Fast process variation analysis in nano-scaled technologies using column-wise sparse parameter selection
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, M. Yazdani, G. De Micheli, in: 2014 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), IEEE, 2014, pp. 163–168.

A fast TCAD-based methodology for Variation analysis of emerging nano-devices
H. Ghasemzadeh Mohammadi, P.-E. Gaillardon, M. Yazdani, G. De Micheli, in: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), IEEE, 2013, pp. 83–88.

Vertically-stacked silicon nanowire transistors with controllable polarity: A robustness study
P.-E. Gaillardon, H. Ghasemzadeh Mohammadi, G. De Micheli, in: 2013 14th Latin American Test Workshop-LATW, IEEE, 2013, pp. 1–6.

Sub-threshold charge recovery circuits
M. Khatir, H. Ghasemzadeh Mohammadi, A. Ejlali, in: Computer Design (ICCD), 2010 IEEE International Conference On, IEEE, 2010, pp. 138–144.

Signature Self Checking (SSC): A Low-Cost Reliable Control Logic for Pipelined Microprocessors
H. Ghasemzadeh Mohammadi, S.G. Miremadi, A. Ejlali, in: Dependable Computing (PRDC), 2009 IEEE Pacific Rim International Symposium On, IEEE, 2009, pp. 252–255.