Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2010, pp. 81–88.
LibreCat: /record/13051

Hellebrand, Sybille. Nano-Electronic Systems. 2010.
LibreCat: /record/13073

Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.”10.1109/ats.2010.24__19th IEEE Asian Test Symposium (ATS’10), IEEE, 2010, pp. 87–93, doi:10.1109/ats.2010.24.
LibreCat: /record/12983
DOI: 10.1109/ats.2010.24

Indlekofer, Thomas, et al. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.”10.1109/iccd.2010.5647648__28th IEEE International Conference on Computer Design (ICCD’10), IEEE, 2010, pp. 480–85, doi:10.1109/iccd.2010.5647648.
LibreCat: /record/12985
DOI: 10.1109/iccd.2010.5647648

Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.”10.1109/dft.2010.19__25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), IEEE, 2010, pp. 101–08, doi:10.1109/dft.2010.19.
LibreCat: /record/12986
DOI: 10.1109/dft.2010.19

Froese, Viktor, et al. “Reusing NoC-Infrastructure for Test Data Compression.”10.1109/vts.2010.5469570__28th IEEE VLSI Test Symposium (VTS’10), IEEE, 2010, pp. 227–31, doi:10.1109/vts.2010.5469570.
LibreCat: /record/12988
DOI: 10.1109/vts.2010.5469570

Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), 2010.
LibreCat: /record/13049

Indlekofer, Thomas, et al. “Robuster Selbsttest Mit Extremer Kompaktierung.” 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2010, pp. 17–24.
LibreCat: /record/13050

Hunger, Marc, et al. “ATPG-Based Grading of Strong Fault-Secureness.”10.1109/iolts.2009.5196027__15th IEEE International On-Line Testing Symposium (IOLTS’09, IEEE, 2009, doi:10.1109/iolts.2009.5196027.
LibreCat: /record/12991
DOI: 10.1109/iolts.2009.5196027

Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?”10.1109/dft.2009.28__24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), IEEE, 2009, p. 77, doi:10.1109/dft.2009.28.
LibreCat: /record/12990
DOI: 10.1109/dft.2009.28

Hunger, Marc, et al. “Robustheitsanalyse Stark Fehlersicherer Schaltungen Mit SAT-Basierter Testmustererzeugung.” 3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2009.
LibreCat: /record/13030

Coym, Torsten, et al. Ein Verfeinertes Elektrisches Modell Für Teilchentreffer Und Dessen Auswirkung Auf Die Bewertung Der Schaltungsempfindlichkeit. 2008.
LibreCat: /record/13033

Amgalan, Uranmandakh, et al. Testen Mit Rücksetzpunkten - Ein Ansatz Zur Verbesserung Der Ausbeute Bei Robusten Schaltungen. 2008.
LibreCat: /record/13035

Oehler, Philipp, et al. “A Modular Memory BIST for Optimized Memory Repair.”10.1109/iolts.2008.30__14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster), IEEE, 2008, doi:10.1109/iolts.2008.30.
LibreCat: /record/12992
DOI: 10.1109/iolts.2008.30

Amgalan, Uranmandakh, et al. “Signature Rollback - A Technique for Testing Robust Circuits.”10.1109/vts.2008.34__26th IEEE VLSI Test Symposium (VTS’08), IEEE, 2008, pp. 125–30, doi:10.1109/vts.2008.34.
LibreCat: /record/12994
DOI: 10.1109/vts.2008.34

Hunger, Marc, and Sybille Hellebrand. “Verification and Analysis of Self-Checking Properties through ATPG.”10.1109/iolts.2008.32__14th IEEE International On-Line Testing Symposium (IOLTS’08), IEEE, 2008, doi:10.1109/iolts.2008.32.
LibreCat: /record/12993
DOI: 10.1109/iolts.2008.32

Hunger, Marc, and Sybille Hellebrand. “Analyse Selbstprüfender Schaltungen – Nachweis von Fehlersicherheit Und Selbsttestbarkeit Mit ATPG.” 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2008.
LibreCat: /record/13031

Oehler, Philipp, et al. “Modularer Selbsttest Und Optimierte Reparaturanalyse.” 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2008.
LibreCat: /record/13032

Hellebrand, Sybille. Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing. 2007.
LibreCat: /record/13038

Ali, Muhammad, et al. An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips. 2007.
LibreCat: /record/13039