@inproceedingsHunger_Hellebrand_2010, place=Wildbad Kreuth, Germany, title=Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz, booktitle=4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille, year=2010, pages=81–88 
LibreCat: /record/13051

@bookHellebrand_2010, place=Editorial, it 4/2010, pp. 179-180, title=Nano-Electronic Systems, author=Hellebrand, Sybille, year=2010 
LibreCat: /record/13073

@inproceedingsHopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place=Shanghai, China, title=Variation-Aware Fault Modeling, DOI=10.1109/ats.2010.24, booktitle=19th IEEE Asian Test Symposium (ATS’10), publisher=IEEE, author=Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2010, pages=87–93 
LibreCat: /record/12983
DOI: 10.1109/ats.2010.24

@inproceedingsIndlekofer_Schnittger_Hellebrand_2010, place=Amsterdam, The Netherlands, title=Efficient Test Response Compaction for Robust BIST Using Parity Sequences, DOI=10.1109/iccd.2010.5647648, booktitle=28th IEEE International Conference on Computer Design (ICCD’10), publisher=IEEE, author=Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille, year=2010, pages=480–485 
LibreCat: /record/12985
DOI: 10.1109/iccd.2010.5647648

@inproceedingsHunger_Hellebrand_2010, place=Kyoto, Japan, title=The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems, DOI=10.1109/dft.2010.19, booktitle=25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille, year=2010, pages=101–108 
LibreCat: /record/12986
DOI: 10.1109/dft.2010.19

@inproceedingsFroese_Ibers_Hellebrand_2010, place=Santa Cruz, CA, USA, title=Reusing NoC-Infrastructure for Test Data Compression, DOI=10.1109/vts.2010.5469570, booktitle=28th IEEE VLSI Test Symposium (VTS’10), publisher=IEEE, author=Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille, year=2010, pages=227–231 
LibreCat: /record/12988
DOI: 10.1109/vts.2010.5469570

@inproceedingsBecker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place=Chicago, IL, USA, title=Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits, booktitle=4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), author=Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2010 
LibreCat: /record/13049

@inproceedingsIndlekofer_Schnittger_Hellebrand_2010, place=Wildbad Kreuth, Germany, title=Robuster Selbsttest mit extremer Kompaktierung, booktitle=4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille, year=2010, pages=17–24 
LibreCat: /record/13050

@inproceedingsHunger_Hellebrand_Czutro_Polian_Becker_2009, place=Sesimbra-Lisbon, Portugal, title=ATPG-Based Grading of Strong Fault-Secureness, DOI=10.1109/iolts.2009.5196027, booktitle=15th IEEE International On-Line Testing Symposium (IOLTS’09, publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille and Czutro, Alejandro and Polian, Ilia and Becker, Bernd, year=2009 
LibreCat: /record/12991
DOI: 10.1109/iolts.2009.5196027

@inproceedingsHellebrand_Hunger_2009, place=Chicago, IL, USA, title=Are Robust Circuits Really Robust?, DOI=10.1109/dft.2009.28, booktitle=24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), publisher=IEEE, author=Hellebrand, Sybille and Hunger, Marc, year=2009, pages=77 
LibreCat: /record/12990
DOI: 10.1109/dft.2009.28

@inproceedingsHunger_Hellebrand_Czutro_Polian_Becker_2009, place=Stuttgart, Germany, title=Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung, booktitle=3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille and Czutro, Alexander and Polian, Ilia and Becker, Bernd, year=2009 
LibreCat: /record/13030

@bookCoym_Hellebrand_Ludwig_Straube_Wunderlich_G. Zoellin_2008, place=20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, title=Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit, author=Coym, Torsten and Hellebrand, Sybille and Ludwig, Stefan and Straube, Bernd and Wunderlich, Hans-Joachim and G. Zoellin, Christian, year=2008 
LibreCat: /record/13033

@bookAmgalan_Hachmann_Hellebrand_Wunderlich_2008, place=20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, title=Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen, author=Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2008 
LibreCat: /record/13035

@inproceedingsOehler_Bosio_di Natale_Hellebrand_2008, place=Rhodos, Greece, title=A Modular Memory BIST for Optimized Memory Repair, DOI=10.1109/iolts.2008.30, booktitle=14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster), publisher=IEEE, author=Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille, year=2008 
LibreCat: /record/12992
DOI: 10.1109/iolts.2008.30

@inproceedingsAmgalan_Hachmann_Hellebrand_Wunderlich_2008, place=San Diego, CA, USA, title=Signature Rollback - A Technique for Testing Robust Circuits, DOI=10.1109/vts.2008.34, booktitle=26th IEEE VLSI Test Symposium (VTS’08), publisher=IEEE, author=Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2008, pages=125–130 
LibreCat: /record/12994
DOI: 10.1109/vts.2008.34

@inproceedingsHunger_Hellebrand_2008, place=Rhodos, Greece, title=Verification and Analysis of Self-Checking Properties through ATPG, DOI=10.1109/iolts.2008.32, booktitle=14th IEEE International On-Line Testing Symposium (IOLTS’08), publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille, year=2008 
LibreCat: /record/12993
DOI: 10.1109/iolts.2008.32

@inproceedingsHunger_Hellebrand_2008, place=Ingolstadt, Germany, title=Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG, booktitle=2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille, year=2008 
LibreCat: /record/13031

@inproceedingsOehler_Bosio_Di Natale_Hellebrand_2008, place=Ingolstadt, Germany, title=Modularer Selbsttest und optimierte Reparaturanalyse, booktitle=2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Oehler, Philipp and Bosio, Alberto and Di Natale, Giorgio and Hellebrand, Sybille, year=2008 
LibreCat: /record/13032

@bookHellebrand_2007, place=5th IEEE East-West Design \'26; Test Symposium, Yerevan, Armenia (Invited Talk), title=Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing, author=Hellebrand, Sybille, year=2007 
LibreCat: /record/13038

@bookAli_Welzl_Hessler_Hellebrand_2007, place=DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), title=An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips, author=Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille, year=2007 
LibreCat: /record/13039

@bookOehler_Hellebrand_Wunderlich_2007, place=17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, title=An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy, author=Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2007 
LibreCat: /record/13042

@bookHellebrand_2007, place=ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany, title=Qualitätssicherung für Nanochips - Wie IT-Produkte zuverlässig werden, author=Hellebrand, Sybille, year=2007 
LibreCat: /record/13043

@inproceedingsHellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place=Rome, Italy, title=A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction, DOI=10.1109/dft.2007.43, booktitle=22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), publisher=IEEE, author=Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd, year=2007, pages=50–58 
LibreCat: /record/12995
DOI: 10.1109/dft.2007.43

@inproceedingsOehler_Hellebrand_Wunderlich_2007, place=Krakow, Poland, title=Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair, DOI=10.1109/ddecs.2007.4295278, booktitle=10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), publisher=IEEE, author=Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2007, pages=185–190 
LibreCat: /record/12996
DOI: 10.1109/ddecs.2007.4295278

@inproceedingsOehler_Hellebrand_Wunderlich_2007, place=Freiburg, Germany, title=An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy, DOI=10.1109/ets.2007.10, booktitle=12th IEEE European Test Symposium (ETS’07), publisher=IEEE, author=Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2007, pages=91–96 
LibreCat: /record/12997
DOI: 10.1109/ets.2007.10

@inproceedingsHellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place=Bled, Slovenia, title=Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance, booktitle=43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), author=Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd, year=2007 
LibreCat: /record/13037

@articleHellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, title=Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance, volume=37, number=4 (124), journal=Informacije MIDEM, Ljubljana (Invited Paper), author=Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd, year=2007, pages=212–219 
LibreCat: /record/13036

@articleAli_Hessler_Welzl_Hellebrand_2007, title=An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip, volume=1, number=2, journal=International Journal on High Performance Systems Architecture, author=Ali, Muhammad and Hessler, Sven and Welzl, Michael and Hellebrand, Sybille, year=2007, pages=113–123 
LibreCat: /record/13044

@inproceedingsAli_Welzl_Hessler_Hellebrand_2007, place=Las Vegas, Nevada, USA, title=A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip, booktitle=4th International Conference on Information Technology: New Generations (ITNG’07), author=Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille, year=2007, pages=1027–1032 
LibreCat: /record/13040

@inproceedingsBecker_Polian_Hellebrand_Straube_Wunderlich_2007, place=Munich, Germany, title=Test und Zuverlässigkeit nanoelektronischer Systeme, booktitle=1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim, year=2007 
LibreCat: /record/13041

@articleBecker_Polian_Hellebrand_Straube_Wunderlich_2006, title=DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme, volume=48, number=5, journal=it - Information Technology, author=Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim, year=2006, pages=305–311 
LibreCat: /record/13045

@bookOehler_Hellebrand_2005, place=Kleinheubachertagung 2005, Miltenberg, Germany, title=A Low Power Design for Embedded DRAMs with Online Consistency Checking, author=Oehler, Philipp and Hellebrand, Sybille, year=2005 
LibreCat: /record/13046

@bookAli_Welzl_Hellebrand_2005, place=17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, title=Dynamic Routing: A Prerequisite for Reliable NoCs, author=Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille, year=2005 
LibreCat: /record/13101

@bookOehler_Hellebrand_2005, place=17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, title=Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study, author=Oehler, Philipp and Hellebrand, Sybille, year=2005 
LibreCat: /record/13102

@inproceedingsAli_Welzl_Zwicknagl_Hellebrand_2005, place=Islamabad, Pakistan, title=Considerations for Fault-Tolerant Networks on Chips, DOI=10.1109/icm.2005.1590063, booktitle=IEEE International Conference on Microelectronics (ICM’05), publisher=IEEE, author=Ali, Muhammad and Welzl, Michael and Zwicknagl, Martin and Hellebrand, Sybille, year=2005 
LibreCat: /record/12999
DOI: 10.1109/icm.2005.1590063

@inproceedingsOehler_Hellebrand_2005, place=Tallinn, Estonia, title=Low Power Embedded DRAMs with High Quality Error Correcting Capabilities, DOI=10.1109/ets.2005.28, booktitle=10th IEEE European Test Symposium (ETS’05), publisher=IEEE, author=Oehler, Philipp and Hellebrand, Sybille, year=2005, pages=148–153 
LibreCat: /record/13000
DOI: 10.1109/ets.2005.28

@inproceedingsAli_Welzl_Hellebrand_2005, place=Oulu, Finland, title=A Dynamic Routing Mechanism for Network on Chip, DOI=10.1109/norchp.2005.1596991, booktitle=23rd IEEE NORCHIP Conference, publisher=IEEE, author=Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille, year=2005, pages=70–73 
LibreCat: /record/12998
DOI: 10.1109/norchp.2005.1596991

@inproceedingsLiu Jing_Ruehrup_Schindelhauer_Volbert_Dierkes_Bellgardt_Ibers_Hilleringmann_2004, place=Tilburg, Netherlands, title=Sensor Networks with More Features Using Less Hardware, booktitle=GOR/NGB Conference Tilburg 2004, author=Liu Jing, Michelle and Ruehrup, Stefan and Schindelhauer, Christian and Volbert, Klaus and Dierkes, Martin and Bellgardt, Andreas and Ibers, Rüdiger and Hilleringmann, Ulrich, year=2004 
LibreCat: /record/13071

@bookBreu_Fahringer_Fensel_Hellebrand_Middeldorp_Scherzer_2004, place=OCG Journal, pp. 28-29, title=Im Westen viel Neues - Informatik an der Universität Innsbruck, author=Breu, Ruth and Fahringer, Thomas and Fensel, Dieter and Hellebrand, Sybille and Middeldorp, Aart and Scherzer, Otmar, year=2004 
LibreCat: /record/13099

@bookHellebrand_Wuertenberger_S. Tautermann_2004, place=9th IEEE European Test Symposium, Ajaccio, Corsica, France, title=Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, author=Hellebrand, Sybille and Wuertenberger, Armin and S. Tautermann, Christofer, year=2004 
LibreCat: /record/13100

@inproceedingsWuertenberger_S. Tautermann_Hellebrand_2004, place=Charlotte, NC, USA, title=Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, DOI=10.1109/test.2004.1387357, booktitle=IEEE International Test Conference (ITC’04), publisher=IEEE, author=Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille, year=2004, pages=926–935 
LibreCat: /record/13001
DOI: 10.1109/test.2004.1387357

@bookBreu_Hellebrand_Welzl_2003, place=Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia, title=Experiences from Teaching Software Development in a Java Environment, author=Breu, Ruth and Hellebrand, Sybille and Welzl, Michael, year=2003 
LibreCat: /record/13098

@inproceedingsWuertenberger_S. Tautermann_Hellebrand_2003, place=Charlotte, NC, USA, title=A Hybrid Coding Strategy for Optimized Test Data Compression, DOI=10.1109/test.2003.1270870, booktitle=IEEE International Test Conference (ITC’03), publisher=IEEE, author=Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille, year=2003, pages=451–459 
LibreCat: /record/13002
DOI: 10.1109/test.2003.1270870

@bookHellebrand_Wuertenberger_2002, place=IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, title=Alternating Run-Length Coding: A Technique for Improved Test Data Compression, author=Hellebrand, Sybille and Wuertenberger, Armin, year=2002 
LibreCat: /record/13097

@articleHellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_2002, title=Efficient Online and Offline Testing of Embedded DRAMs, volume=51, DOI=10.1109/tc.2002.1017700, number=7, journal=IEEE Transactions on Computers, publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav, year=2002, pages=801–809 
LibreCat: /record/13003
DOI: 10.1109/tc.2002.1017700

@articleHellebrand_Liang_Wunderlich_2002, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, volume=18, number=2, journal=Journal of Electronic Testing - Theory and Applications (JETTA), author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2002, pages=157–168 
LibreCat: /record/13069

@articleLiang_Hellebrand_Wunderlich_2002, title=A Mixed-Mode BIST Scheme Based on Folding Compression, volume=17, number=2, journal=Journal on Computer Science and Technology, author=Liang, Huaguo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2002, pages=203–212 
LibreCat: /record/13070

@bookLiang_Hellebrand_Wunderlich_2001, place=IEEE European Test Workshop, Stockholm, Sweden, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001 
LibreCat: /record/13096

@inproceedingsLiang_Hellebrand_Wunderlich_2001, place=Baltimore, MD, USA, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, DOI=10.1109/test.2001.966712, booktitle=IEEE International Test Conference (ITC’01), publisher=IEEE, author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001, pages=894–902 
LibreCat: /record/13004
DOI: 10.1109/test.2001.966712

@articleLiang_Hellebrand_Wunderlich_2001, title=Deterministic BIST Scheme Based on Reseeding of Folding Counters, volume=38, number=8, journal=Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan), author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001, pages=931 
LibreCat: /record/13047

@articleHellebrand_Liang_Wunderlich_2001, title=A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters, volume=17, number=3/4, journal=Journal of Electronic Testing - Theory and Applications (JETTA), author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2001, pages=341–349 
LibreCat: /record/13068

@bookHellebrand_Wunderlich_2000, place=Handbuch Lehre, Berlin, Raabe Verlag, title=Hardwarepraktikum im Diplomstudiengang Informatik, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2000 
LibreCat: /record/13094

@bookHellebrand_Liang_Wunderlich_2000, place=IEEE European Test Workshop, Cascais, Portugal, title=A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters, author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2000 
LibreCat: /record/13095

@inproceedingsHellebrand_Liang_Wunderlich_2000, place=Atlantic City, NJ, USA, title=A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters, DOI=10.1109/test.2000.894274, booktitle=IEEE International Test Conference (ITC’00), publisher=IEEE, author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2000, pages=778–784 
LibreCat: /record/13005
DOI: 10.1109/test.2000.894274

@bookHellebrand_1999, place=Verlag Dr. Kovac, Hamburg, series=10, title=Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren, publisher=Verlag Dr. Kovac, Hamburg, author=Hellebrand, Sybille, year=1999, collection=10 
LibreCat: /record/13065

@bookHellebrand_Wunderlich_N. Yarmolik_1999, place=11th GI/ITG/GMM/IEEE Workshop, title=Exploiting Symmetries to Speed Up Transparent BIST, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav, year=1999 
LibreCat: /record/13093

@inproceedingsHellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_1999, place=Dana Point, CA, USA, title=Error Detecting Refreshment for Embedded DRAMs, DOI=10.1109/vtest.1999.766693, booktitle=17th IEEE VLSI Test Symposium (VTS’99), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav, year=1999, pages=384–390 
LibreCat: /record/13006
DOI: 10.1109/vtest.1999.766693

@inproceedingsN. Yarmolik_V. Bykov_Hellebrand_Wunderlich_1999, place=Prague, Czech Republic, title=Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms, booktitle=Third European Dependable Computing Conference (EDCC-3), author=N. Yarmolik, Vyacheslav and V. Bykov, Iuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1999 
LibreCat: /record/13066

@inproceedingsHellebrand_Wunderlich_N. Yarmolik_1999, place=Munich, Germany, title=Symmetric Transparent BIST for RAMs, booktitle=Design Automation and Test in Europe (DATE’99), author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav, year=1999, pages=702–707 
LibreCat: /record/13067

@bookHellebrand_Wunderlich_1998, place=Universität Stuttgart, title=Test und Synthese schneller eingebetteter Systeme, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998 
LibreCat: /record/13029

@bookN. Yarmolik_Hellebrand_Wunderlich_1998, place=5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, title=Efficient Consistency Checking for Embedded Memories, author=N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998 
LibreCat: /record/13091

@bookN. Yarmolik_Hellebrand_Wunderlich_1998, place=10th GI/ITG/GMM/IEEE Workshop, title=Efficient Consistency Checking for Embedded Memories, author=N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998 
LibreCat: /record/13092

@inbookHellebrand_Wunderlich_Hertwig_1998, place=In: M. Nicolaidis, Y. Zorian, D. K. Pradhan (Eds.): On-Line Testing for VLSI, Boston: Kluwer Academic Publishers 1998, series=5, title=Mixed-Mode BIST Using Embedded Processors, booktitle=Mixed-Mode BIST Using Embedded Processors, publisher=Kluwer Academic Publishers, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1998, collection=5 
LibreCat: /record/13060

@articleHellebrand_Wunderlich_Hertwig_1998, title=Mixed-Mode BIST Using Embedded Processors, volume=12, number=1/2, journal=Journal of Electronic Testing Theory and Applications - JETTA, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1998, pages=127–138 
LibreCat: /record/13061

@articleHellebrand_Hertwig_Wunderlich_1998, title=Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications, volume=15, number=4, journal=IEEE Design and Test, publisher=IEEE, author=Hellebrand, Sybille and Hertwig, Andre and Wunderlich, Hans-Joachim, year=1998, pages=36–41 
LibreCat: /record/13064

@inproceedingsHertwig_Hellebrand_Wunderlich_1998, place=Monterey, CA, USA, title=Fast Self-Recovering Controllers, DOI=10.1109/vtest.1998.670883, booktitle=16th IEEE VLSI Test Symposium (VTS’98), publisher=IEEE, author=Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998, pages=296–302 
LibreCat: /record/13007
DOI: 10.1109/vtest.1998.670883

@inproceedingsHellebrand_Wunderlich_N. Yarmolik_1998, place=Paris, France, title=Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs, DOI=10.1109/date.1998.655853, booktitle=Design Automation and Test in Europe (DATE’98), author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav, year=1998, pages=173–179 
LibreCat: /record/13008
DOI: 10.1109/date.1998.655853

@inproceedingsN. Yarmolik_V. Klimets_Hellebrand_Wunderlich_1998, place=Szczyrk, Poland, title=New Transparent RAM BIST Based on Self-Adjusting Output Data Compression, booktitle=Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’98), author=N. Yarmolik, Vyacheslav and V. Klimets, Yuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998, pages=27–33 
LibreCat: /record/13063

@bookTsai_Hellebrand_Rajski_Marek-Sadowska_1997, place=4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, title=STARBIST: Scan Autocorrelated Random Pattern Generation, author=Tsai, Kun-Han and Hellebrand, Sybille and Rajski, Janusz and Marek-Sadowska, Malgorzata, year=1997 
LibreCat: /record/13089

@bookHertwig_Hellebrand_Wunderlich_1997, place=3rd IEEE International On-Line Testing Workshop, Crete, Greece, title=Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications, author=Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1997 
LibreCat: /record/13090

@inproceedingsTsai_Hellebrand_Marek-Sadowska_Rajski_1997, place=Anaheim, CA, USA, title=STARBIST: Scan Autocorrelated Random Pattern Generation, DOI=10.1109/dac.1997.597194, booktitle=34th ACM/IEEE Design Automation Conference (DAC’97), publisher=IEEE, author=Tsai, Kun-Han and Hellebrand, Sybille and Marek-Sadowska, Malgorzata and Rajski, Janusz, year=1997 
LibreCat: /record/13009
DOI: 10.1109/dac.1997.597194

@bookHellebrand_Wunderlich_1996, place=3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA, title=Using Embedded Processors for BIST, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1996 
LibreCat: /record/13087

@bookHellebrand_Wunderlich_Hertwig_1996, place=2nd IEEE International On-Line Testing Workshop. Biarritz, France, title=Mixed-Mode BIST Using Embedded Processors, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1996 
LibreCat: /record/13088

@inproceedingsHellebrand_Wunderlich_Hertwig_1996, place=Washington, DC, USA, title=Mixed-Mode BIST Using Embedded Processors, DOI=10.1109/test.1996.556962, booktitle=IEEE International Test Conference (ITC’96), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1996, pages=195–204 
LibreCat: /record/13010
DOI: 10.1109/test.1996.556962

@bookHellebrand_Wunderlich_1995, place=University of Siegen, Germany, title=Synthesis Procedures for Self-Testable Controllers, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1995 
LibreCat: /record/13026

@bookHellebrand_Wunderlich_Goncalves_Paulo Teixeira_1995, place=University Siegen, Germany, title=Evaluation of Self-Testable Controller Architectures Based on Realistic Fault Analysis, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Goncalves, F. and Paulo Teixeira, Joao, year=1995 
LibreCat: /record/13027

@bookHellebrand_Herzog_Wunderlich_1995, place=University of Siegen, Germany, title=Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing, author=Hellebrand, Sybille and Herzog, Maik and Wunderlich, Hans-Joachim, year=1995 
LibreCat: /record/13028

@bookHellebrand_Reeb_Tarnick_Wunderlich_1995, place=2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, title=Pattern Generation for a Deterministic BIST Scheme, author=Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim, year=1995 
LibreCat: /record/13086

@articleHellebrand_Rajski_Tarnick_Venkataraman_Courtois_1995, title=Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers, volume=44, DOI=10.1109/12.364534, number=2, journal=IEEE Transactions on Computers, publisher=IEEE, author=Hellebrand, Sybille and Rajski, Janusz and Tarnick, Steffen and Venkataraman, Srikanth and Courtois, B., year=1995, pages=223–233 
LibreCat: /record/13011
DOI: 10.1109/12.364534

@inproceedingsHellebrand_Reeb_Tarnick_Wunderlich_1995, place=San Jose, CA, USA, title=Pattern Generation for a Deterministic BIST Scheme, DOI=10.1109/iccad.1995.479997, booktitle=ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), publisher=IEEE, author=Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim, year=1995, pages=88–94 
LibreCat: /record/13012
DOI: 10.1109/iccad.1995.479997

@bookHellebrand_Juergensen_Wunderlich_1994, place=University of Siegen, Germany, title=Synthesis for Off-line Testability, author=Hellebrand, Sybille and Juergensen, Arne and Wunderlich, Hans-Joachim, year=1994 
LibreCat: /record/13024

@bookHellebrand_Juergensen_Stroele_Wunderlich_1994, place=University of Siegen, Germany, title=Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time, author=Hellebrand, Sybille and Juergensen, Arne and Stroele, Albrecht and Wunderlich, Hans-Joachim, year=1994 
LibreCat: /record/13025

@bookVenkataraman_Rajski_Hellebrand_Tarnick_1994, place=6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, title=Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen, author=Venkataraman, Srikanth and Rajski, Janusz and Hellebrand, Sybille and Tarnick, Steffen, year=1994 
LibreCat: /record/13083

@bookHellebrand_Wunderlich_1994, place=6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, title=Ein Verfahren zur testfreundlichen Steuerwerkssynthese, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994 
LibreCat: /record/13084

@bookHellebrand_Paulo Teixeira_Wunderlich_1994, place=1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, title=Synthesis for Testability - the ARCHIMEDES Approach, author=Hellebrand, Sybille and Paulo Teixeira, Joao and Wunderlich, Hans-Joachim, year=1994 
LibreCat: /record/13085

@inproceedingsHellebrand_Wunderlich_1994, place=San Jose, CA, USA, title=An Efficient Procedure for the Synthesis of Fast Self-Testable Controller Structures, DOI=10.1109/iccad.1994.629752, booktitle=ACM/IEEE International Conference on Computer-Aided Design (ICCAD’94), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994, pages=110–116 
LibreCat: /record/13014
DOI: 10.1109/iccad.1994.629752

@inproceedingsHellebrand_Wunderlich_1994, place=Oberwiesenthal, Informatik Xpress 4, TU Chemnitz Zwickau, Germany, title=Synthese schneller selbsttestbarer Steuerwerke, booktitle=Tagungsband der GI/GME/ITG-Fachtagung \'26; Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994, pages=3–11 
LibreCat: /record/13059

@inproceedingsHellebrand_Wunderlich_1994, place=Paris, France, title=Synthesis of Self-Testable Controllers, DOI=10.1109/edtc.1994.326815, booktitle=European Design and Test Conference (EDAC/ETC/EUROASIC), author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994, pages=580–585 
LibreCat: /record/13013
DOI: 10.1109/edtc.1994.326815

@bookHellebrand_Tarnick_Rajski_Courtois_1993, place=5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany, title=Effiziente Erzeugung deterministischer Muster im Selbsttest, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1993 
LibreCat: /record/13081

@bookHellebrand_Wunderlich_1993, place=ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier, France, title=Synthesis of Self-Testable Controllers, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1993 
LibreCat: /record/13082

@inproceedingsVenkataraman_Rajski_Hellebrand_Tarnick_1993, title=An Efficient Bist Scheme Based On Reseeding Of Multiple Polynomial Linear Feedback Shift Registers, DOI=10.1109/iccad.1993.580117, booktitle=ACM/IEEE International Conference on Computer Aided Design (ICCAD’93), publisher=IEEE, author=Venkataraman, Srikanth and Rajski, Janusz and Hellebrand, Sybille and Tarnick, Steffen, year=1993 
LibreCat: /record/13015
DOI: 10.1109/iccad.1993.580117

@bookHellebrand_Tarnick_Rajski_Courtois_1992, place=Institut National Polytechnique de Grenoble, Grenoble, France, title=Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1992 
LibreCat: /record/13023

@bookHellebrand_Tarnick_Rajski_Courtois_1992, place=IEEE Design for Testability Workshop, Vail, CO, USA, title=Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1992 
LibreCat: /record/13076

@bookHellebrand_Tarnick_Rajski_Courtois_1992, place=Workshop on New Directions for Testing, Montreal, Canada, title=Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1992 
LibreCat: /record/13080

@articleWunderlich_Hellebrand_1992, title=The Pseudoexhaustive Test of Sequential Circuits, volume=11, DOI=10.1109/43.108616, number=1, journal=IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Wunderlich, Hans-Joachim and Hellebrand, Sybille, year=1992, pages=26–33 
LibreCat: /record/13017
DOI: 10.1109/43.108616

@inproceedingsHellebrand_Tarnick_Rajski_Courtois_1992, place=Baltimore, MD, USA, title=Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers, DOI=10.1109/test.1992.527812, booktitle=IEEE International Test Conference (ITC’92), publisher=IEEE, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1992, pages=120–129 
LibreCat: /record/13016
DOI: 10.1109/test.1992.527812

@bookHellebrand_1991, place=Verlag Düsseldorf: VDI Verlag, series=10, title=Synthese vollständig testbarer Schaltungen, publisher=Verlag Düsseldorf: VDI Verlag, author=Hellebrand, Sybille, year=1991, collection=10 
LibreCat: /record/13034

@bookHellebrand_Wunderlich_F. Haberl_1990, place=IEEE Design for Testability Workshop, Vail, CO, USA, title=Generating Pseudo-Exhaustive Vectors for External Testing, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver, year=1990 
LibreCat: /record/13103

@inproceedingsHellebrand_Wunderlich_1990, place=Glasgow, UK, title=Tools and Devices Supporting the Pseudo-Exhaustive Test, DOI=10.1109/edac.1990.136612, booktitle=European Design Automation Conference (EDAC’90), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1990, pages=13–17 
LibreCat: /record/13018
DOI: 10.1109/edac.1990.136612

@inproceedingsHellebrand_Wunderlich_F. Haberl_1990, place=Washington, DC, USA, title=Generating Pseudo-Exhaustive Vectors for External Testing, DOI=10.1109/test.1990.114082, booktitle=IEEE International Test Conference (ITC’90), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver, year=1990, pages=670–679 
LibreCat: /record/13019
DOI: 10.1109/test.1990.114082