@inproceedingsHunger_Hellebrand_2010, place=Wildbad Kreuth, Germany, title=Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz, booktitle=4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille, year=2010, pages=81–88 

@bookHellebrand_2010, place=Editorial, it 4/2010, pp. 179-180, title=Nano-Electronic Systems, author=Hellebrand, Sybille, year=2010 

@inproceedingsHopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place=Shanghai, China, title=Variation-Aware Fault Modeling, DOI=10.1109/ats.2010.24, booktitle=19th IEEE Asian Test Symposium (ATS’10), publisher=IEEE, author=Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2010, pages=87–93 

@inproceedingsIndlekofer_Schnittger_Hellebrand_2010, place=Amsterdam, The Netherlands, title=Efficient Test Response Compaction for Robust BIST Using Parity Sequences, DOI=10.1109/iccd.2010.5647648, booktitle=28th IEEE International Conference on Computer Design (ICCD’10), publisher=IEEE, author=Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille, year=2010, pages=480–485 

@inproceedingsHunger_Hellebrand_2010, place=Kyoto, Japan, title=The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems, DOI=10.1109/dft.2010.19, booktitle=25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille, year=2010, pages=101–108 

@inproceedingsFroese_Ibers_Hellebrand_2010, place=Santa Cruz, CA, USA, title=Reusing NoC-Infrastructure for Test Data Compression, DOI=10.1109/vts.2010.5469570, booktitle=28th IEEE VLSI Test Symposium (VTS’10), publisher=IEEE, author=Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille, year=2010, pages=227–231 

@inproceedingsBecker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place=Chicago, IL, USA, title=Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits, booktitle=4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), author=Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2010 

@inproceedingsIndlekofer_Schnittger_Hellebrand_2010, place=Wildbad Kreuth, Germany, title=Robuster Selbsttest mit extremer Kompaktierung, booktitle=4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille, year=2010, pages=17–24 

@inproceedingsHunger_Hellebrand_Czutro_Polian_Becker_2009, place=Sesimbra-Lisbon, Portugal, title=ATPG-Based Grading of Strong Fault-Secureness, DOI=10.1109/iolts.2009.5196027, booktitle=15th IEEE International On-Line Testing Symposium (IOLTS’09, publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille and Czutro, Alejandro and Polian, Ilia and Becker, Bernd, year=2009 

@inproceedingsHellebrand_Hunger_2009, place=Chicago, IL, USA, title=Are Robust Circuits Really Robust?, DOI=10.1109/dft.2009.28, booktitle=24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), publisher=IEEE, author=Hellebrand, Sybille and Hunger, Marc, year=2009, pages=77 

@inproceedingsHunger_Hellebrand_Czutro_Polian_Becker_2009, place=Stuttgart, Germany, title=Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung, booktitle=3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille and Czutro, Alexander and Polian, Ilia and Becker, Bernd, year=2009 

@bookCoym_Hellebrand_Ludwig_Straube_Wunderlich_G. Zoellin_2008, place=20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, title=Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit, author=Coym, Torsten and Hellebrand, Sybille and Ludwig, Stefan and Straube, Bernd and Wunderlich, Hans-Joachim and G. Zoellin, Christian, year=2008 

@bookAmgalan_Hachmann_Hellebrand_Wunderlich_2008, place=20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, title=Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen, author=Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2008 

@inproceedingsOehler_Bosio_di Natale_Hellebrand_2008, place=Rhodos, Greece, title=A Modular Memory BIST for Optimized Memory Repair, DOI=10.1109/iolts.2008.30, booktitle=14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster), publisher=IEEE, author=Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille, year=2008 

@inproceedingsAmgalan_Hachmann_Hellebrand_Wunderlich_2008, place=San Diego, CA, USA, title=Signature Rollback - A Technique for Testing Robust Circuits, DOI=10.1109/vts.2008.34, booktitle=26th IEEE VLSI Test Symposium (VTS’08), publisher=IEEE, author=Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2008, pages=125–130 

@inproceedingsHunger_Hellebrand_2008, place=Rhodos, Greece, title=Verification and Analysis of Self-Checking Properties through ATPG, DOI=10.1109/iolts.2008.32, booktitle=14th IEEE International On-Line Testing Symposium (IOLTS’08), publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille, year=2008 

@inproceedingsHunger_Hellebrand_2008, place=Ingolstadt, Germany, title=Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG, booktitle=2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille, year=2008 

@inproceedingsOehler_Bosio_Di Natale_Hellebrand_2008, place=Ingolstadt, Germany, title=Modularer Selbsttest und optimierte Reparaturanalyse, booktitle=2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Oehler, Philipp and Bosio, Alberto and Di Natale, Giorgio and Hellebrand, Sybille, year=2008 

@bookHellebrand_2007, place=5th IEEE East-West Design \'26; Test Symposium, Yerevan, Armenia (Invited Talk), title=Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing, author=Hellebrand, Sybille, year=2007 

@bookAli_Welzl_Hessler_Hellebrand_2007, place=DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), title=An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips, author=Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille, year=2007