An applied noise model for low-loss EELS maps
C. Zietlow, J. Lindner, Ultramicroscopy 270 (2025).

An applied noise model for scintillation-based CCD detectors in transmission electron microscopy.
C. Zietlow, J. Lindner, Sci Rep 15 (2025) 3815.

ADMM-TGV image restoration for scientific applications with unbiased parameter choice
C. Zietlow, J. Lindner, Numerical Algorithms 97 (2024) 1481–1512.