Composition Analysis in Unknown Contexts
H. Wehrheim, E. Hüllermeier, S. Becker, M. Becker, C. Richter, A. Sharma, in: C.-J. Haake, F. Meyer auf der Heide, M. Platzner, H. Wachsmuth, H. Wehrheim (Eds.), On-The-Fly Computing -- Individualized IT-Services in Dynamic Markets, Heinz Nixdorf Institut, Universität Paderborn, Paderborn, 2023, pp. 105–123.

Property-Driven Testing of Black-Box Functions
A. Sharma, V. Melnikov, E. Hüllermeier, H. Wehrheim, in: Proceedings of the 10th IEEE/ACM International Conference on Formal Methods in Software Engineering (FormaliSE), IEEE, 2022, pp. 113–123.

MLCheck- Property-Driven Testing of Machine Learning Models
A. Sharma, C. Demir, A.-C. Ngonga Ngomo, H. Wehrheim, CoRR abs/2105.00741 (2021).

MLCHECK–Property-Driven Testing of Machine Learning Classifiers
A. Sharma, C. Demir, A.-C. Ngonga Ngomo, H. Wehrheim, in: Proceedings of the 20th IEEE International Conference on Machine Learning and Applications (ICMLA), IEEE, n.d.

Automatic Fairness Testing of Machine Learning Models
A. Sharma, H. Wehrheim, in: Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS), Springer, n.d.

Testing Monotonicity of Machine Learning Models
A. Sharma, H. Wehrheim, CoRR abs/2002.12278 (2020).

Higher Income, Larger Loan? Monotonicity Testing of Machine Learning Models
A. Sharma, H. Wehrheim, in: Proceedings of the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA)., ACM, n.d.

Specifying and Analyzing Virtual Network Services Using Queuing Petri Nets
S.B. Schneider, A. Sharma, H. Karl, H. Wehrheim, in: 2019 IFIP/IEEE International Symposium on Integrated Network Management (IM), IFIP, Washington, DC, USA, 2019, pp. 116--124.

Testing Balancedness of ML Algorithms
A. Sharma, H. Wehrheim, in: Proceedings of the Software Engineering Conference (SE), Gesellschaft für Informatik e.V. (GI), Stuttgart, 2019, pp. 157–158.

Testing Machine Learning Algorithms for Balanced Data Usage
A. Sharma, H. Wehrheim, in: IEEE International Conference on Software Testing, Verification and Validation (ICST), IEEE, Xi’an, China, 2019, pp. 125--135.