@bookKampmann_Hellebrand_2017, place=29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, title=X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz, author=Kampmann, Matthias and Hellebrand, Sybille, year=2017 
LibreCat: /record/13078

@inproceedingsKampmann_Hellebrand_2017, title=Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test, DOI=10.1109/ddecs.2017.7934564, booktitle=20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17), publisher=IEEE, author=Kampmann, Matthias and Hellebrand, Sybille, year=2017 
LibreCat: /record/10576
DOI: 10.1109/ddecs.2017.7934564

@articleSadeghi-Kohan_Kamal_Navabi_2017, title=Self-Adjusting Monitor for Measuring Aging Rate and Advancement, volume=8, DOI=10.1109/tetc.2017.2771441, number=3, journal=IEEE Transactions on Emerging Topics in Computing, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Sadeghi-Kohan, Somayeh and Kamal, Mehdi and Navabi, Zainalabedin, year=2017, pages=627–641 
LibreCat: /record/29462
DOI: 10.1109/tetc.2017.2771441

@inproceedingsJenihhin_Kamkin_Navabi_Sadeghi-Kohan_2017, title=Universal mitigation of NBTI-induced aging by design randomization, DOI=10.1109/ewdts.2016.7807635, booktitle=2016 IEEE East-West Design &; Test Symposium (EWDTS), publisher=IEEE, author=Jenihhin, Maksim and Kamkin, Alexander and Navabi, Zainalabedin and Sadeghi-Kohan, Somayeh, year=2017 
LibreCat: /record/29463
DOI: 10.1109/ewdts.2016.7807635

@inproceedingsKampmann_Hellebrand_2016, place=Hiroshima, Japan, title=X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test, DOI=10.1109/ats.2016.20, booktitle=25th IEEE Asian Test Symposium (ATS’16), publisher=IEEE, author=Kampmann, Matthias and Hellebrand, Sybille, year=2016, pages=1–6 
LibreCat: /record/12975
DOI: 10.1109/ats.2016.20

@inproceedingsKampmann_A. Kochte_Schneider_Indlekofer_Hellebrand_Wunderlich_2015, place=Mumbai, India, title=Optimized Selection of Frequencies for Faster-Than-at-Speed Test, DOI=10.1109/ats.2015.26, booktitle=24th IEEE Asian Test Symposium (ATS’15), publisher=IEEE, author=Kampmann, Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2015, pages=109–114 
LibreCat: /record/12976
DOI: 10.1109/ats.2015.26

@articleHuang_Liang_Hellebrand_2015, title=A High Performance SEU Tolerant Latch, volume=31, number=4, journal=Journal of Electronic Testing - Theory and Applications (JETTA), publisher=Springer, author=Huang, Zhengfeng and Liang, Huaguo and Hellebrand, Sybille, year=2015, pages=349–359 
LibreCat: /record/13056

@bookHellebrand_Indlekofer_Kampmann_Kochte_Liu_Wunderlich_2015, place=27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, title=Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler, author=Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim, year=2015 
LibreCat: /record/13077

@inproceedingsSadeghi-Kohan_Kamran_Forooghifar_Navabi_2015, title=Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation, DOI=10.1109/dtis.2015.7127373, booktitle=2015 10th International Conference on Design &; Technology of Integrated Systems in Nanoscale Era (DTIS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Kamran, Arezoo and Forooghifar, Farnaz and Navabi, Zainalabedin, year=2015 
LibreCat: /record/29465
DOI: 10.1109/dtis.2015.7127373

@inproceedingsSadeghi-Kohan_Kamal_McNeil_Prinetto_Navabi_2015, title=Online self adjusting progressive age monitoring of timing variations, DOI=10.1109/dtis.2015.7127368, booktitle=2015 10th International Conference on Design &; Technology of Integrated Systems in Nanoscale Era (DTIS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Kamal, Mehdi and McNeil, John and Prinetto, Paolo and Navabi, Zain, year=2015 
LibreCat: /record/29466
DOI: 10.1109/dtis.2015.7127368