@inproceedingsJafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title=Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations, booktitle=European Test Symposium, The Hague, Netherlands, May 20-24, 2024, publisher=IEEE, author=Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim, pages=6 

@inproceedingsJafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title=Vmin Testing under Variations: Defect vs. Fault Coverage, booktitle=IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, publisher=IEEE, author=Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim, pages=6 

@inproceedingsHellebrand_Sadeghi-Kohan_Wunderlich, title=Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle, booktitle=International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, author=Hellebrand, Sybille and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim, pages=1 

@inproceedingsWunderlich_Jafarzadeh_Hellebrand, title=Robust Test of Small Delay Faults under  PVT-Variations, booktitle=International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, author=Wunderlich, Hans-Joachim and Jafarzadeh, Hanieh and Hellebrand, Sybille, pages=1 

@inproceedingsSadeghi-Kohan_Hellebrand_Wunderlich_2023, title=Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication, DOI=10.1109/dsn-w58399.2023.00056, booktitle=2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2023 

@inproceedingsSadeghi-Kohan_Reimer_Hellebrand_Wunderlich_2023, place=Beijing, China, title=Optimizing the Streaming of Sensor Data with Approximate Communication, booktitle=IEEE Asian Test Symposium (ATS’23), October 2023, author=Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2023 

@inproceedingsJafarzadeh_Klemme_Reimer_Najafi Haghi _Amrouch_Hellebrand _Wunderlich_2023, place=Anaheim, CA, USA, title=Robust Pattern Generation for Small Delay Faults under Process Variations, booktitle=IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023, publisher=IEEE, author=Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria and  Amrouch, Hussam and Hellebrand, Sybille and  Wunderlich, Hans-Joachim, year=2023 

@inproceedingsSprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place=Virtual Conference - Originally Frascati (Rome), Italy, title=Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study, booktitle=IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, author=Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille, year=2020 

@inproceedingsSadeghi-Kohan_Hellebrand_2020, place=Virtual Conference - Originally San Diego, CA, USA, title=Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, DOI=10.1109/vts48691.2020.9107591, booktitle=38th IEEE VLSI Test Symposium (VTS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2020 

@inproceedingsHolst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020, place=Virtual Conference - Originally Washington, DC, USA, title=Logic Fault Diagnosis of Hidden Delay Defects, booktitle=IEEE International Test Conference (ITC’20), November 2020, author=Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing, year=2020 

@inproceedingsMaaz_Sprenger_Hellebrand_2019, place=Washington, DC, USA, title=A Hybrid Space Compactor for Adaptive X-Handling, booktitle=50th IEEE International Test Conference (ITC), publisher=IEEE, author=Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille, year=2019, pages=1–8 

@inproceedingsRezaeizadeh Rookerd_Sadeghi-Kohan_Navabi_2018, title=Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture, DOI=10.1145/3194554.3194599, booktitle=Proceedings of the 2018 on Great Lakes Symposium on VLSI, publisher=ACM, author=Rezaeizadeh Rookerd, Ramin and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin, year=2018 

@inproceedingsSprenger_Hellebrand_2018, place=Budapest, Hungary, title=Tuning Stochastic Space Compaction to Faster-than-at-Speed Test, DOI=10.1109/ddecs.2018.00020, booktitle=2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits &; Systems (DDECS), publisher=IEEE, author=Sprenger, Alexander and Hellebrand, Sybille, year=2018 

@inproceedingsLiu_Schneider_Kampmann_Hellebrand_Wunderlich_2018, title=Extending Aging Monitors for Early Life and Wear-Out Failure Prevention, DOI=10.1109/ats.2018.00028, booktitle=27th IEEE Asian Test Symposium (ATS’18), author=Liu, Chang and Schneider, Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2018 

@inproceedingsSadeghi-Kohan_Vafaei_Navabi_2018, title=Near-Optimal Node Selection Procedure for Aging Monitor Placement, DOI=10.1109/iolts.2018.8474120, booktitle=2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Vafaei, Arash and Navabi, Zainalabedin, year=2018 

@inproceedingsDeshmukh_Kunz_Wunderlich_Hellebrand_2017, place=Caesars Palace, Las Vegas, Nevada, USA, title=Special Session on Early Life Failures, DOI=10.1109/vts.2017.7928933, booktitle=35th IEEE VLSI Test Symposium (VTS’17), publisher=IEEE, author=Deshmukh, Jyotirmoy and Kunz, Wolfgang and Wunderlich, Hans-Joachim and Hellebrand, Sybille, year=2017 

@inproceedingsKampmann_Hellebrand_2017, title=Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test, DOI=10.1109/ddecs.2017.7934564, booktitle=20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17), publisher=IEEE, author=Kampmann, Matthias and Hellebrand, Sybille, year=2017 

@inproceedingsJenihhin_Kamkin_Navabi_Sadeghi-Kohan_2017, title=Universal mitigation of NBTI-induced aging by design randomization, DOI=10.1109/ewdts.2016.7807635, booktitle=2016 IEEE East-West Design &; Test Symposium (EWDTS), publisher=IEEE, author=Jenihhin, Maksim and Kamkin, Alexander and Navabi, Zainalabedin and Sadeghi-Kohan, Somayeh, year=2017 

@inproceedingsKampmann_Hellebrand_2016, place=Hiroshima, Japan, title=X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test, DOI=10.1109/ats.2016.20, booktitle=25th IEEE Asian Test Symposium (ATS’16), publisher=IEEE, author=Kampmann, Matthias and Hellebrand, Sybille, year=2016, pages=1–6 

@inproceedingsKampmann_A. Kochte_Schneider_Indlekofer_Hellebrand_Wunderlich_2015, place=Mumbai, India, title=Optimized Selection of Frequencies for Faster-Than-at-Speed Test, DOI=10.1109/ats.2015.26, booktitle=24th IEEE Asian Test Symposium (ATS’15), publisher=IEEE, author=Kampmann, Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2015, pages=109–114 

@inproceedingsSadeghi-Kohan_Kamran_Forooghifar_Navabi_2015, title=Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation, DOI=10.1109/dtis.2015.7127373, booktitle=2015 10th International Conference on Design &; Technology of Integrated Systems in Nanoscale Era (DTIS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Kamran, Arezoo and Forooghifar, Farnaz and Navabi, Zainalabedin, year=2015 

@inproceedingsSadeghi-Kohan_Kamal_McNeil_Prinetto_Navabi_2015, title=Online self adjusting progressive age monitoring of timing variations, DOI=10.1109/dtis.2015.7127368, booktitle=2015 10th International Conference on Design &; Technology of Integrated Systems in Nanoscale Era (DTIS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Kamal, Mehdi and McNeil, John and Prinetto, Paolo and Navabi, Zain, year=2015 

@inproceedingsHellebrand_Indlekofer_Kampmann_A. Kochte_Liu_Wunderlich_2014, place=Seattle, Washington, USA, title=FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects, DOI=10.1109/test.2014.7035360, booktitle=IEEE International Test Conference (ITC’14), publisher=IEEE, author=Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim, year=2014 

@inproceedingsMohammadi_Sadeghi-Kohan_Masoumi_Navabi_2014, title=An off-line MDSI interconnect BIST incorporated in BS 1149.1, DOI=10.1109/ets.2014.6847847, booktitle=2014 19th IEEE European Test Symposium (ETS), publisher=IEEE, author=Mohammadi, Marzieh and Sadeghi-Kohan, Somayeh and Masoumi, Nasser and Navabi, Zainalabedin, year=2014 

@inproceedingsSadeghi-Kohan_Behnam_Alizadeh_Fujita_Navabi_2014, title=Improving polynomial datapath debugging with HEDs, DOI=10.1109/ets.2014.6847797, booktitle=2014 19th IEEE European Test Symposium (ETS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Behnam, Payman and Alizadeh, Bijan and Fujita, Masahiro and Navabi, Zainalabedin, year=2014 

@inproceedingsHellebrand_2013, place=Cordoba, Argentina, title=Analyzing and Quantifying Fault Tolerance Properties, DOI=10.1109/latw.2013.6562662, booktitle=14th IEEE Latin American Test Workshop - (LATW’13), publisher=IEEE, author=Hellebrand, Sybille, year=2013 

@inproceedingsSadeghi-Kohan_Namaki-Shoushtari_Javaheri_Navabi_2013, title=BS 1149.1 extensions for an online interconnect fault detection and recovery, DOI=10.1109/test.2012.6401583, booktitle=2012 IEEE International Test Conference, publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Namaki-Shoushtari, Majid and Javaheri, Fatemeh and Navabi, Zainalabedin, year=2013 

@inproceedingsSadeghi-Kohan_Keshavarz_Zokaee_Farahmandi_Navabi_2013, title=A new structure for interconnect offline testing, DOI=10.1109/ewdts.2013.6673207, booktitle=East-West Design &;amp; Test Symposium (EWDTS 2013), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Keshavarz, Shahrzad and Zokaee, Farzaneh and Farahmandi, Farimah and Navabi, Zainalabedin, year=2013 

@inproceedingsCook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place=Quito, Ecuador, title=Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test, DOI=10.1109/latw.2012.6261229, booktitle=13th IEEE Latin American Test Workshop (LATW’12), publisher=IEEE, author=Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim, year=2012, pages=1–4 

@inproceedingsCook_Hellebrand_Wunderlich_2012, place=Annecy, France, title=Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test, DOI=10.1109/ets.2012.6233025, booktitle=17th IEEE European Test Symposium (ETS’12), publisher=IEEE, author=Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2012, pages=1–6 

@inproceedingsCook_Hellebrand_Indlekofer_Wunderlich_2011, place=New Delhi, India, title=Diagnostic Test of Robust Circuits, DOI=10.1109/ats.2011.55, booktitle=20th IEEE Asian Test Symposium (ATS’11), publisher=IEEE, author=Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim, year=2011, pages=285–290 

@inproceedingsPolian_Becker_Hellebrand_Wunderlich_Maxwell_2011, place=Trondheim, Norway, title=Towards Variation-Aware Test Methods, DOI=10.1109/ets.2011.51, booktitle=16th IEEE European Test Symposium Trondheim (ETS’11), publisher=IEEE, author=Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Maxwell, Peter, year=2011 

@inproceedingsCook_Hellebrand_Indlekofer_Wunderlich_2011, place=Hamburg, Germany, title=Robuster Selbsttest mit Diagnose, booktitle=5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf”, author=Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim, year=2011, pages=48–53 

@inproceedingsKamran_Nemati_Sadeghi-Kohan_Navabi_2011, title=Virtual tester development using HDL/PLI, DOI=10.1109/ewdts.2010.5742156, booktitle=2010 East-West Design &;amp; Test Symposium (EWDTS), publisher=IEEE, author=Kamran, Arezoo and Nemati, Nastaran and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin, year=2011 

@inproceedingsBecker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place=Chicago, IL, USA, title=Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits, DOI=10.1109/dsnw.2010.5542612, booktitle=40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), publisher=IEEE, author=Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2010 

@inproceedingsHunger_Hellebrand_2010, place=Wildbad Kreuth, Germany, title=Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz, booktitle=4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille, year=2010, pages=81–88 

@inproceedingsHopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place=Shanghai, China, title=Variation-Aware Fault Modeling, DOI=10.1109/ats.2010.24, booktitle=19th IEEE Asian Test Symposium (ATS’10), publisher=IEEE, author=Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2010, pages=87–93 

@inproceedingsIndlekofer_Schnittger_Hellebrand_2010, place=Amsterdam, The Netherlands, title=Efficient Test Response Compaction for Robust BIST Using Parity Sequences, DOI=10.1109/iccd.2010.5647648, booktitle=28th IEEE International Conference on Computer Design (ICCD’10), publisher=IEEE, author=Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille, year=2010, pages=480–485 

@inproceedingsHunger_Hellebrand_2010, place=Kyoto, Japan, title=The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems, DOI=10.1109/dft.2010.19, booktitle=25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille, year=2010, pages=101–108 

@inproceedingsFroese_Ibers_Hellebrand_2010, place=Santa Cruz, CA, USA, title=Reusing NoC-Infrastructure for Test Data Compression, DOI=10.1109/vts.2010.5469570, booktitle=28th IEEE VLSI Test Symposium (VTS’10), publisher=IEEE, author=Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille, year=2010, pages=227–231 

@inproceedingsBecker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place=Chicago, IL, USA, title=Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits, booktitle=4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), author=Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2010 

@inproceedingsIndlekofer_Schnittger_Hellebrand_2010, place=Wildbad Kreuth, Germany, title=Robuster Selbsttest mit extremer Kompaktierung, booktitle=4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille, year=2010, pages=17–24 

@inproceedingsHunger_Hellebrand_Czutro_Polian_Becker_2009, place=Sesimbra-Lisbon, Portugal, title=ATPG-Based Grading of Strong Fault-Secureness, DOI=10.1109/iolts.2009.5196027, booktitle=15th IEEE International On-Line Testing Symposium (IOLTS’09, publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille and Czutro, Alejandro and Polian, Ilia and Becker, Bernd, year=2009 

@inproceedingsHellebrand_Hunger_2009, place=Chicago, IL, USA, title=Are Robust Circuits Really Robust?, DOI=10.1109/dft.2009.28, booktitle=24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), publisher=IEEE, author=Hellebrand, Sybille and Hunger, Marc, year=2009, pages=77 

@inproceedingsHunger_Hellebrand_Czutro_Polian_Becker_2009, place=Stuttgart, Germany, title=Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung, booktitle=3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille and Czutro, Alexander and Polian, Ilia and Becker, Bernd, year=2009 

@inproceedingsOehler_Bosio_di Natale_Hellebrand_2008, place=Rhodos, Greece, title=A Modular Memory BIST for Optimized Memory Repair, DOI=10.1109/iolts.2008.30, booktitle=14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster), publisher=IEEE, author=Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille, year=2008 

@inproceedingsAmgalan_Hachmann_Hellebrand_Wunderlich_2008, place=San Diego, CA, USA, title=Signature Rollback - A Technique for Testing Robust Circuits, DOI=10.1109/vts.2008.34, booktitle=26th IEEE VLSI Test Symposium (VTS’08), publisher=IEEE, author=Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2008, pages=125–130 

@inproceedingsHunger_Hellebrand_2008, place=Rhodos, Greece, title=Verification and Analysis of Self-Checking Properties through ATPG, DOI=10.1109/iolts.2008.32, booktitle=14th IEEE International On-Line Testing Symposium (IOLTS’08), publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille, year=2008 

@inproceedingsHunger_Hellebrand_2008, place=Ingolstadt, Germany, title=Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG, booktitle=2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille, year=2008 

@inproceedingsOehler_Bosio_Di Natale_Hellebrand_2008, place=Ingolstadt, Germany, title=Modularer Selbsttest und optimierte Reparaturanalyse, booktitle=2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Oehler, Philipp and Bosio, Alberto and Di Natale, Giorgio and Hellebrand, Sybille, year=2008 

@inproceedingsHellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place=Rome, Italy, title=A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction, DOI=10.1109/dft.2007.43, booktitle=22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), publisher=IEEE, author=Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd, year=2007, pages=50–58 

@inproceedingsOehler_Hellebrand_Wunderlich_2007, place=Krakow, Poland, title=Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair, DOI=10.1109/ddecs.2007.4295278, booktitle=10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), publisher=IEEE, author=Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2007, pages=185–190 

@inproceedingsOehler_Hellebrand_Wunderlich_2007, place=Freiburg, Germany, title=An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy, DOI=10.1109/ets.2007.10, booktitle=12th IEEE European Test Symposium (ETS’07), publisher=IEEE, author=Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2007, pages=91–96 

@inproceedingsHellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place=Bled, Slovenia, title=Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance, booktitle=43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), author=Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd, year=2007 

@inproceedingsAli_Welzl_Hessler_Hellebrand_2007, place=Las Vegas, Nevada, USA, title=A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip, booktitle=4th International Conference on Information Technology: New Generations (ITNG’07), author=Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille, year=2007, pages=1027–1032 

@inproceedingsBecker_Polian_Hellebrand_Straube_Wunderlich_2007, place=Munich, Germany, title=Test und Zuverlässigkeit nanoelektronischer Systeme, booktitle=1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim, year=2007 

@inproceedingsAli_Welzl_Zwicknagl_Hellebrand_2005, place=Islamabad, Pakistan, title=Considerations for Fault-Tolerant Networks on Chips, DOI=10.1109/icm.2005.1590063, booktitle=IEEE International Conference on Microelectronics (ICM’05), publisher=IEEE, author=Ali, Muhammad and Welzl, Michael and Zwicknagl, Martin and Hellebrand, Sybille, year=2005 

@inproceedingsOehler_Hellebrand_2005, place=Tallinn, Estonia, title=Low Power Embedded DRAMs with High Quality Error Correcting Capabilities, DOI=10.1109/ets.2005.28, booktitle=10th IEEE European Test Symposium (ETS’05), publisher=IEEE, author=Oehler, Philipp and Hellebrand, Sybille, year=2005, pages=148–153 

@inproceedingsAli_Welzl_Hellebrand_2005, place=Oulu, Finland, title=A Dynamic Routing Mechanism for Network on Chip, DOI=10.1109/norchp.2005.1596991, booktitle=23rd IEEE NORCHIP Conference, publisher=IEEE, author=Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille, year=2005, pages=70–73 

@inproceedingsLiu Jing_Ruehrup_Schindelhauer_Volbert_Dierkes_Bellgardt_Ibers_Hilleringmann_2004, place=Tilburg, Netherlands, title=Sensor Networks with More Features Using Less Hardware, booktitle=GOR/NGB Conference Tilburg 2004, author=Liu Jing, Michelle and Ruehrup, Stefan and Schindelhauer, Christian and Volbert, Klaus and Dierkes, Martin and Bellgardt, Andreas and Ibers, Rüdiger and Hilleringmann, Ulrich, year=2004 

@inproceedingsWuertenberger_S. Tautermann_Hellebrand_2004, place=Charlotte, NC, USA, title=Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, DOI=10.1109/test.2004.1387357, booktitle=IEEE International Test Conference (ITC’04), publisher=IEEE, author=Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille, year=2004, pages=926–935 

@inproceedingsWuertenberger_S. Tautermann_Hellebrand_2003, place=Charlotte, NC, USA, title=A Hybrid Coding Strategy for Optimized Test Data Compression, DOI=10.1109/test.2003.1270870, booktitle=IEEE International Test Conference (ITC’03), publisher=IEEE, author=Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille, year=2003, pages=451–459 

@inproceedingsLiang_Hellebrand_Wunderlich_2001, place=Baltimore, MD, USA, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, DOI=10.1109/test.2001.966712, booktitle=IEEE International Test Conference (ITC’01), publisher=IEEE, author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001, pages=894–902 

@inproceedingsHellebrand_Liang_Wunderlich_2000, place=Atlantic City, NJ, USA, title=A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters, DOI=10.1109/test.2000.894274, booktitle=IEEE International Test Conference (ITC’00), publisher=IEEE, author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2000, pages=778–784 

@inproceedingsHellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_1999, place=Dana Point, CA, USA, title=Error Detecting Refreshment for Embedded DRAMs, DOI=10.1109/vtest.1999.766693, booktitle=17th IEEE VLSI Test Symposium (VTS’99), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav, year=1999, pages=384–390 

@inproceedingsN. Yarmolik_V. Bykov_Hellebrand_Wunderlich_1999, place=Prague, Czech Republic, title=Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms, booktitle=Third European Dependable Computing Conference (EDCC-3), author=N. Yarmolik, Vyacheslav and V. Bykov, Iuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1999 

@inproceedingsHellebrand_Wunderlich_N. Yarmolik_1999, place=Munich, Germany, title=Symmetric Transparent BIST for RAMs, booktitle=Design Automation and Test in Europe (DATE’99), author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav, year=1999, pages=702–707 

@inproceedingsHertwig_Hellebrand_Wunderlich_1998, place=Monterey, CA, USA, title=Fast Self-Recovering Controllers, DOI=10.1109/vtest.1998.670883, booktitle=16th IEEE VLSI Test Symposium (VTS’98), publisher=IEEE, author=Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998, pages=296–302 

@inproceedingsHellebrand_Wunderlich_N. Yarmolik_1998, place=Paris, France, title=Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs, DOI=10.1109/date.1998.655853, booktitle=Design Automation and Test in Europe (DATE’98), author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav, year=1998, pages=173–179 

@inproceedingsN. Yarmolik_V. Klimets_Hellebrand_Wunderlich_1998, place=Szczyrk, Poland, title=New Transparent RAM BIST Based on Self-Adjusting Output Data Compression, booktitle=Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’98), author=N. Yarmolik, Vyacheslav and V. Klimets, Yuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998, pages=27–33 

@inproceedingsTsai_Hellebrand_Marek-Sadowska_Rajski_1997, place=Anaheim, CA, USA, title=STARBIST: Scan Autocorrelated Random Pattern Generation, DOI=10.1109/dac.1997.597194, booktitle=34th ACM/IEEE Design Automation Conference (DAC’97), publisher=IEEE, author=Tsai, Kun-Han and Hellebrand, Sybille and Marek-Sadowska, Malgorzata and Rajski, Janusz, year=1997 

@inproceedingsHellebrand_Wunderlich_Hertwig_1996, place=Washington, DC, USA, title=Mixed-Mode BIST Using Embedded Processors, DOI=10.1109/test.1996.556962, booktitle=IEEE International Test Conference (ITC’96), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1996, pages=195–204 

@inproceedingsHellebrand_Reeb_Tarnick_Wunderlich_1995, place=San Jose, CA, USA, title=Pattern Generation for a Deterministic BIST Scheme, DOI=10.1109/iccad.1995.479997, booktitle=ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), publisher=IEEE, author=Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim, year=1995, pages=88–94 

@inproceedingsHellebrand_Wunderlich_1994, place=San Jose, CA, USA, title=An Efficient Procedure for the Synthesis of Fast Self-Testable Controller Structures, DOI=10.1109/iccad.1994.629752, booktitle=ACM/IEEE International Conference on Computer-Aided Design (ICCAD’94), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994, pages=110–116 

@inproceedingsHellebrand_Wunderlich_1994, place=Oberwiesenthal, Informatik Xpress 4, TU Chemnitz Zwickau, Germany, title=Synthese schneller selbsttestbarer Steuerwerke, booktitle=Tagungsband der GI/GME/ITG-Fachtagung \'26; Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994, pages=3–11 

@inproceedingsHellebrand_Wunderlich_1994, place=Paris, France, title=Synthesis of Self-Testable Controllers, DOI=10.1109/edtc.1994.326815, booktitle=European Design and Test Conference (EDAC/ETC/EUROASIC), author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994, pages=580–585 

@inproceedingsVenkataraman_Rajski_Hellebrand_Tarnick_1993, title=An Efficient Bist Scheme Based On Reseeding Of Multiple Polynomial Linear Feedback Shift Registers, DOI=10.1109/iccad.1993.580117, booktitle=ACM/IEEE International Conference on Computer Aided Design (ICCAD’93), publisher=IEEE, author=Venkataraman, Srikanth and Rajski, Janusz and Hellebrand, Sybille and Tarnick, Steffen, year=1993 

@inproceedingsHellebrand_Tarnick_Rajski_Courtois_1992, place=Baltimore, MD, USA, title=Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers, DOI=10.1109/test.1992.527812, booktitle=IEEE International Test Conference (ITC’92), publisher=IEEE, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1992, pages=120–129 

@inproceedingsHellebrand_Wunderlich_1990, place=Glasgow, UK, title=Tools and Devices Supporting the Pseudo-Exhaustive Test, DOI=10.1109/edac.1990.136612, booktitle=European Design Automation Conference (EDAC’90), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1990, pages=13–17 

@inproceedingsHellebrand_Wunderlich_F. Haberl_1990, place=Washington, DC, USA, title=Generating Pseudo-Exhaustive Vectors for External Testing, DOI=10.1109/test.1990.114082, booktitle=IEEE International Test Conference (ITC’90), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver, year=1990, pages=670–679 

@inproceedingsWunderlich_Hellebrand_1989, place=Washington, DC, USA, title=The Pseudo-Exhaustive Test of Sequential Circuits, DOI=10.1109/test.1989.82273, booktitle=IEEE International Test Conference (ITC’89), publisher=IEEE, author=Wunderlich, Hans-Joachim and Hellebrand, Sybille, year=1989, pages=19–27 

@inproceedingsWunderlich_Hellebrand_1988, place=Tokyo, Japan, title=Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits, DOI=10.1109/ftcs.1988.5294, booktitle=18th International Symposium on Fault-Tolerant Computing, FTCS-18, author=Wunderlich, Hans-Joachim and Hellebrand, Sybille, year=1988, pages=36–45 

@inproceedingsSchmid_Wunderlich_Feldbusch_Hellebrand_Holzinger_Kunzmann_1988, place=Amsterdam, The Netherlands, title=Integrated Tools for Automatic Design for Testability, booktitle=Tool Integration and Design Environments, F.J. Rammig (Editor), publisher=Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP, author=Schmid, Detlef and Wunderlich, Hans-Joachim and Feldbusch, Fridtjof and Hellebrand, Sybille and Holzinger, Juergen and Kunzmann, Arno, year=1988, pages=233–258 

@inproceedingsHellebrand_Wunderlich_1988, place=Hamburg, Germany, title=Automatisierung des Entwurfs vollständig testbarer Schaltungen, booktitle=GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188, publisher=Springer Verlag, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1988, pages=145–159