@inproceedingsWuertenberger_S. Tautermann_Hellebrand_2004, place=Charlotte, NC, USA, title=Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, DOI=10.1109/test.2004.1387357, booktitle=IEEE International Test Conference (ITC’04), publisher=IEEE, author=Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille, year=2004, pages=926–935 
LibreCat: /record/13001
DOI: 10.1109/test.2004.1387357

@bookBreu_Hellebrand_Welzl_2003, place=Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia, title=Experiences from Teaching Software Development in a Java Environment, author=Breu, Ruth and Hellebrand, Sybille and Welzl, Michael, year=2003 
LibreCat: /record/13098

@inproceedingsWuertenberger_S. Tautermann_Hellebrand_2003, place=Charlotte, NC, USA, title=A Hybrid Coding Strategy for Optimized Test Data Compression, DOI=10.1109/test.2003.1270870, booktitle=IEEE International Test Conference (ITC’03), publisher=IEEE, author=Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille, year=2003, pages=451–459 
LibreCat: /record/13002
DOI: 10.1109/test.2003.1270870

@bookHellebrand_Wuertenberger_2002, place=IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, title=Alternating Run-Length Coding: A Technique for Improved Test Data Compression, author=Hellebrand, Sybille and Wuertenberger, Armin, year=2002 
LibreCat: /record/13097

@articleHellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_2002, title=Efficient Online and Offline Testing of Embedded DRAMs, volume=51, DOI=10.1109/tc.2002.1017700, number=7, journal=IEEE Transactions on Computers, publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav, year=2002, pages=801–809 
LibreCat: /record/13003
DOI: 10.1109/tc.2002.1017700

@articleHellebrand_Liang_Wunderlich_2002, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, volume=18, number=2, journal=Journal of Electronic Testing - Theory and Applications (JETTA), author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2002, pages=157–168 
LibreCat: /record/13069

@articleLiang_Hellebrand_Wunderlich_2002, title=A Mixed-Mode BIST Scheme Based on Folding Compression, volume=17, number=2, journal=Journal on Computer Science and Technology, author=Liang, Huaguo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2002, pages=203–212 
LibreCat: /record/13070

@bookLiang_Hellebrand_Wunderlich_2001, place=IEEE European Test Workshop, Stockholm, Sweden, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001 
LibreCat: /record/13096

@inproceedingsLiang_Hellebrand_Wunderlich_2001, place=Baltimore, MD, USA, title=Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, DOI=10.1109/test.2001.966712, booktitle=IEEE International Test Conference (ITC’01), publisher=IEEE, author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001, pages=894–902 
LibreCat: /record/13004
DOI: 10.1109/test.2001.966712

@articleLiang_Hellebrand_Wunderlich_2001, title=Deterministic BIST Scheme Based on Reseeding of Folding Counters, volume=38, number=8, journal=Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan), author=Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2001, pages=931 
LibreCat: /record/13047

@articleHellebrand_Liang_Wunderlich_2001, title=A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters, volume=17, number=3/4, journal=Journal of Electronic Testing - Theory and Applications (JETTA), author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2001, pages=341–349 
LibreCat: /record/13068

@bookHellebrand_Wunderlich_2000, place=Handbuch Lehre, Berlin, Raabe Verlag, title=Hardwarepraktikum im Diplomstudiengang Informatik, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2000 
LibreCat: /record/13094

@bookHellebrand_Liang_Wunderlich_2000, place=IEEE European Test Workshop, Cascais, Portugal, title=A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters, author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2000 
LibreCat: /record/13095

@inproceedingsHellebrand_Liang_Wunderlich_2000, place=Atlantic City, NJ, USA, title=A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters, DOI=10.1109/test.2000.894274, booktitle=IEEE International Test Conference (ITC’00), publisher=IEEE, author=Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim, year=2000, pages=778–784 
LibreCat: /record/13005
DOI: 10.1109/test.2000.894274

@bookHellebrand_1999, place=Verlag Dr. Kovac, Hamburg, series=10, title=Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren, publisher=Verlag Dr. Kovac, Hamburg, author=Hellebrand, Sybille, year=1999, collection=10 
LibreCat: /record/13065

@bookHellebrand_Wunderlich_N. Yarmolik_1999, place=11th GI/ITG/GMM/IEEE Workshop, title=Exploiting Symmetries to Speed Up Transparent BIST, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav, year=1999 
LibreCat: /record/13093

@inproceedingsHellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_1999, place=Dana Point, CA, USA, title=Error Detecting Refreshment for Embedded DRAMs, DOI=10.1109/vtest.1999.766693, booktitle=17th IEEE VLSI Test Symposium (VTS’99), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav, year=1999, pages=384–390 
LibreCat: /record/13006
DOI: 10.1109/vtest.1999.766693

@inproceedingsN. Yarmolik_V. Bykov_Hellebrand_Wunderlich_1999, place=Prague, Czech Republic, title=Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms, booktitle=Third European Dependable Computing Conference (EDCC-3), author=N. Yarmolik, Vyacheslav and V. Bykov, Iuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1999 
LibreCat: /record/13066

@inproceedingsHellebrand_Wunderlich_N. Yarmolik_1999, place=Munich, Germany, title=Symmetric Transparent BIST for RAMs, booktitle=Design Automation and Test in Europe (DATE’99), author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav, year=1999, pages=702–707 
LibreCat: /record/13067

@bookHellebrand_Wunderlich_1998, place=Universität Stuttgart, title=Test und Synthese schneller eingebetteter Systeme, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998 
LibreCat: /record/13029

@bookN. Yarmolik_Hellebrand_Wunderlich_1998, place=5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, title=Efficient Consistency Checking for Embedded Memories, author=N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998 
LibreCat: /record/13091

@bookN. Yarmolik_Hellebrand_Wunderlich_1998, place=10th GI/ITG/GMM/IEEE Workshop, title=Efficient Consistency Checking for Embedded Memories, author=N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998 
LibreCat: /record/13092

@inbookHellebrand_Wunderlich_Hertwig_1998, place=In: M. Nicolaidis, Y. Zorian, D. K. Pradhan (Eds.): On-Line Testing for VLSI, Boston: Kluwer Academic Publishers 1998, series=5, title=Mixed-Mode BIST Using Embedded Processors, booktitle=Mixed-Mode BIST Using Embedded Processors, publisher=Kluwer Academic Publishers, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1998, collection=5 
LibreCat: /record/13060

@articleHellebrand_Wunderlich_Hertwig_1998, title=Mixed-Mode BIST Using Embedded Processors, volume=12, number=1/2, journal=Journal of Electronic Testing Theory and Applications - JETTA, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1998, pages=127–138 
LibreCat: /record/13061

@articleHellebrand_Hertwig_Wunderlich_1998, title=Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications, volume=15, number=4, journal=IEEE Design and Test, publisher=IEEE, author=Hellebrand, Sybille and Hertwig, Andre and Wunderlich, Hans-Joachim, year=1998, pages=36–41 
LibreCat: /record/13064

@inproceedingsHertwig_Hellebrand_Wunderlich_1998, place=Monterey, CA, USA, title=Fast Self-Recovering Controllers, DOI=10.1109/vtest.1998.670883, booktitle=16th IEEE VLSI Test Symposium (VTS’98), publisher=IEEE, author=Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998, pages=296–302 
LibreCat: /record/13007
DOI: 10.1109/vtest.1998.670883

@inproceedingsHellebrand_Wunderlich_N. Yarmolik_1998, place=Paris, France, title=Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs, DOI=10.1109/date.1998.655853, booktitle=Design Automation and Test in Europe (DATE’98), author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav, year=1998, pages=173–179 
LibreCat: /record/13008
DOI: 10.1109/date.1998.655853

@inproceedingsN. Yarmolik_V. Klimets_Hellebrand_Wunderlich_1998, place=Szczyrk, Poland, title=New Transparent RAM BIST Based on Self-Adjusting Output Data Compression, booktitle=Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’98), author=N. Yarmolik, Vyacheslav and V. Klimets, Yuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998, pages=27–33 
LibreCat: /record/13063

@bookTsai_Hellebrand_Rajski_Marek-Sadowska_1997, place=4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, title=STARBIST: Scan Autocorrelated Random Pattern Generation, author=Tsai, Kun-Han and Hellebrand, Sybille and Rajski, Janusz and Marek-Sadowska, Malgorzata, year=1997 
LibreCat: /record/13089

@bookHertwig_Hellebrand_Wunderlich_1997, place=3rd IEEE International On-Line Testing Workshop, Crete, Greece, title=Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications, author=Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1997 
LibreCat: /record/13090

@inproceedingsTsai_Hellebrand_Marek-Sadowska_Rajski_1997, place=Anaheim, CA, USA, title=STARBIST: Scan Autocorrelated Random Pattern Generation, DOI=10.1109/dac.1997.597194, booktitle=34th ACM/IEEE Design Automation Conference (DAC’97), publisher=IEEE, author=Tsai, Kun-Han and Hellebrand, Sybille and Marek-Sadowska, Malgorzata and Rajski, Janusz, year=1997 
LibreCat: /record/13009
DOI: 10.1109/dac.1997.597194

@bookHellebrand_Wunderlich_1996, place=3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA, title=Using Embedded Processors for BIST, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1996 
LibreCat: /record/13087

@bookHellebrand_Wunderlich_Hertwig_1996, place=2nd IEEE International On-Line Testing Workshop. Biarritz, France, title=Mixed-Mode BIST Using Embedded Processors, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1996 
LibreCat: /record/13088

@inproceedingsHellebrand_Wunderlich_Hertwig_1996, place=Washington, DC, USA, title=Mixed-Mode BIST Using Embedded Processors, DOI=10.1109/test.1996.556962, booktitle=IEEE International Test Conference (ITC’96), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1996, pages=195–204 
LibreCat: /record/13010
DOI: 10.1109/test.1996.556962

@bookHellebrand_Wunderlich_1995, place=University of Siegen, Germany, title=Synthesis Procedures for Self-Testable Controllers, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1995 
LibreCat: /record/13026

@bookHellebrand_Wunderlich_Goncalves_Paulo Teixeira_1995, place=University Siegen, Germany, title=Evaluation of Self-Testable Controller Architectures Based on Realistic Fault Analysis, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Goncalves, F. and Paulo Teixeira, Joao, year=1995 
LibreCat: /record/13027

@bookHellebrand_Herzog_Wunderlich_1995, place=University of Siegen, Germany, title=Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing, author=Hellebrand, Sybille and Herzog, Maik and Wunderlich, Hans-Joachim, year=1995 
LibreCat: /record/13028

@bookHellebrand_Reeb_Tarnick_Wunderlich_1995, place=2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, title=Pattern Generation for a Deterministic BIST Scheme, author=Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim, year=1995 
LibreCat: /record/13086

@articleHellebrand_Rajski_Tarnick_Venkataraman_Courtois_1995, title=Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers, volume=44, DOI=10.1109/12.364534, number=2, journal=IEEE Transactions on Computers, publisher=IEEE, author=Hellebrand, Sybille and Rajski, Janusz and Tarnick, Steffen and Venkataraman, Srikanth and Courtois, B., year=1995, pages=223–233 
LibreCat: /record/13011
DOI: 10.1109/12.364534

@inproceedingsHellebrand_Reeb_Tarnick_Wunderlich_1995, place=San Jose, CA, USA, title=Pattern Generation for a Deterministic BIST Scheme, DOI=10.1109/iccad.1995.479997, booktitle=ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), publisher=IEEE, author=Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim, year=1995, pages=88–94 
LibreCat: /record/13012
DOI: 10.1109/iccad.1995.479997

@bookHellebrand_Juergensen_Wunderlich_1994, place=University of Siegen, Germany, title=Synthesis for Off-line Testability, author=Hellebrand, Sybille and Juergensen, Arne and Wunderlich, Hans-Joachim, year=1994 
LibreCat: /record/13024

@bookHellebrand_Juergensen_Stroele_Wunderlich_1994, place=University of Siegen, Germany, title=Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time, author=Hellebrand, Sybille and Juergensen, Arne and Stroele, Albrecht and Wunderlich, Hans-Joachim, year=1994 
LibreCat: /record/13025

@bookVenkataraman_Rajski_Hellebrand_Tarnick_1994, place=6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, title=Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen, author=Venkataraman, Srikanth and Rajski, Janusz and Hellebrand, Sybille and Tarnick, Steffen, year=1994 
LibreCat: /record/13083

@bookHellebrand_Wunderlich_1994, place=6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, title=Ein Verfahren zur testfreundlichen Steuerwerkssynthese, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994 
LibreCat: /record/13084

@bookHellebrand_Paulo Teixeira_Wunderlich_1994, place=1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, title=Synthesis for Testability - the ARCHIMEDES Approach, author=Hellebrand, Sybille and Paulo Teixeira, Joao and Wunderlich, Hans-Joachim, year=1994 
LibreCat: /record/13085

@inproceedingsHellebrand_Wunderlich_1994, place=San Jose, CA, USA, title=An Efficient Procedure for the Synthesis of Fast Self-Testable Controller Structures, DOI=10.1109/iccad.1994.629752, booktitle=ACM/IEEE International Conference on Computer-Aided Design (ICCAD’94), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994, pages=110–116 
LibreCat: /record/13014
DOI: 10.1109/iccad.1994.629752

@inproceedingsHellebrand_Wunderlich_1994, place=Oberwiesenthal, Informatik Xpress 4, TU Chemnitz Zwickau, Germany, title=Synthese schneller selbsttestbarer Steuerwerke, booktitle=Tagungsband der GI/GME/ITG-Fachtagung \'26; Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994, pages=3–11 
LibreCat: /record/13059

@inproceedingsHellebrand_Wunderlich_1994, place=Paris, France, title=Synthesis of Self-Testable Controllers, DOI=10.1109/edtc.1994.326815, booktitle=European Design and Test Conference (EDAC/ETC/EUROASIC), author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994, pages=580–585 
LibreCat: /record/13013
DOI: 10.1109/edtc.1994.326815

@bookHellebrand_Tarnick_Rajski_Courtois_1993, place=5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany, title=Effiziente Erzeugung deterministischer Muster im Selbsttest, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1993 
LibreCat: /record/13081

@bookHellebrand_Wunderlich_1993, place=ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier, France, title=Synthesis of Self-Testable Controllers, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1993 
LibreCat: /record/13082