@inproceedingsCook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place=Quito, Ecuador, title=Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test, DOI=10.1109/latw.2012.6261229, booktitle=13th IEEE Latin American Test Workshop (LATW’12), publisher=IEEE, author=Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim, year=2012, pages=1–4 
LibreCat: /record/12980
DOI: 10.1109/latw.2012.6261229

@inproceedingsCook_Hellebrand_Wunderlich_2012, place=Annecy, France, title=Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test, DOI=10.1109/ets.2012.6233025, booktitle=17th IEEE European Test Symposium (ETS’12), publisher=IEEE, author=Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2012, pages=1–6 
LibreCat: /record/12981
DOI: 10.1109/ets.2012.6233025

@bookCook_Hellebrand_Wunderlich_2012, place=24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, title=Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern, author=Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2012 
LibreCat: /record/13074

@inproceedingsCook_Hellebrand_Indlekofer_Wunderlich_2011, place=New Delhi, India, title=Diagnostic Test of Robust Circuits, DOI=10.1109/ats.2011.55, booktitle=20th IEEE Asian Test Symposium (ATS’11), publisher=IEEE, author=Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim, year=2011, pages=285–290 
LibreCat: /record/12982
DOI: 10.1109/ats.2011.55

@inproceedingsPolian_Becker_Hellebrand_Wunderlich_Maxwell_2011, place=Trondheim, Norway, title=Towards Variation-Aware Test Methods, DOI=10.1109/ets.2011.51, booktitle=16th IEEE European Test Symposium Trondheim (ETS’11), publisher=IEEE, author=Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Maxwell, Peter, year=2011 
LibreCat: /record/12984
DOI: 10.1109/ets.2011.51

@inproceedingsCook_Hellebrand_Indlekofer_Wunderlich_2011, place=Hamburg, Germany, title=Robuster Selbsttest mit Diagnose, booktitle=5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf”, author=Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim, year=2011, pages=48–53 
LibreCat: /record/13053

@articleHopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2011, title=Variation-Aware Fault Modeling, volume=54, number=4, journal=SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer, author=Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2011, pages=1813–1826 
LibreCat: /record/13052

@inproceedingsKamran_Nemati_Sadeghi-Kohan_Navabi_2011, title=Virtual tester development using HDL/PLI, DOI=10.1109/ewdts.2010.5742156, booktitle=2010 East-West Design &;amp; Test Symposium (EWDTS), publisher=IEEE, author=Kamran, Arezoo and Nemati, Nastaran and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin, year=2011 
LibreCat: /record/46272
DOI: 10.1109/ewdts.2010.5742156

@bookFröse_Ibers_Hellebrand_2010, place=22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, title=Testdatenkompression mit Hilfe der Netzwerkinfrastruktur, author=Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille, year=2010 
LibreCat: /record/10670

@inproceedingsBecker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place=Chicago, IL, USA, title=Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits, DOI=10.1109/dsnw.2010.5542612, booktitle=40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), publisher=IEEE, author=Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2010 
LibreCat: /record/12987
DOI: 10.1109/dsnw.2010.5542612

@inproceedingsHunger_Hellebrand_2010, place=Wildbad Kreuth, Germany, title=Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz, booktitle=4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille, year=2010, pages=81–88 
LibreCat: /record/13051

@bookHellebrand_2010, place=Editorial, it 4/2010, pp. 179-180, title=Nano-Electronic Systems, author=Hellebrand, Sybille, year=2010 
LibreCat: /record/13073

@inproceedingsHopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place=Shanghai, China, title=Variation-Aware Fault Modeling, DOI=10.1109/ats.2010.24, booktitle=19th IEEE Asian Test Symposium (ATS’10), publisher=IEEE, author=Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2010, pages=87–93 
LibreCat: /record/12983
DOI: 10.1109/ats.2010.24

@inproceedingsIndlekofer_Schnittger_Hellebrand_2010, place=Amsterdam, The Netherlands, title=Efficient Test Response Compaction for Robust BIST Using Parity Sequences, DOI=10.1109/iccd.2010.5647648, booktitle=28th IEEE International Conference on Computer Design (ICCD’10), publisher=IEEE, author=Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille, year=2010, pages=480–485 
LibreCat: /record/12985
DOI: 10.1109/iccd.2010.5647648

@inproceedingsHunger_Hellebrand_2010, place=Kyoto, Japan, title=The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems, DOI=10.1109/dft.2010.19, booktitle=25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille, year=2010, pages=101–108 
LibreCat: /record/12986
DOI: 10.1109/dft.2010.19

@inproceedingsFroese_Ibers_Hellebrand_2010, place=Santa Cruz, CA, USA, title=Reusing NoC-Infrastructure for Test Data Compression, DOI=10.1109/vts.2010.5469570, booktitle=28th IEEE VLSI Test Symposium (VTS’10), publisher=IEEE, author=Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille, year=2010, pages=227–231 
LibreCat: /record/12988
DOI: 10.1109/vts.2010.5469570

@inproceedingsBecker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place=Chicago, IL, USA, title=Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits, booktitle=4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), author=Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2010 
LibreCat: /record/13049

@inproceedingsIndlekofer_Schnittger_Hellebrand_2010, place=Wildbad Kreuth, Germany, title=Robuster Selbsttest mit extremer Kompaktierung, booktitle=4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille, year=2010, pages=17–24 
LibreCat: /record/13050

@inproceedingsHunger_Hellebrand_Czutro_Polian_Becker_2009, place=Sesimbra-Lisbon, Portugal, title=ATPG-Based Grading of Strong Fault-Secureness, DOI=10.1109/iolts.2009.5196027, booktitle=15th IEEE International On-Line Testing Symposium (IOLTS’09, publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille and Czutro, Alejandro and Polian, Ilia and Becker, Bernd, year=2009 
LibreCat: /record/12991
DOI: 10.1109/iolts.2009.5196027

@inproceedingsHellebrand_Hunger_2009, place=Chicago, IL, USA, title=Are Robust Circuits Really Robust?, DOI=10.1109/dft.2009.28, booktitle=24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), publisher=IEEE, author=Hellebrand, Sybille and Hunger, Marc, year=2009, pages=77 
LibreCat: /record/12990
DOI: 10.1109/dft.2009.28

@inproceedingsHunger_Hellebrand_Czutro_Polian_Becker_2009, place=Stuttgart, Germany, title=Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung, booktitle=3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille and Czutro, Alexander and Polian, Ilia and Becker, Bernd, year=2009 
LibreCat: /record/13030

@bookCoym_Hellebrand_Ludwig_Straube_Wunderlich_G. Zoellin_2008, place=20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, title=Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit, author=Coym, Torsten and Hellebrand, Sybille and Ludwig, Stefan and Straube, Bernd and Wunderlich, Hans-Joachim and G. Zoellin, Christian, year=2008 
LibreCat: /record/13033

@bookAmgalan_Hachmann_Hellebrand_Wunderlich_2008, place=20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, title=Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen, author=Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2008 
LibreCat: /record/13035

@inproceedingsOehler_Bosio_di Natale_Hellebrand_2008, place=Rhodos, Greece, title=A Modular Memory BIST for Optimized Memory Repair, DOI=10.1109/iolts.2008.30, booktitle=14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster), publisher=IEEE, author=Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille, year=2008 
LibreCat: /record/12992
DOI: 10.1109/iolts.2008.30

@inproceedingsAmgalan_Hachmann_Hellebrand_Wunderlich_2008, place=San Diego, CA, USA, title=Signature Rollback - A Technique for Testing Robust Circuits, DOI=10.1109/vts.2008.34, booktitle=26th IEEE VLSI Test Symposium (VTS’08), publisher=IEEE, author=Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2008, pages=125–130 
LibreCat: /record/12994
DOI: 10.1109/vts.2008.34

@inproceedingsHunger_Hellebrand_2008, place=Rhodos, Greece, title=Verification and Analysis of Self-Checking Properties through ATPG, DOI=10.1109/iolts.2008.32, booktitle=14th IEEE International On-Line Testing Symposium (IOLTS’08), publisher=IEEE, author=Hunger, Marc and Hellebrand, Sybille, year=2008 
LibreCat: /record/12993
DOI: 10.1109/iolts.2008.32

@inproceedingsHunger_Hellebrand_2008, place=Ingolstadt, Germany, title=Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG, booktitle=2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Hunger, Marc and Hellebrand, Sybille, year=2008 
LibreCat: /record/13031

@inproceedingsOehler_Bosio_Di Natale_Hellebrand_2008, place=Ingolstadt, Germany, title=Modularer Selbsttest und optimierte Reparaturanalyse, booktitle=2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Oehler, Philipp and Bosio, Alberto and Di Natale, Giorgio and Hellebrand, Sybille, year=2008 
LibreCat: /record/13032

@bookHellebrand_2007, place=5th IEEE East-West Design \'26; Test Symposium, Yerevan, Armenia (Invited Talk), title=Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing, author=Hellebrand, Sybille, year=2007 
LibreCat: /record/13038

@bookAli_Welzl_Hessler_Hellebrand_2007, place=DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), title=An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips, author=Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille, year=2007 
LibreCat: /record/13039

@bookOehler_Hellebrand_Wunderlich_2007, place=17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, title=An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy, author=Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2007 
LibreCat: /record/13042

@bookHellebrand_2007, place=ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany, title=Qualitätssicherung für Nanochips - Wie IT-Produkte zuverlässig werden, author=Hellebrand, Sybille, year=2007 
LibreCat: /record/13043

@inproceedingsHellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place=Rome, Italy, title=A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction, DOI=10.1109/dft.2007.43, booktitle=22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), publisher=IEEE, author=Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd, year=2007, pages=50–58 
LibreCat: /record/12995
DOI: 10.1109/dft.2007.43

@inproceedingsOehler_Hellebrand_Wunderlich_2007, place=Krakow, Poland, title=Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair, DOI=10.1109/ddecs.2007.4295278, booktitle=10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), publisher=IEEE, author=Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2007, pages=185–190 
LibreCat: /record/12996
DOI: 10.1109/ddecs.2007.4295278

@inproceedingsOehler_Hellebrand_Wunderlich_2007, place=Freiburg, Germany, title=An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy, DOI=10.1109/ets.2007.10, booktitle=12th IEEE European Test Symposium (ETS’07), publisher=IEEE, author=Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2007, pages=91–96 
LibreCat: /record/12997
DOI: 10.1109/ets.2007.10

@inproceedingsHellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place=Bled, Slovenia, title=Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance, booktitle=43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), author=Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd, year=2007 
LibreCat: /record/13037

@articleHellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, title=Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance, volume=37, number=4 (124), journal=Informacije MIDEM, Ljubljana (Invited Paper), author=Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd, year=2007, pages=212–219 
LibreCat: /record/13036

@articleAli_Hessler_Welzl_Hellebrand_2007, title=An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip, volume=1, number=2, journal=International Journal on High Performance Systems Architecture, author=Ali, Muhammad and Hessler, Sven and Welzl, Michael and Hellebrand, Sybille, year=2007, pages=113–123 
LibreCat: /record/13044

@inproceedingsAli_Welzl_Hessler_Hellebrand_2007, place=Las Vegas, Nevada, USA, title=A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip, booktitle=4th International Conference on Information Technology: New Generations (ITNG’07), author=Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille, year=2007, pages=1027–1032 
LibreCat: /record/13040

@inproceedingsBecker_Polian_Hellebrand_Straube_Wunderlich_2007, place=Munich, Germany, title=Test und Zuverlässigkeit nanoelektronischer Systeme, booktitle=1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”, author=Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim, year=2007 
LibreCat: /record/13041

@articleBecker_Polian_Hellebrand_Straube_Wunderlich_2006, title=DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme, volume=48, number=5, journal=it - Information Technology, author=Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim, year=2006, pages=305–311 
LibreCat: /record/13045

@bookOehler_Hellebrand_2005, place=Kleinheubachertagung 2005, Miltenberg, Germany, title=A Low Power Design for Embedded DRAMs with Online Consistency Checking, author=Oehler, Philipp and Hellebrand, Sybille, year=2005 
LibreCat: /record/13046

@bookAli_Welzl_Hellebrand_2005, place=17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, title=Dynamic Routing: A Prerequisite for Reliable NoCs, author=Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille, year=2005 
LibreCat: /record/13101

@bookOehler_Hellebrand_2005, place=17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, title=Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study, author=Oehler, Philipp and Hellebrand, Sybille, year=2005 
LibreCat: /record/13102

@inproceedingsAli_Welzl_Zwicknagl_Hellebrand_2005, place=Islamabad, Pakistan, title=Considerations for Fault-Tolerant Networks on Chips, DOI=10.1109/icm.2005.1590063, booktitle=IEEE International Conference on Microelectronics (ICM’05), publisher=IEEE, author=Ali, Muhammad and Welzl, Michael and Zwicknagl, Martin and Hellebrand, Sybille, year=2005 
LibreCat: /record/12999
DOI: 10.1109/icm.2005.1590063

@inproceedingsOehler_Hellebrand_2005, place=Tallinn, Estonia, title=Low Power Embedded DRAMs with High Quality Error Correcting Capabilities, DOI=10.1109/ets.2005.28, booktitle=10th IEEE European Test Symposium (ETS’05), publisher=IEEE, author=Oehler, Philipp and Hellebrand, Sybille, year=2005, pages=148–153 
LibreCat: /record/13000
DOI: 10.1109/ets.2005.28

@inproceedingsAli_Welzl_Hellebrand_2005, place=Oulu, Finland, title=A Dynamic Routing Mechanism for Network on Chip, DOI=10.1109/norchp.2005.1596991, booktitle=23rd IEEE NORCHIP Conference, publisher=IEEE, author=Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille, year=2005, pages=70–73 
LibreCat: /record/12998
DOI: 10.1109/norchp.2005.1596991

@inproceedingsLiu Jing_Ruehrup_Schindelhauer_Volbert_Dierkes_Bellgardt_Ibers_Hilleringmann_2004, place=Tilburg, Netherlands, title=Sensor Networks with More Features Using Less Hardware, booktitle=GOR/NGB Conference Tilburg 2004, author=Liu Jing, Michelle and Ruehrup, Stefan and Schindelhauer, Christian and Volbert, Klaus and Dierkes, Martin and Bellgardt, Andreas and Ibers, Rüdiger and Hilleringmann, Ulrich, year=2004 
LibreCat: /record/13071

@bookBreu_Fahringer_Fensel_Hellebrand_Middeldorp_Scherzer_2004, place=OCG Journal, pp. 28-29, title=Im Westen viel Neues - Informatik an der Universität Innsbruck, author=Breu, Ruth and Fahringer, Thomas and Fensel, Dieter and Hellebrand, Sybille and Middeldorp, Aart and Scherzer, Otmar, year=2004 
LibreCat: /record/13099

@bookHellebrand_Wuertenberger_S. Tautermann_2004, place=9th IEEE European Test Symposium, Ajaccio, Corsica, France, title=Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, author=Hellebrand, Sybille and Wuertenberger, Armin and S. Tautermann, Christofer, year=2004 
LibreCat: /record/13100