2013, pp. 83–88.

Vertically-stacked silicon nanowire transistors with controllable polarity: A robustness study
P.-E. Gaillardon, H. Ghasemzadeh Mohammadi, G. De Micheli, in: 2013 14th Latin American Test Workshop-LATW, IEEE, 2013, pp. 1–6.

Sub-threshold charge recovery circuits
M. Khatir, H. Ghasemzadeh Mohammadi, A. Ejlali, in: Computer Design (ICCD), 2010 IEEE International Conference On, IEEE, 2010, pp. 138–144.

Signature Self Checking (SSC): A Low-Cost Reliable Control Logic for Pipelined Microprocessors
H. Ghasemzadeh Mohammadi, S.G. Miremadi, A. Ejlali, in: Dependable Computing (PRDC), 2009 IEEE Pacific Rim International Symposium On, IEEE, 2009, pp. 252–255.

A cost-effective error detection and roll-back recovery technique for embedded microprocessor control logic
H. Ghasemzadeh Mohammadi, H. Tabkhi, S.G. Miremadi, A. Ejlali, in: 2008 International Conference on Microelectronics, IEEE, 2008, pp. 444–447.