Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.”https://doi.org/10.1109/latw.2012.6261229__In 13th IEEE Latin American Test Workshop (LATW’12), 1–4. Quito, Ecuador: IEEE, 2012.https://doi.org/10.1109/latw.2012.6261229 .
LibreCat: /record/12980
DOI: 10.1109/latw.2012.6261229

Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.”https://doi.org/10.1109/ets.2012.6233025__In 17th IEEE European Test Symposium (ETS’12), 1–6. Annecy, France: IEEE, 2012.https://doi.org/10.1109/ets.2012.6233025 .
LibreCat: /record/12981
DOI: 10.1109/ets.2012.6233025

Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.
LibreCat: /record/13074

Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.”https://doi.org/10.1109/ats.2011.55__In 20th IEEE Asian Test Symposium (ATS’11), 285–90. New Delhi, India: IEEE, 2011.https://doi.org/10.1109/ats.2011.55 .
LibreCat: /record/12982
DOI: 10.1109/ats.2011.55

Polian, Ilia, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, and Peter Maxwell. “Towards Variation-Aware Test Methods.”https://doi.org/10.1109/ets.2011.51__In 16th IEEE European Test Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE, 2011.https://doi.org/10.1109/ets.2011.51 .
LibreCat: /record/12984
DOI: 10.1109/ets.2011.51

Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Robuster Selbsttest Mit Diagnose.” In 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 48–53. Hamburg, Germany, 2011.
LibreCat: /record/13053

Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer 54, no. 4 (2011): 1813–26.
LibreCat: /record/13052

Kamran, Arezoo, Nastaran Nemati, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Virtual Tester Development Using HDL/PLI.”https://doi.org/10.1109/ewdts.2010.5742156__In 2010 East-West Design &;amp; Test Symposium (EWDTS). IEEE, 2011.https://doi.org/10.1109/ewdts.2010.5742156 .
LibreCat: /record/46272
DOI: 10.1109/ewdts.2010.5742156

Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.
LibreCat: /record/10670

Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.”https://doi.org/10.1109/dsnw.2010.5542612__In 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10). Chicago, IL, USA: IEEE, 2010.https://doi.org/10.1109/dsnw.2010.5542612 .
LibreCat: /record/12987
DOI: 10.1109/dsnw.2010.5542612

Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 81–88. Wildbad Kreuth, Germany, 2010.
LibreCat: /record/13051

Hellebrand, Sybille. Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180, 2010.
LibreCat: /record/13073

Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.”https://doi.org/10.1109/ats.2010.24__In 19th IEEE Asian Test Symposium (ATS’10), 87–93. Shanghai, China: IEEE, 2010.https://doi.org/10.1109/ats.2010.24 .
LibreCat: /record/12983
DOI: 10.1109/ats.2010.24

Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.”https://doi.org/10.1109/iccd.2010.5647648__In 28th IEEE International Conference on Computer Design (ICCD’10), 480–85. Amsterdam, The Netherlands: IEEE, 2010.https://doi.org/10.1109/iccd.2010.5647648 .
LibreCat: /record/12985
DOI: 10.1109/iccd.2010.5647648

Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.”https://doi.org/10.1109/dft.2010.19__In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 101–8. Kyoto, Japan: IEEE, 2010.https://doi.org/10.1109/dft.2010.19 .
LibreCat: /record/12986
DOI: 10.1109/dft.2010.19

Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure for Test Data Compression.”https://doi.org/10.1109/vts.2010.5469570__In 28th IEEE VLSI Test Symposium (VTS’10), 227–31. Santa Cruz, CA, USA: IEEE, 2010.https://doi.org/10.1109/vts.2010.5469570 .
LibreCat: /record/12988
DOI: 10.1109/vts.2010.5469570

Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper). Chicago, IL, USA, 2010.
LibreCat: /record/13049

Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Robuster Selbsttest Mit Extremer Kompaktierung.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 17–24. Wildbad Kreuth, Germany, 2010.
LibreCat: /record/13050

Hunger, Marc, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, and Bernd Becker. “ATPG-Based Grading of Strong Fault-Secureness.”https://doi.org/10.1109/iolts.2009.5196027__In 15th IEEE International On-Line Testing Symposium (IOLTS’09. Sesimbra-Lisbon, Portugal: IEEE, 2009.https://doi.org/10.1109/iolts.2009.5196027 .
LibreCat: /record/12991
DOI: 10.1109/iolts.2009.5196027

Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?”https://doi.org/10.1109/dft.2009.28__In 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 77. Chicago, IL, USA: IEEE, 2009.https://doi.org/10.1109/dft.2009.28 .
LibreCat: /record/12990
DOI: 10.1109/dft.2009.28

Hunger, Marc, Sybille Hellebrand, Alexander Czutro, Ilia Polian, and Bernd Becker. “Robustheitsanalyse Stark Fehlersicherer Schaltungen Mit SAT-Basierter Testmustererzeugung.” In 3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Stuttgart, Germany, 2009.
LibreCat: /record/13030

Coym, Torsten, Sybille Hellebrand, Stefan Ludwig, Bernd Straube, Hans-Joachim Wunderlich, and Christian G. Zoellin. Ein Verfeinertes Elektrisches Modell Für Teilchentreffer Und Dessen Auswirkung Auf Die Bewertung Der Schaltungsempfindlichkeit. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, 2008.
LibreCat: /record/13033

Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. Testen Mit Rücksetzpunkten - Ein Ansatz Zur Verbesserung Der Ausbeute Bei Robusten Schaltungen. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, 2008.
LibreCat: /record/13035

Oehler, Philipp, Alberto Bosio, Giorgio di Natale, and Sybille Hellebrand. “A Modular Memory BIST for Optimized Memory Repair.”https://doi.org/10.1109/iolts.2008.30__In 14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster). Rhodos, Greece: IEEE, 2008.https://doi.org/10.1109/iolts.2008.30 .
LibreCat: /record/12992
DOI: 10.1109/iolts.2008.30

Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Signature Rollback - A Technique for Testing Robust Circuits.”https://doi.org/10.1109/vts.2008.34__In 26th IEEE VLSI Test Symposium (VTS’08), 125–30. San Diego, CA, USA: IEEE, 2008.https://doi.org/10.1109/vts.2008.34 .
LibreCat: /record/12994
DOI: 10.1109/vts.2008.34

Hunger, Marc, and Sybille Hellebrand. “Verification and Analysis of Self-Checking Properties through ATPG.”https://doi.org/10.1109/iolts.2008.32__In 14th IEEE International On-Line Testing Symposium (IOLTS’08). Rhodos, Greece: IEEE, 2008.https://doi.org/10.1109/iolts.2008.32 .
LibreCat: /record/12993
DOI: 10.1109/iolts.2008.32

Hunger, Marc, and Sybille Hellebrand. “Analyse Selbstprüfender Schaltungen – Nachweis von Fehlersicherheit Und Selbsttestbarkeit Mit ATPG.” In 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Ingolstadt, Germany, 2008.
LibreCat: /record/13031

Oehler, Philipp, Alberto Bosio, Giorgio Di Natale, and Sybille Hellebrand. “Modularer Selbsttest Und Optimierte Reparaturanalyse.” In 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Ingolstadt, Germany, 2008.
LibreCat: /record/13032

Hellebrand, Sybille. Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing. 5th IEEE East-West Design \'26; Test Symposium, Yerevan, Armenia (Invited Talk), 2007.
LibreCat: /record/13038

Ali, Muhammad, Michael Welzl, Sven Hessler, and Sybille Hellebrand. An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips. DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), 2007.
LibreCat: /record/13039

Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007.
LibreCat: /record/13042

Hellebrand, Sybille. Qualitätssicherung Für Nanochips - Wie IT-Produkte Zuverlässig Werden. ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany, 2007.
LibreCat: /record/13043

Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.”https://doi.org/10.1109/dft.2007.43__In 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), 50–58. Rome, Italy: IEEE, 2007.https://doi.org/10.1109/dft.2007.43 .
LibreCat: /record/12995
DOI: 10.1109/dft.2007.43

Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair.”https://doi.org/10.1109/ddecs.2007.4295278__In 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), 185–90. Krakow, Poland: IEEE, 2007.https://doi.org/10.1109/ddecs.2007.4295278 .
LibreCat: /record/12996
DOI: 10.1109/ddecs.2007.4295278

Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy.”https://doi.org/10.1109/ets.2007.10__In 12th IEEE European Test Symposium (ETS’07), 91–96. Freiburg, Germany: IEEE, 2007.https://doi.org/10.1109/ets.2007.10 .
LibreCat: /record/12997
DOI: 10.1109/ets.2007.10

Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” In 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper). Bled, Slovenia, 2007.
LibreCat: /record/13037

Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” Informacije MIDEM, Ljubljana (Invited Paper) 37, no. 4 (124) (2007): 212–19.
LibreCat: /record/13036

Ali, Muhammad, Sven Hessler, Michael Welzl, and Sybille Hellebrand. “An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip.” International Journal on High Performance Systems Architecture 1, no. 2 (2007): 113–23.
LibreCat: /record/13044

Ali, Muhammad, Michael Welzl, Sven Hessler, and Sybille Hellebrand. “A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip.” In 4th International Conference on Information Technology: New Generations (ITNG’07), 1027–32. Las Vegas, Nevada, USA, 2007.
LibreCat: /record/13040

Becker, Bernd, Ilia Polian, Sybille Hellebrand, Bernd Straube, and Hans-Joachim Wunderlich. “Test Und Zuverlässigkeit Nanoelektronischer Systeme.” In 1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Munich, Germany, 2007.
LibreCat: /record/13041

Becker, Bernd, Ilia Polian, Sybille Hellebrand, Bernd Straube, and Hans-Joachim Wunderlich. “DFG-Projekt RealTest - Test Und Zuverlässigkeit Nanoelektronischer Systeme.” It - Information Technology 48, no. 5 (2006): 305–11.
LibreCat: /record/13045

Oehler, Philipp, and Sybille Hellebrand. A Low Power Design for Embedded DRAMs with Online Consistency Checking. Kleinheubachertagung 2005, Miltenberg, Germany, 2005.
LibreCat: /record/13046

Ali, Muhammad, Michael Welzl, and Sybille Hellebrand. Dynamic Routing: A Prerequisite for Reliable NoCs. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.
LibreCat: /record/13101

Oehler, Philipp, and Sybille Hellebrand. Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.
LibreCat: /record/13102

Ali, Muhammad, Michael Welzl, Martin Zwicknagl, and Sybille Hellebrand. “Considerations for Fault-Tolerant Networks on Chips.”https://doi.org/10.1109/icm.2005.1590063__In IEEE International Conference on Microelectronics (ICM’05). Islamabad, Pakistan: IEEE, 2005.https://doi.org/10.1109/icm.2005.1590063 .
LibreCat: /record/12999
DOI: 10.1109/icm.2005.1590063

Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.”https://doi.org/10.1109/ets.2005.28__In 10th IEEE European Test Symposium (ETS’05), 148–53. Tallinn, Estonia: IEEE, 2005.https://doi.org/10.1109/ets.2005.28 .
LibreCat: /record/13000
DOI: 10.1109/ets.2005.28

Ali, Muhammad, Michael Welzl, and Sybille Hellebrand. “A Dynamic Routing Mechanism for Network on Chip.”https://doi.org/10.1109/norchp.2005.1596991__In 23rd IEEE NORCHIP Conference, 70–73. Oulu, Finland: IEEE, 2005.https://doi.org/10.1109/norchp.2005.1596991 .
LibreCat: /record/12998
DOI: 10.1109/norchp.2005.1596991

Liu Jing, Michelle, Stefan Ruehrup, Christian Schindelhauer, Klaus Volbert, Martin Dierkes, Andreas Bellgardt, Rüdiger Ibers, and Ulrich Hilleringmann. “Sensor Networks with More Features Using Less Hardware.” In GOR/NGB Conference Tilburg 2004. Tilburg, Netherlands, 2004.
LibreCat: /record/13071

Breu, Ruth, Thomas Fahringer, Dieter Fensel, Sybille Hellebrand, Aart Middeldorp, and Otmar Scherzer. Im Westen Viel Neues - Informatik an Der Universität Innsbruck. OCG Journal, pp. 28-29, 2004.
LibreCat: /record/13099

Hellebrand, Sybille, Armin Wuertenberger, and Christofer S. Tautermann. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.
LibreCat: /record/13100