@inproceedingsCook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place=Quito, Ecuador, title=Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test, DOI=10.1109/latw.2012.6261229, booktitle=13th IEEE Latin American Test Workshop (LATW’12), publisher=IEEE, author=Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim, year=2012, pages=1–4 

@inproceedingsCook_Hellebrand_Wunderlich_2012, place=Annecy, France, title=Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test, DOI=10.1109/ets.2012.6233025, booktitle=17th IEEE European Test Symposium (ETS’12), publisher=IEEE, author=Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2012, pages=1–6 

@bookCook_Hellebrand_Wunderlich_2012, place=24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, title=Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern, author=Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2012 

@inproceedingsCook_Hellebrand_Indlekofer_Wunderlich_2011, place=New Delhi, India, title=Diagnostic Test of Robust Circuits, DOI=10.1109/ats.2011.55, booktitle=20th IEEE Asian Test Symposium (ATS’11), publisher=IEEE, author=Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim, year=2011, pages=285–290 

@inproceedingsPolian_Becker_Hellebrand_Wunderlich_Maxwell_2011, place=Trondheim, Norway, title=Towards Variation-Aware Test Methods, DOI=10.1109/ets.2011.51, booktitle=16th IEEE European Test Symposium Trondheim (ETS’11), publisher=IEEE, author=Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Maxwell, Peter, year=2011 

@inproceedingsCook_Hellebrand_Indlekofer_Wunderlich_2011, place=Hamburg, Germany, title=Robuster Selbsttest mit Diagnose, booktitle=5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf”, author=Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim, year=2011, pages=48–53 

@articleHopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2011, title=Variation-Aware Fault Modeling, volume=54, number=4, journal=SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer, author=Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2011, pages=1813–1826 

@inproceedingsKamran_Nemati_Sadeghi-Kohan_Navabi_2011, title=Virtual tester development using HDL/PLI, DOI=10.1109/ewdts.2010.5742156, booktitle=2010 East-West Design &;amp; Test Symposium (EWDTS), publisher=IEEE, author=Kamran, Arezoo and Nemati, Nastaran and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin, year=2011 

@bookFröse_Ibers_Hellebrand_2010, place=22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, title=Testdatenkompression mit Hilfe der Netzwerkinfrastruktur, author=Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille, year=2010 

@inproceedingsBecker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place=Chicago, IL, USA, title=Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits, DOI=10.1109/dsnw.2010.5542612, booktitle=40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), publisher=IEEE, author=Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2010