DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme
B. Becker, I. Polian, S. Hellebrand, B. Straube, H.-J. Wunderlich, It - Information Technology 48 (2006) 305–311.

A Low Power Design for Embedded DRAMs with Online Consistency Checking
P. Oehler, S. Hellebrand, A Low Power Design for Embedded DRAMs with Online Consistency Checking, Kleinheubachertagung 2005, Miltenberg, Germany, 2005.

Dynamic Routing: A Prerequisite for Reliable NoCs
M. Ali, M. Welzl, S. Hellebrand, Dynamic Routing: A Prerequisite for Reliable NoCs, 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.

Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study
P. Oehler, S. Hellebrand, Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study, 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.

Considerations for Fault-Tolerant Networks on Chips
M. Ali, M. Welzl, M. Zwicknagl, S. Hellebrand, in: IEEE International Conference on Microelectronics (ICM’05), IEEE, Islamabad, Pakistan, 2005.

Low Power Embedded DRAMs with High Quality Error Correcting Capabilities
P. Oehler, S. Hellebrand, in: 10th IEEE European Test Symposium (ETS’05), IEEE, Tallinn, Estonia, 2005, pp. 148–153.

A Dynamic Routing Mechanism for Network on Chip
M. Ali, M. Welzl, S. Hellebrand, in: 23rd IEEE NORCHIP Conference, IEEE, Oulu, Finland, 2005, pp. 70–73.

Sensor Networks with More Features Using Less Hardware
M. Liu Jing, S. Ruehrup, C. Schindelhauer, K. Volbert, M. Dierkes, A. Bellgardt, R. Ibers, U. Hilleringmann, in: GOR/NGB Conference Tilburg 2004, Tilburg, Netherlands, 2004.

Im Westen viel Neues - Informatik an der Universität Innsbruck
R. Breu, T. Fahringer, D. Fensel, S. Hellebrand, A. Middeldorp, O. Scherzer, Im Westen Viel Neues - Informatik an Der Universität Innsbruck, OCG Journal, pp. 28-29, 2004.

Data Compression for Multiple Scan Chains Using Dictionaries with Corrections
S. Hellebrand, A. Wuertenberger, C. S. Tautermann, Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.