Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.”https://doi.org/10.1109/test.2004.1387357__In IEEE International Test Conference (ITC’04), 926–35. Charlotte, NC, USA: IEEE, 2004.https://doi.org/10.1109/test.2004.1387357 .
LibreCat: /record/13001
DOI: 10.1109/test.2004.1387357

Breu, Ruth, Sybille Hellebrand, and Michael Welzl. Experiences from Teaching Software Development in a Java Environment. Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia, 2003.
LibreCat: /record/13098

Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand. “A Hybrid Coding Strategy for Optimized Test Data Compression.”https://doi.org/10.1109/test.2003.1270870__In IEEE International Test Conference (ITC’03), 451–59. Charlotte, NC, USA: IEEE, 2003.https://doi.org/10.1109/test.2003.1270870 .
LibreCat: /record/13002
DOI: 10.1109/test.2003.1270870

Hellebrand, Sybille, and Armin Wuertenberger. Alternating Run-Length Coding: A Technique for Improved Test Data Compression. IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, 2002.
LibreCat: /record/13097

Hellebrand, Sybille, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, and Vyacheslav N. Yarmolik. “Efficient Online and Offline Testing of Embedded DRAMs.”https://doi.org/10.1109/tc.2002.1017700__IEEE Transactions on Computers 51, no. 7 (2002): 801–9.https://doi.org/10.1109/tc.2002.1017700 .
LibreCat: /record/13003
DOI: 10.1109/tc.2002.1017700

Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” Journal of Electronic Testing - Theory and Applications (JETTA) 18, no. 2 (2002): 157–68.
LibreCat: /record/13069

Liang, Huaguo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “A Mixed-Mode BIST Scheme Based on Folding Compression.” Journal on Computer Science and Technology 17, no. 2 (2002): 203–12.
LibreCat: /record/13070

Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden, 2001.
LibreCat: /record/13096

Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.”https://doi.org/10.1109/test.2001.966712__In IEEE International Test Conference (ITC’01), 894–902. Baltimore, MD, USA: IEEE, 2001.https://doi.org/10.1109/test.2001.966712 .
LibreCat: /record/13004
DOI: 10.1109/test.2001.966712

Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Deterministic BIST Scheme Based on Reseeding of Folding Counters.” Journal of Computer Research and Development, (Jisuanji Yanjiu Yu Fazhan) 38, no. 8 (2001): 931.
LibreCat: /record/13047

Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” Journal of Electronic Testing - Theory and Applications (JETTA) 17, no. 3/4 (2001): 341–49.
LibreCat: /record/13068

Hellebrand, Sybille, and Hans-Joachim Wunderlich. Hardwarepraktikum Im Diplomstudiengang Informatik. Handbuch Lehre, Berlin, Raabe Verlag, 2000.
LibreCat: /record/13094

Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. IEEE European Test Workshop, Cascais, Portugal, 2000.
LibreCat: /record/13095

Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.”https://doi.org/10.1109/test.2000.894274__In IEEE International Test Conference (ITC’00), 778–84. Atlantic City, NJ, USA: IEEE, 2000.https://doi.org/10.1109/test.2000.894274 .
LibreCat: /record/13005
DOI: 10.1109/test.2000.894274

Hellebrand, Sybille. Selbsttestbare Steuerwerke - Strukturen Und Syntheseverfahren. 10. Verlag Dr. Kovac, Hamburg: Verlag Dr. Kovac, Hamburg, 1999.
LibreCat: /record/13065

Hellebrand, Sybille, Hans-Joachim Wunderlich, and Vyacheslav N. Yarmolik. Exploiting Symmetries to Speed Up Transparent BIST. 11th GI/ITG/GMM/IEEE Workshop, 1999.
LibreCat: /record/13093

Hellebrand, Sybille, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, and Vyacheslav N. Yarmolik. “Error Detecting Refreshment for Embedded DRAMs.”https://doi.org/10.1109/vtest.1999.766693__In 17th IEEE VLSI Test Symposium (VTS’99), 384–90. Dana Point, CA, USA: IEEE, 1999.https://doi.org/10.1109/vtest.1999.766693 .
LibreCat: /record/13006
DOI: 10.1109/vtest.1999.766693

N. Yarmolik, Vyacheslav, Iuri V. Bykov, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms.” In Third European Dependable Computing Conference (EDCC-3). Prague, Czech Republic, 1999.
LibreCat: /record/13066

Hellebrand, Sybille, Hans-Joachim Wunderlich, and Vyacheslav N. Yarmolik. “Symmetric Transparent BIST for RAMs.” In Design Automation and Test in Europe (DATE’99), 702–7. Munich, Germany, 1999.
LibreCat: /record/13067

Hellebrand, Sybille, and Hans-Joachim Wunderlich. Test Und Synthese Schneller Eingebetteter Systeme. Universität Stuttgart, 1998.
LibreCat: /record/13029