@inproceedingsWuertenberger_S. Tautermann_Hellebrand_2004, place=Charlotte, NC, USA, title=Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, DOI=10.1109/test.2004.1387357, booktitle=IEEE International Test Conference (ITC’04), publisher=IEEE, author=Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille, year=2004, pages=926–935 
LibreCat: /record/13001
DOI: 10.1109/test.2004.1387357

@bookBreu_Hellebrand_Welzl_2003, place=Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia, title=Experiences from Teaching Software Development in a Java Environment, author=Breu, Ruth and Hellebrand, Sybille and Welzl, Michael, year=2003 
LibreCat: /record/13098

@inproceedingsWuertenberger_S. Tautermann_Hellebrand_2003, place=Charlotte, NC, USA, title=A Hybrid Coding Strategy for Optimized Test Data Compression, DOI=10.1109/test.2003.1270870, booktitle=IEEE International Test Conference (ITC’03), publisher=IEEE, author=Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille, year=2003, pages=451–459 
LibreCat: /record/13002
DOI: 10.1109/test.2003.1270870

@bookHellebrand_Wuertenberger_2002, place=IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, title=Alternating Run-Length Coding: A Technique for Improved Test Data Compression, author=Hellebrand, Sybille and Wuertenberger, Armin, year=2002 
LibreCat: /record/13097

@articleHellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_2002, title=Efficient Online and Offline Testing of Embedded DRAMs, volume=51, DOI=10.1109/tc.2002.1017700, number=7, journal=IEEE Transactions on Computers, publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav, year=2002, pages=801–809 
LibreCat: /record/13003
DOI: 10.1109/tc.2002.1017700

@articleHellebrand_Liang_Wunderlich_2002, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, volume=18, number=2, journal=Journal of Electronic Testing - Theory and Applications (JETTA), author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2002, pages=157–168 
LibreCat: /record/13069

@articleLiang_Hellebrand_Wunderlich_2002, title=A Mixed-Mode BIST Scheme Based on Folding Compression, volume=17, number=2, journal=Journal on Computer Science and Technology, author=Liang, Huaguo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2002, pages=203–212 
LibreCat: /record/13070

@bookLiang_Hellebrand_Wunderlich_2001, place=IEEE European Test Workshop, Stockholm, Sweden, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001 
LibreCat: /record/13096

@inproceedingsLiang_Hellebrand_Wunderlich_2001, place=Baltimore, MD, USA, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, DOI=10.1109/test.2001.966712, booktitle=IEEE International Test Conference (ITC’01), publisher=IEEE, author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001, pages=894–902 
LibreCat: /record/13004
DOI: 10.1109/test.2001.966712

@articleLiang_Hellebrand_Wunderlich_2001, title=Deterministic BIST Scheme Based on Reseeding of Folding Counters, volume=38, number=8, journal=Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan), author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001, pages=931 
LibreCat: /record/13047