Jafarzadeh, Hanieh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Time and Space Optimized Storage-Based BIST under Multiple Voltages and Variations.” In European Test Symposium, The Hague, Netherlands, May 20-24, 2024, 6. IEEE, n.d.
LibreCat: /record/52744

Jafarzadeh, Hanieh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Vmin Testing under Variations: Defect vs. Fault Coverage.” In IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, 6. IEEE, n.d.
LibreCat: /record/52742

Hellebrand, Sybille, Somayeh Sadeghi-Kohan, and Hans-Joachim Wunderlich. “Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle.” In International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, 1, n.d.
LibreCat: /record/52743

Wunderlich, Hans-Joachim, Hanieh Jafarzadeh, and Sybille Hellebrand. “Robust Test of Small Delay Faults under  PVT-Variations.” In International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, 1, n.d.
LibreCat: /record/52745

Stiballe, Alisa, Jan Dennis Reimer, Somayeh Sadeghi-Kohan, and Sybille Hellebrand. Modeling Crosstalk-Induced Interconnect Delay with Polynomial Regression. Darmstadt, Germany: 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024, 2024.
LibreCat: /record/50284

Ghazal, Abdulkarim, Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille Hellebrand. On Cryptography Effects on Interconnect Reliability. Erfurt, Germany: 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023.
LibreCat: /record/35204

Sprenger, Alexander. Testinstrumente und Testdatenanalyse zur Verarbeitung von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen. Paderborn: Universität Paderborn, 2023.https://doi.org/10.17619/UNIPB/1-1787 .
LibreCat: /record/46482
DOI: 10.17619/UNIPB/1-1787

Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication.”https://doi.org/10.1109/dsn-w58399.2023.00056__In 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W). IEEE, 2023.https://doi.org/10.1109/dsn-w58399.2023.00056 .
LibreCat: /record/46739
DOI: 10.1109/dsn-w58399.2023.00056

Sadeghi-Kohan, Somayeh, Jan Dennis Reimer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimizing the Streaming of Sensor Data with Approximate Communication.” In IEEE Asian Test Symposium (ATS’23), October 2023. Beijing, China, 2023.
LibreCat: /record/46738

Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Workload-Aware Periodic Interconnect BIST.”https://doi.org/10.1109/mdat.2023.3298849__IEEE Design &;Test, 2023, 1–1.https://doi.org/10.1109/mdat.2023.3298849 .
LibreCat: /record/46264
DOI: 10.1109/mdat.2023.3298849

Jafarzadeh, Hanieh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi Haghi, Hussam  Amrouch, Sybille Hellebrand, and Hans-Joachim  Wunderlich. “Robust Pattern Generation for Small Delay Faults under Process Variations.” In IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023. Anaheim, CA, USA: IEEE, 2023.
LibreCat: /record/45830

Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Stress-Aware Periodic Test of Interconnects.”https://doi.org/10.1007/s10836-021-05979-5__Journal of Electronic Testing, 2022.https://doi.org/10.1007/s10836-021-05979-5 .
LibreCat: /record/29351
DOI: 10.1007/s10836-021-05979-5

Sadeghi-Kohan, Somayeh, Sybille Hellebrand, and Hans-Joachim Wunderlich. EM-Aware Interconnect BIST. Online: European Workshop on Silicon Lifecycle Management, March 18, 2022, 2022.
LibreCat: /record/29890

Sprenger, Alexander, Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille Hellebrand. “Variation-Aware Test for Logic Interconnects Using Neural Networks - A Case Study.” In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020. Virtual Conference - Originally Frascati (Rome), Italy, 2020.
LibreCat: /record/19422

Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects. Ludwigsburg: 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, 2020.
LibreCat: /record/15419

Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. “Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects.”https://doi.org/10.1109/vts48691.2020.9107591__In 38th IEEE VLSI Test Symposium (VTS). Virtual Conference - Originally San Diego, CA, USA: IEEE, 2020.https://doi.org/10.1109/vts48691.2020.9107591 .
LibreCat: /record/29200
DOI: 10.1109/vts48691.2020.9107591

Holst, Stefan, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, and Xiaoqing Weng. “Logic Fault Diagnosis of Hidden Delay Defects.” In IEEE International Test Conference (ITC’20), November 2020. Virtual Conference - Originally Washington, DC, USA, 2020.
LibreCat: /record/19421

Maaz, Mohammad Urf, Alexander Sprenger, and Sybille Hellebrand. A Hybrid Space Compactor for Varying X-Rates. Prien am Chiemsee: 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), 2019.
LibreCat: /record/8112

Sprenger, Alexander, and Sybille Hellebrand. “Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test.”https://doi.org/10.1142/s0218126619400012__Journal of Circuits, Systems and Computers 28, no. 1 (2019): 1–23.https://doi.org/10.1142/s0218126619400012 .
LibreCat: /record/8667
DOI: 10.1142/s0218126619400012

Kampmann, Matthias, Michael A. Kochte, Chang Liu, Eric Schneider, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Test for Hidden Delay Faults.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 38, no. 10 (2019): 1956–68.
LibreCat: /record/13048

Maaz, Mohammad Urf, Alexander Sprenger, and Sybille Hellebrand. “A Hybrid Space Compactor for Adaptive X-Handling.” In 50th IEEE International Test Conference (ITC), 1–8. Washington, DC, USA: IEEE, 2019.
LibreCat: /record/12918

Sprenger, Alexander, and Sybille Hellebrand. Stochastische Kompaktierung für den Hochgeschwindigkeitstest. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.
LibreCat: /record/4576

Hellebrand, Sybille, Joerg Henkel, Anand Raghunathan, and Hans-Joachim Wunderlich. “Guest Editors’ Introduction - Special Issue on Approximate Computing.”https://doi.org/10.1109/les.2018.2789942__IEEE Embedded Systems Letters 10, no. 1 (2018): 1–1.https://doi.org/10.1109/les.2018.2789942 .
LibreCat: /record/12974
DOI: 10.1109/les.2018.2789942

Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability 80 (2018): 124–33.
LibreCat: /record/13057

Kampmann, Matthias, and Sybille Hellebrand. Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, 2018.
LibreCat: /record/13072

Rezaeizadeh Rookerd, Ramin, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture.”https://doi.org/10.1145/3194554.3194599__In Proceedings of the 2018 on Great Lakes Symposium on VLSI. ACM, 2018.https://doi.org/10.1145/3194554.3194599 .
LibreCat: /record/29460
DOI: 10.1145/3194554.3194599

Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space Compaction to Faster-than-at-Speed Test.”https://doi.org/10.1109/ddecs.2018.00020__In 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits &; Systems (DDECS). Budapest, Hungary: IEEE, 2018.https://doi.org/10.1109/ddecs.2018.00020 .
LibreCat: /record/4575
DOI: 10.1109/ddecs.2018.00020

Liu, Chang, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.”https://doi.org/10.1109/ats.2018.00028__In 27th IEEE Asian Test Symposium (ATS’18), 2018.https://doi.org/10.1109/ats.2018.00028 .
LibreCat: /record/10575
DOI: 10.1109/ats.2018.00028

Sadeghi-Kohan, Somayeh, Arash Vafaei, and Zainalabedin Navabi. “Near-Optimal Node Selection Procedure for Aging Monitor Placement.”https://doi.org/10.1109/iolts.2018.8474120__In 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS). IEEE, 2018.https://doi.org/10.1109/iolts.2018.8474120 .
LibreCat: /record/29459
DOI: 10.1109/iolts.2018.8474120

Deshmukh, Jyotirmoy, Wolfgang Kunz, Hans-Joachim Wunderlich, and Sybille Hellebrand. “Special Session on Early Life Failures.”https://doi.org/10.1109/vts.2017.7928933__In 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE, 2017.https://doi.org/10.1109/vts.2017.7928933 .
LibreCat: /record/12973
DOI: 10.1109/vts.2017.7928933

Kampmann, Matthias, and Sybille Hellebrand. X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
LibreCat: /record/13078

Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant Compaction during Faster-than-at-Speed Test.”https://doi.org/10.1109/ddecs.2017.7934564__In 20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17). IEEE, 2017.https://doi.org/10.1109/ddecs.2017.7934564 .
LibreCat: /record/10576
DOI: 10.1109/ddecs.2017.7934564

Sadeghi-Kohan, Somayeh, Mehdi Kamal, and Zainalabedin Navabi. “Self-Adjusting Monitor for Measuring Aging Rate and Advancement.”https://doi.org/10.1109/tetc.2017.2771441__IEEE Transactions on Emerging Topics in Computing 8, no. 3 (2017): 627–41.https://doi.org/10.1109/tetc.2017.2771441 .
LibreCat: /record/29462
DOI: 10.1109/tetc.2017.2771441

Jenihhin, Maksim, Alexander Kamkin, Zainalabedin Navabi, and Somayeh Sadeghi-Kohan. “Universal Mitigation of NBTI-Induced Aging by Design Randomization.”https://doi.org/10.1109/ewdts.2016.7807635__In 2016 IEEE East-West Design &; Test Symposium (EWDTS). IEEE, 2017.https://doi.org/10.1109/ewdts.2016.7807635 .
LibreCat: /record/29463
DOI: 10.1109/ewdts.2016.7807635

Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.”https://doi.org/10.1109/ats.2016.20__In 25th IEEE Asian Test Symposium (ATS’16), 1–6. Hiroshima, Japan: IEEE, 2016.https://doi.org/10.1109/ats.2016.20 .
LibreCat: /record/12975
DOI: 10.1109/ats.2016.20

Kampmann, Matthias, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.”https://doi.org/10.1109/ats.2015.26__In 24th IEEE Asian Test Symposium (ATS’15), 109–14. Mumbai, India: IEEE, 2015.https://doi.org/10.1109/ats.2015.26 .
LibreCat: /record/12976
DOI: 10.1109/ats.2015.26

Huang, Zhengfeng, Huaguo Liang, and Sybille Hellebrand. “A High Performance SEU Tolerant Latch.” Journal of Electronic Testing - Theory and Applications (JETTA) 31, no. 4 (2015): 349–59.
LibreCat: /record/13056

Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael Kochte, Chang Liu, and Hans-Joachim Wunderlich. Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
LibreCat: /record/13077

Sadeghi-Kohan, Somayeh, Arezoo Kamran, Farnaz Forooghifar, and Zainalabedin Navabi. “Aging in Digital Circuits and Age Monitoring: Object-Oriented Modeling and Evaluation.”https://doi.org/10.1109/dtis.2015.7127373__In 2015 10th International Conference on Design &; Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE, 2015.https://doi.org/10.1109/dtis.2015.7127373 .
LibreCat: /record/29465
DOI: 10.1109/dtis.2015.7127373

Sadeghi-Kohan, Somayeh, Mehdi Kamal, John McNeil, Paolo Prinetto, and Zain Navabi. “Online Self Adjusting Progressive Age Monitoring of Timing Variations.”https://doi.org/10.1109/dtis.2015.7127368__In 2015 10th International Conference on Design &; Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE, 2015.https://doi.org/10.1109/dtis.2015.7127368 .
LibreCat: /record/29466
DOI: 10.1109/dtis.2015.7127368

Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, and Hans-Joachim Wunderlich. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.”https://doi.org/10.1109/test.2014.7035360__In IEEE International Test Conference (ITC’14). Seattle, Washington, USA: IEEE, 2014.https://doi.org/10.1109/test.2014.7035360 .
LibreCat: /record/12977
DOI: 10.1109/test.2014.7035360

Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” DeGruyter Journal on Information Technology (It) 56, no. 4 (2014): 165–72.
LibreCat: /record/13054

Rodriguez Gomez, Laura, Alejandro Cook, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Adaptive Bayesian Diagnosis of Intermittent Faults.” Journal of Electronic Testing - Theory and Applications (JETTA) 30, no. 5 (2014): 527–40.
LibreCat: /record/13055

Alizadeh, Bijan, Payman Behnam, and Somayeh Sadeghi-Kohan. “A Scalable Formal Debugging Approach with Auto-Correction Capability Based on Static Slicing and Dynamic Ranking for RTL Datapath Designs.”https://doi.org/10.1109/tc.2014.2329687__IEEE Transactions on Computers, 2014, 1–1.https://doi.org/10.1109/tc.2014.2329687 .
LibreCat: /record/46266
DOI: 10.1109/tc.2014.2329687

Mohammadi, Marzieh, Somayeh Sadeghi-Kohan, Nasser Masoumi, and Zainalabedin Navabi. “An Off-Line MDSI Interconnect BIST Incorporated in BS 1149.1.”https://doi.org/10.1109/ets.2014.6847847__In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014.https://doi.org/10.1109/ets.2014.6847847 .
LibreCat: /record/46268
DOI: 10.1109/ets.2014.6847847

Sadeghi-Kohan, Somayeh, Payman Behnam, Bijan Alizadeh, Masahiro Fujita, and Zainalabedin Navabi. “Improving Polynomial Datapath Debugging with HEDs.”https://doi.org/10.1109/ets.2014.6847797__In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014.https://doi.org/10.1109/ets.2014.6847797 .
LibreCat: /record/46267
DOI: 10.1109/ets.2014.6847797

Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.”https://doi.org/10.1109/latw.2013.6562662__In 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina: IEEE, 2013.https://doi.org/10.1109/latw.2013.6562662 .
LibreCat: /record/12979
DOI: 10.1109/latw.2013.6562662

Cook, Alejandro, Laura Rodriguez Gomez, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.
LibreCat: /record/13075

Sadeghi-Kohan, Somayeh, Majid Namaki-Shoushtari, Fatemeh Javaheri, and Zainalabedin Navabi. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.”https://doi.org/10.1109/test.2012.6401583__In 2012 IEEE International Test Conference. IEEE, 2013.https://doi.org/10.1109/test.2012.6401583 .
LibreCat: /record/46271
DOI: 10.1109/test.2012.6401583

Sadeghi-Kohan, Somayeh, Shahrzad Keshavarz, Farzaneh Zokaee, Farimah Farahmandi, and Zainalabedin Navabi. “A New Structure for Interconnect Offline Testing.”https://doi.org/10.1109/ewdts.2013.6673207__In East-West Design &;amp; Test Symposium (EWDTS 2013). IEEE, 2013.https://doi.org/10.1109/ewdts.2013.6673207 .
LibreCat: /record/46270
DOI: 10.1109/ewdts.2013.6673207