Are Neural Bug Detectors Comparable to Software Developers on Variable Misuse Bugs?
C. Richter, J.F. Haltermann, M.-C. Jakobs, F. Pauck, S. Schott, H. Wehrheim, in: 37th IEEE/ACM International Conference on Automated Software Engineering, ACM, 2023.

Composition Analysis in Unknown Contexts
H. Wehrheim, E. Hüllermeier, S. Becker, M. Becker, C. Richter, A. Sharma, in: C.-J. Haake, F. Meyer auf der Heide, M. Platzner, H. Wachsmuth, H. Wehrheim (Eds.), On-The-Fly Computing -- Individualized IT-Services in Dynamic Markets, Heinz Nixdorf Institut, Universität Paderborn, Paderborn, 2023, pp. 105–123.

Learning Realistic Mutations: Bug Creation for Neural Bug Detectors
C. Richter, H. Wehrheim, in: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 2022, pp. 162–173.

TSSB-3M: Mining single statement bugs at massive scale
C. Richter, H. Wehrheim, in: 2022 IEEE/ACM 19th International Conference on Mining Software Repositories (MSR), 2022, pp. 418–422.

Attend and Represent: A Novel View on Algorithm Selection for Software Verification
C. Richter, H. Wehrheim, in: 35th IEEE/ACM International Conference on Automated Software Engineering, ASE 2020, Melbourne, Australia, September 21-25, 2020, IEEE, 2020, pp. 1016–1028.