Jafarzadeh, Hanieh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Time and Space Optimized Storage-Based BIST under Multiple Voltages and Variations.” In European Test Symposium, The Hague, Netherlands, May 20-24, 2024, 6. IEEE, n.d.

Jafarzadeh, Hanieh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Vmin Testing under Variations: Defect vs. Fault Coverage.” In IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, 6. IEEE, n.d.

Hellebrand, Sybille, Somayeh Sadeghi-Kohan, and Hans-Joachim Wunderlich. “Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle.” In International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, 1, n.d.

Wunderlich, Hans-Joachim, Hanieh Jafarzadeh, and Sybille Hellebrand. “Robust Test of Small Delay Faults under  PVT-Variations.” In International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, 1, n.d.

Stiballe, Alisa, Jan Dennis Reimer, Somayeh Sadeghi-Kohan, and Sybille Hellebrand. Modeling Crosstalk-Induced Interconnect Delay with Polynomial Regression. Darmstadt, Germany: 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024, 2024.

Ghazal, Abdulkarim, Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille Hellebrand. On Cryptography Effects on Interconnect Reliability. Erfurt, Germany: 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023.

Sprenger, Alexander. Testinstrumente und Testdatenanalyse zur Verarbeitung von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen. Paderborn: Universität Paderborn, 2023.https://doi.org/10.17619/UNIPB/1-1787 .

Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication.”https://doi.org/10.1109/dsn-w58399.2023.00056__In 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W). IEEE, 2023.https://doi.org/10.1109/dsn-w58399.2023.00056 .

Sadeghi-Kohan, Somayeh, Jan Dennis Reimer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimizing the Streaming of Sensor Data with Approximate Communication.” In IEEE Asian Test Symposium (ATS’23), October 2023. Beijing, China, 2023.

Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Workload-Aware Periodic Interconnect BIST.”https://doi.org/10.1109/mdat.2023.3298849__IEEE Design &;Test, 2023, 1–1.https://doi.org/10.1109/mdat.2023.3298849 .

Jafarzadeh, Hanieh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi Haghi, Hussam  Amrouch, Sybille Hellebrand, and Hans-Joachim  Wunderlich. “Robust Pattern Generation for Small Delay Faults under Process Variations.” In IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023. Anaheim, CA, USA: IEEE, 2023.

Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Stress-Aware Periodic Test of Interconnects.”https://doi.org/10.1007/s10836-021-05979-5__Journal of Electronic Testing, 2022.https://doi.org/10.1007/s10836-021-05979-5 .

Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. EM-Aware Interconnect BIST. Online: European Workshop on Silicon Lifecycle Management, March 18, 2022, 2022.

Sprenger, Alexander, Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille Hellebrand. “Variation-Aware Test for Logic Interconnects Using Neural Networks - A Case Study.” In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020. Virtual Conference - Originally Frascati (Rome), Italy, 2020.

Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects. Ludwigsburg: 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, 2020.

Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. “Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects.”https://doi.org/10.1109/vts48691.2020.9107591__In 38th IEEE VLSI Test Symposium (VTS). Virtual Conference - Originally San Diego, CA, USA: IEEE, 2020.https://doi.org/10.1109/vts48691.2020.9107591 .

Holst, Stefan, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, and Xiaoqing Weng. “Logic Fault Diagnosis of Hidden Delay Defects.” In IEEE International Test Conference (ITC’20), November 2020. Virtual Conference - Originally Washington, DC, USA, 2020.

Maaz, Mohammad Urf, Alexander Sprenger, and Sybille Hellebrand. A Hybrid Space Compactor for Varying X-Rates. Prien am Chiemsee: 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), 2019.

Sprenger, Alexander, and Sybille Hellebrand. “Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test.”https://doi.org/10.1142/s0218126619400012__Journal of Circuits, Systems and Computers 28, no. 1 (2019): 1–23.https://doi.org/10.1142/s0218126619400012 .

Kampmann, Matthias, Michael A. Kochte, Chang Liu, Eric Schneider, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Test for Hidden Delay Faults.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 38, no. 10 (2019): 1956–68.

Maaz, Mohammad Urf, Alexander Sprenger, and Sybille Hellebrand. “A Hybrid Space Compactor for Adaptive X-Handling.” In 50th IEEE International Test Conference (ITC), 1–8. Washington, DC, USA: IEEE, 2019.

Sprenger, Alexander, and Sybille Hellebrand. Stochastische Kompaktierung für den Hochgeschwindigkeitstest. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.

Hellebrand, Sybille, Joerg Henkel, Anand Raghunathan, and Hans-Joachim Wunderlich. “Guest Editors’ Introduction - Special Issue on Approximate Computing.”https://doi.org/10.1109/les.2018.2789942__IEEE Embedded Systems Letters 10, no. 1 (2018): 1–1.https://doi.org/10.1109/les.2018.2789942 .

Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability 80 (2018): 124–33.

Kampmann, Matthias, and Sybille Hellebrand. Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, 2018.

Rezaeizadeh Rookerd, Ramin, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture.”https://doi.org/10.1145/3194554.3194599__In Proceedings of the 2018 on Great Lakes Symposium on VLSI. ACM, 2018.https://doi.org/10.1145/3194554.3194599 .

Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space Compaction to Faster-than-at-Speed Test.”https://doi.org/10.1109/ddecs.2018.00020__In 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits &; Systems (DDECS). Budapest, Hungary: IEEE, 2018.https://doi.org/10.1109/ddecs.2018.00020 .

Liu, Chang, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.”https://doi.org/10.1109/ats.2018.00028__In 27th IEEE Asian Test Symposium (ATS’18), 2018.https://doi.org/10.1109/ats.2018.00028 .

Sadeghi-Kohan, Somayeh, Arash Vafaei, and Zainalabedin Navabi. “Near-Optimal Node Selection Procedure for Aging Monitor Placement.”https://doi.org/10.1109/iolts.2018.8474120__In 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS). IEEE, 2018.https://doi.org/10.1109/iolts.2018.8474120 .

Deshmukh, Jyotirmoy, Wolfgang Kunz, Hans-Joachim Wunderlich, and Sybille Hellebrand. “Special Session on Early Life Failures.”https://doi.org/10.1109/vts.2017.7928933__In 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE, 2017.https://doi.org/10.1109/vts.2017.7928933 .

Kampmann, Matthias, and Sybille Hellebrand. X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.

Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant Compaction during Faster-than-at-Speed Test.”https://doi.org/10.1109/ddecs.2017.7934564__In 20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17). IEEE, 2017.https://doi.org/10.1109/ddecs.2017.7934564 .

Sadeghi-Kohan, Somayeh, Mehdi Kamal, and Zainalabedin Navabi. “Self-Adjusting Monitor for Measuring Aging Rate and Advancement.”https://doi.org/10.1109/tetc.2017.2771441__IEEE Transactions on Emerging Topics in Computing 8, no. 3 (2017): 627–41.https://doi.org/10.1109/tetc.2017.2771441 .

Jenihhin, Maksim, Alexander Kamkin, Zainalabedin Navabi, and Somayeh Sadeghi-Kohan. “Universal Mitigation of NBTI-Induced Aging by Design Randomization.”https://doi.org/10.1109/ewdts.2016.7807635__In 2016 IEEE East-West Design &; Test Symposium (EWDTS). IEEE, 2017.https://doi.org/10.1109/ewdts.2016.7807635 .

Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.”https://doi.org/10.1109/ats.2016.20__In 25th IEEE Asian Test Symposium (ATS’16), 1–6. Hiroshima, Japan: IEEE, 2016.https://doi.org/10.1109/ats.2016.20 .

Kampmann, Matthias, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.”https://doi.org/10.1109/ats.2015.26__In 24th IEEE Asian Test Symposium (ATS’15), 109–14. Mumbai, India: IEEE, 2015.https://doi.org/10.1109/ats.2015.26 .

Huang, Zhengfeng, Huaguo Liang, and Sybille Hellebrand. “A High Performance SEU Tolerant Latch.” Journal of Electronic Testing - Theory and Applications (JETTA) 31, no. 4 (2015): 349–59.

Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael Kochte, Chang Liu, and Hans-Joachim Wunderlich. Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.

Sadeghi-Kohan, Somayeh, Arezoo Kamran, Farnaz Forooghifar, and Zainalabedin Navabi. “Aging in Digital Circuits and Age Monitoring: Object-Oriented Modeling and Evaluation.”https://doi.org/10.1109/dtis.2015.7127373__In 2015 10th International Conference on Design &; Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE, 2015.https://doi.org/10.1109/dtis.2015.7127373 .

Sadeghi-Kohan, Somayeh, Mehdi Kamal, John McNeil, Paolo Prinetto, and Zain Navabi. “Online Self Adjusting Progressive Age Monitoring of Timing Variations.”https://doi.org/10.1109/dtis.2015.7127368__In 2015 10th International Conference on Design &; Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE, 2015.https://doi.org/10.1109/dtis.2015.7127368 .

Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, and Hans-Joachim Wunderlich. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.”https://doi.org/10.1109/test.2014.7035360__In IEEE International Test Conference (ITC’14). Seattle, Washington, USA: IEEE, 2014.https://doi.org/10.1109/test.2014.7035360 .

Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” DeGruyter Journal on Information Technology (It) 56, no. 4 (2014): 165–72.

Rodriguez Gomez, Laura, Alejandro Cook, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Adaptive Bayesian Diagnosis of Intermittent Faults.” Journal of Electronic Testing - Theory and Applications (JETTA) 30, no. 5 (2014): 527–40.

Alizadeh, Bijan, Payman Behnam, and Somayeh Sadeghi-Kohan. “A Scalable Formal Debugging Approach with Auto-Correction Capability Based on Static Slicing and Dynamic Ranking for RTL Datapath Designs.”https://doi.org/10.1109/tc.2014.2329687__IEEE Transactions on Computers, 2014, 1–1.https://doi.org/10.1109/tc.2014.2329687 .

Mohammadi, Marzieh, Somayeh Sadeghi-Kohan, Nasser Masoumi, and Zainalabedin Navabi. “An Off-Line MDSI Interconnect BIST Incorporated in BS 1149.1.”https://doi.org/10.1109/ets.2014.6847847__In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014.https://doi.org/10.1109/ets.2014.6847847 .

Sadeghi-Kohan, Somayeh, Payman Behnam, Bijan Alizadeh, Masahiro Fujita, and Zainalabedin Navabi. “Improving Polynomial Datapath Debugging with HEDs.”https://doi.org/10.1109/ets.2014.6847797__In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014.https://doi.org/10.1109/ets.2014.6847797 .

Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.”https://doi.org/10.1109/latw.2013.6562662__In 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina: IEEE, 2013.https://doi.org/10.1109/latw.2013.6562662 .

Cook, Alejandro, Laura Rodriguez Gomez, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.

Sadeghi-Kohan, Somayeh, Majid Namaki-Shoushtari, Fatemeh Javaheri, and Zainalabedin Navabi. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.”https://doi.org/10.1109/test.2012.6401583__In 2012 IEEE International Test Conference. IEEE, 2013.https://doi.org/10.1109/test.2012.6401583 .

Sadeghi-Kohan, Somayeh, Shahrzad Keshavarz, Farzaneh Zokaee, Farimah Farahmandi, and Zainalabedin Navabi. “A New Structure for Interconnect Offline Testing.”https://doi.org/10.1109/ewdts.2013.6673207__In East-West Design &;amp; Test Symposium (EWDTS 2013). IEEE, 2013.https://doi.org/10.1109/ewdts.2013.6673207 .

Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.”https://doi.org/10.1109/latw.2012.6261229__In 13th IEEE Latin American Test Workshop (LATW’12), 1–4. Quito, Ecuador: IEEE, 2012.https://doi.org/10.1109/latw.2012.6261229 .

Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.”https://doi.org/10.1109/ets.2012.6233025__In 17th IEEE European Test Symposium (ETS’12), 1–6. Annecy, France: IEEE, 2012.https://doi.org/10.1109/ets.2012.6233025 .

Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.

Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.”https://doi.org/10.1109/ats.2011.55__In 20th IEEE Asian Test Symposium (ATS’11), 285–90. New Delhi, India: IEEE, 2011.https://doi.org/10.1109/ats.2011.55 .

Polian, Ilia, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, and Peter Maxwell. “Towards Variation-Aware Test Methods.”https://doi.org/10.1109/ets.2011.51__In 16th IEEE European Test Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE, 2011.https://doi.org/10.1109/ets.2011.51 .

Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Robuster Selbsttest Mit Diagnose.” In 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 48–53. Hamburg, Germany, 2011.

Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer 54, no. 4 (2011): 1813–26.

Kamran, Arezoo, Nastaran Nemati, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Virtual Tester Development Using HDL/PLI.”https://doi.org/10.1109/ewdts.2010.5742156__In 2010 East-West Design &;amp; Test Symposium (EWDTS). IEEE, 2011.https://doi.org/10.1109/ewdts.2010.5742156 .

Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.

Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.”https://doi.org/10.1109/dsnw.2010.5542612__In 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10). Chicago, IL, USA: IEEE, 2010.https://doi.org/10.1109/dsnw.2010.5542612 .

Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 81–88. Wildbad Kreuth, Germany, 2010.

Hellebrand, Sybille. Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180, 2010.

Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.”https://doi.org/10.1109/ats.2010.24__In 19th IEEE Asian Test Symposium (ATS’10), 87–93. Shanghai, China: IEEE, 2010.https://doi.org/10.1109/ats.2010.24 .

Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.”https://doi.org/10.1109/iccd.2010.5647648__In 28th IEEE International Conference on Computer Design (ICCD’10), 480–85. Amsterdam, The Netherlands: IEEE, 2010.https://doi.org/10.1109/iccd.2010.5647648 .

Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.”https://doi.org/10.1109/dft.2010.19__In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 101–8. Kyoto, Japan: IEEE, 2010.https://doi.org/10.1109/dft.2010.19 .

Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure for Test Data Compression.”https://doi.org/10.1109/vts.2010.5469570__In 28th IEEE VLSI Test Symposium (VTS’10), 227–31. Santa Cruz, CA, USA: IEEE, 2010.https://doi.org/10.1109/vts.2010.5469570 .

Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper). Chicago, IL, USA, 2010.

Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Robuster Selbsttest Mit Extremer Kompaktierung.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 17–24. Wildbad Kreuth, Germany, 2010.

Hunger, Marc, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, and Bernd Becker. “ATPG-Based Grading of Strong Fault-Secureness.”https://doi.org/10.1109/iolts.2009.5196027__In 15th IEEE International On-Line Testing Symposium (IOLTS’09. Sesimbra-Lisbon, Portugal: IEEE, 2009.https://doi.org/10.1109/iolts.2009.5196027 .

Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?”https://doi.org/10.1109/dft.2009.28__In 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 77. Chicago, IL, USA: IEEE, 2009.https://doi.org/10.1109/dft.2009.28 .

Hunger, Marc, Sybille Hellebrand, Alexander Czutro, Ilia Polian, and Bernd Becker. “Robustheitsanalyse Stark Fehlersicherer Schaltungen Mit SAT-Basierter Testmustererzeugung.” In 3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Stuttgart, Germany, 2009.

Coym, Torsten, Sybille Hellebrand, Stefan Ludwig, Bernd Straube, Hans-Joachim Wunderlich, and Christian G. Zoellin. Ein Verfeinertes Elektrisches Modell Für Teilchentreffer Und Dessen Auswirkung Auf Die Bewertung Der Schaltungsempfindlichkeit. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, 2008.

Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. Testen Mit Rücksetzpunkten - Ein Ansatz Zur Verbesserung Der Ausbeute Bei Robusten Schaltungen. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, 2008.

Oehler, Philipp, Alberto Bosio, Giorgio di Natale, and Sybille Hellebrand. “A Modular Memory BIST for Optimized Memory Repair.”https://doi.org/10.1109/iolts.2008.30__In 14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster). Rhodos, Greece: IEEE, 2008.https://doi.org/10.1109/iolts.2008.30 .

Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Signature Rollback - A Technique for Testing Robust Circuits.”https://doi.org/10.1109/vts.2008.34__In 26th IEEE VLSI Test Symposium (VTS’08), 125–30. San Diego, CA, USA: IEEE, 2008.https://doi.org/10.1109/vts.2008.34 .

Hunger, Marc, and Sybille Hellebrand. “Verification and Analysis of Self-Checking Properties through ATPG.”https://doi.org/10.1109/iolts.2008.32__In 14th IEEE International On-Line Testing Symposium (IOLTS’08). Rhodos, Greece: IEEE, 2008.https://doi.org/10.1109/iolts.2008.32 .

Hunger, Marc, and Sybille Hellebrand. “Analyse Selbstprüfender Schaltungen – Nachweis von Fehlersicherheit Und Selbsttestbarkeit Mit ATPG.” In 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Ingolstadt, Germany, 2008.

Oehler, Philipp, Alberto Bosio, Giorgio Di Natale, and Sybille Hellebrand. “Modularer Selbsttest Und Optimierte Reparaturanalyse.” In 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Ingolstadt, Germany, 2008.

Hellebrand, Sybille. Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing. 5th IEEE East-West Design \'26; Test Symposium, Yerevan, Armenia (Invited Talk), 2007.

Ali, Muhammad, Michael Welzl, Sven Hessler, and Sybille Hellebrand. An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips. DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), 2007.

Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007.

Hellebrand, Sybille. Qualitätssicherung Für Nanochips - Wie IT-Produkte Zuverlässig Werden. ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany, 2007.

Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.”https://doi.org/10.1109/dft.2007.43__In 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), 50–58. Rome, Italy: IEEE, 2007.https://doi.org/10.1109/dft.2007.43 .

Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair.”https://doi.org/10.1109/ddecs.2007.4295278__In 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), 185–90. Krakow, Poland: IEEE, 2007.https://doi.org/10.1109/ddecs.2007.4295278 .

Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy.”https://doi.org/10.1109/ets.2007.10__In 12th IEEE European Test Symposium (ETS’07), 91–96. Freiburg, Germany: IEEE, 2007.https://doi.org/10.1109/ets.2007.10 .

Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” In 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper). Bled, Slovenia, 2007.

Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” Informacije MIDEM, Ljubljana (Invited Paper) 37, no. 4 (124) (2007): 212–19.

Ali, Muhammad, Sven Hessler, Michael Welzl, and Sybille Hellebrand. “An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip.” International Journal on High Performance Systems Architecture 1, no. 2 (2007): 113–23.

Ali, Muhammad, Michael Welzl, Sven Hessler, and Sybille Hellebrand. “A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip.” In 4th International Conference on Information Technology: New Generations (ITNG’07), 1027–32. Las Vegas, Nevada, USA, 2007.

Becker, Bernd, Ilia Polian, Sybille Hellebrand, Bernd Straube, and Hans-Joachim Wunderlich. “Test Und Zuverlässigkeit Nanoelektronischer Systeme.” In 1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Munich, Germany, 2007.

Becker, Bernd, Ilia Polian, Sybille Hellebrand, Bernd Straube, and Hans-Joachim Wunderlich. “DFG-Projekt RealTest - Test Und Zuverlässigkeit Nanoelektronischer Systeme.” It - Information Technology 48, no. 5 (2006): 305–11.

Oehler, Philipp, and Sybille Hellebrand. A Low Power Design for Embedded DRAMs with Online Consistency Checking. Kleinheubachertagung 2005, Miltenberg, Germany, 2005.

Ali, Muhammad, Michael Welzl, and Sybille Hellebrand. Dynamic Routing: A Prerequisite for Reliable NoCs. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.

Oehler, Philipp, and Sybille Hellebrand. Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.

Ali, Muhammad, Michael Welzl, Martin Zwicknagl, and Sybille Hellebrand. “Considerations for Fault-Tolerant Networks on Chips.”https://doi.org/10.1109/icm.2005.1590063__In IEEE International Conference on Microelectronics (ICM’05). Islamabad, Pakistan: IEEE, 2005.https://doi.org/10.1109/icm.2005.1590063 .

Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.”https://doi.org/10.1109/ets.2005.28__In 10th IEEE European Test Symposium (ETS’05), 148–53. Tallinn, Estonia: IEEE, 2005.https://doi.org/10.1109/ets.2005.28 .

Ali, Muhammad, Michael Welzl, and Sybille Hellebrand. “A Dynamic Routing Mechanism for Network on Chip.”https://doi.org/10.1109/norchp.2005.1596991__In 23rd IEEE NORCHIP Conference, 70–73. Oulu, Finland: IEEE, 2005.https://doi.org/10.1109/norchp.2005.1596991 .

Liu Jing, Michelle, Stefan Ruehrup, Christian Schindelhauer, Klaus Volbert, Martin Dierkes, Andreas Bellgardt, Rüdiger Ibers, and Ulrich Hilleringmann. “Sensor Networks with More Features Using Less Hardware.” In GOR/NGB Conference Tilburg 2004. Tilburg, Netherlands, 2004.

Breu, Ruth, Thomas Fahringer, Dieter Fensel, Sybille Hellebrand, Aart Middeldorp, and Otmar Scherzer. Im Westen Viel Neues - Informatik an Der Universität Innsbruck. OCG Journal, pp. 28-29, 2004.

Hellebrand, Sybille, Armin Wuertenberger, and Christofer S. Tautermann. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.