@bookN. Yarmolik_Hellebrand_Wunderlich_1998, place=5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, title=Efficient Consistency Checking for Embedded Memories, author=N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998 

@bookN. Yarmolik_Hellebrand_Wunderlich_1998, place=10th GI/ITG/GMM/IEEE Workshop, title=Efficient Consistency Checking for Embedded Memories, author=N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998 

@inbookHellebrand_Wunderlich_Hertwig_1998, place=In: M. Nicolaidis, Y. Zorian, D. K. Pradhan (Eds.): On-Line Testing for VLSI, Boston: Kluwer Academic Publishers 1998, series=5, title=Mixed-Mode BIST Using Embedded Processors, booktitle=Mixed-Mode BIST Using Embedded Processors, publisher=Kluwer Academic Publishers, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1998, collection=5 

@articleHellebrand_Wunderlich_Hertwig_1998, title=Mixed-Mode BIST Using Embedded Processors, volume=12, number=1/2, journal=Journal of Electronic Testing Theory and Applications - JETTA, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1998, pages=127–138 

@articleHellebrand_Hertwig_Wunderlich_1998, title=Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications, volume=15, number=4, journal=IEEE Design and Test, publisher=IEEE, author=Hellebrand, Sybille and Hertwig, Andre and Wunderlich, Hans-Joachim, year=1998, pages=36–41 

@inproceedingsHertwig_Hellebrand_Wunderlich_1998, place=Monterey, CA, USA, title=Fast Self-Recovering Controllers, DOI=10.1109/vtest.1998.670883, booktitle=16th IEEE VLSI Test Symposium (VTS’98), publisher=IEEE, author=Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998, pages=296–302 

@inproceedingsHellebrand_Wunderlich_N. Yarmolik_1998, place=Paris, France, title=Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs, DOI=10.1109/date.1998.655853, booktitle=Design Automation and Test in Europe (DATE’98), author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav, year=1998, pages=173–179 

@inproceedingsN. Yarmolik_V. Klimets_Hellebrand_Wunderlich_1998, place=Szczyrk, Poland, title=New Transparent RAM BIST Based on Self-Adjusting Output Data Compression, booktitle=Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’98), author=N. Yarmolik, Vyacheslav and V. Klimets, Yuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1998, pages=27–33 

@bookTsai_Hellebrand_Rajski_Marek-Sadowska_1997, place=4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, title=STARBIST: Scan Autocorrelated Random Pattern Generation, author=Tsai, Kun-Han and Hellebrand, Sybille and Rajski, Janusz and Marek-Sadowska, Malgorzata, year=1997 

@bookHertwig_Hellebrand_Wunderlich_1997, place=3rd IEEE International On-Line Testing Workshop, Crete, Greece, title=Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications, author=Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1997 

@inproceedingsTsai_Hellebrand_Marek-Sadowska_Rajski_1997, place=Anaheim, CA, USA, title=STARBIST: Scan Autocorrelated Random Pattern Generation, DOI=10.1109/dac.1997.597194, booktitle=34th ACM/IEEE Design Automation Conference (DAC’97), publisher=IEEE, author=Tsai, Kun-Han and Hellebrand, Sybille and Marek-Sadowska, Malgorzata and Rajski, Janusz, year=1997 

@bookHellebrand_Wunderlich_1996, place=3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA, title=Using Embedded Processors for BIST, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1996 

@bookHellebrand_Wunderlich_Hertwig_1996, place=2nd IEEE International On-Line Testing Workshop. Biarritz, France, title=Mixed-Mode BIST Using Embedded Processors, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1996 

@inproceedingsHellebrand_Wunderlich_Hertwig_1996, place=Washington, DC, USA, title=Mixed-Mode BIST Using Embedded Processors, DOI=10.1109/test.1996.556962, booktitle=IEEE International Test Conference (ITC’96), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre, year=1996, pages=195–204 

@bookHellebrand_Wunderlich_1995, place=University of Siegen, Germany, title=Synthesis Procedures for Self-Testable Controllers, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1995 

@bookHellebrand_Wunderlich_Goncalves_Paulo Teixeira_1995, place=University Siegen, Germany, title=Evaluation of Self-Testable Controller Architectures Based on Realistic Fault Analysis, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and Goncalves, F. and Paulo Teixeira, Joao, year=1995 

@bookHellebrand_Herzog_Wunderlich_1995, place=University of Siegen, Germany, title=Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing, author=Hellebrand, Sybille and Herzog, Maik and Wunderlich, Hans-Joachim, year=1995 

@bookHellebrand_Reeb_Tarnick_Wunderlich_1995, place=2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, title=Pattern Generation for a Deterministic BIST Scheme, author=Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim, year=1995 

@articleHellebrand_Rajski_Tarnick_Venkataraman_Courtois_1995, title=Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers, volume=44, DOI=10.1109/12.364534, number=2, journal=IEEE Transactions on Computers, publisher=IEEE, author=Hellebrand, Sybille and Rajski, Janusz and Tarnick, Steffen and Venkataraman, Srikanth and Courtois, B., year=1995, pages=223–233 

@inproceedingsHellebrand_Reeb_Tarnick_Wunderlich_1995, place=San Jose, CA, USA, title=Pattern Generation for a Deterministic BIST Scheme, DOI=10.1109/iccad.1995.479997, booktitle=ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), publisher=IEEE, author=Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim, year=1995, pages=88–94 

@bookHellebrand_Juergensen_Wunderlich_1994, place=University of Siegen, Germany, title=Synthesis for Off-line Testability, author=Hellebrand, Sybille and Juergensen, Arne and Wunderlich, Hans-Joachim, year=1994 

@bookHellebrand_Juergensen_Stroele_Wunderlich_1994, place=University of Siegen, Germany, title=Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time, author=Hellebrand, Sybille and Juergensen, Arne and Stroele, Albrecht and Wunderlich, Hans-Joachim, year=1994 

@bookVenkataraman_Rajski_Hellebrand_Tarnick_1994, place=6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, title=Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen, author=Venkataraman, Srikanth and Rajski, Janusz and Hellebrand, Sybille and Tarnick, Steffen, year=1994 

@bookHellebrand_Wunderlich_1994, place=6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, title=Ein Verfahren zur testfreundlichen Steuerwerkssynthese, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994 

@bookHellebrand_Paulo Teixeira_Wunderlich_1994, place=1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, title=Synthesis for Testability - the ARCHIMEDES Approach, author=Hellebrand, Sybille and Paulo Teixeira, Joao and Wunderlich, Hans-Joachim, year=1994 

@inproceedingsHellebrand_Wunderlich_1994, place=San Jose, CA, USA, title=An Efficient Procedure for the Synthesis of Fast Self-Testable Controller Structures, DOI=10.1109/iccad.1994.629752, booktitle=ACM/IEEE International Conference on Computer-Aided Design (ICCAD’94), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994, pages=110–116 

@inproceedingsHellebrand_Wunderlich_1994, place=Oberwiesenthal, Informatik Xpress 4, TU Chemnitz Zwickau, Germany, title=Synthese schneller selbsttestbarer Steuerwerke, booktitle=Tagungsband der GI/GME/ITG-Fachtagung \'26; Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994, pages=3–11 

@inproceedingsHellebrand_Wunderlich_1994, place=Paris, France, title=Synthesis of Self-Testable Controllers, DOI=10.1109/edtc.1994.326815, booktitle=European Design and Test Conference (EDAC/ETC/EUROASIC), author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1994, pages=580–585 

@bookHellebrand_Tarnick_Rajski_Courtois_1993, place=5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany, title=Effiziente Erzeugung deterministischer Muster im Selbsttest, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1993 

@bookHellebrand_Wunderlich_1993, place=ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier, France, title=Synthesis of Self-Testable Controllers, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1993 

@inproceedingsVenkataraman_Rajski_Hellebrand_Tarnick_1993, title=An Efficient Bist Scheme Based On Reseeding Of Multiple Polynomial Linear Feedback Shift Registers, DOI=10.1109/iccad.1993.580117, booktitle=ACM/IEEE International Conference on Computer Aided Design (ICCAD’93), publisher=IEEE, author=Venkataraman, Srikanth and Rajski, Janusz and Hellebrand, Sybille and Tarnick, Steffen, year=1993 

@bookHellebrand_Tarnick_Rajski_Courtois_1992, place=Institut National Polytechnique de Grenoble, Grenoble, France, title=Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1992 

@bookHellebrand_Tarnick_Rajski_Courtois_1992, place=IEEE Design for Testability Workshop, Vail, CO, USA, title=Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1992 

@bookHellebrand_Tarnick_Rajski_Courtois_1992, place=Workshop on New Directions for Testing, Montreal, Canada, title=Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1992 

@articleWunderlich_Hellebrand_1992, title=The Pseudoexhaustive Test of Sequential Circuits, volume=11, DOI=10.1109/43.108616, number=1, journal=IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Wunderlich, Hans-Joachim and Hellebrand, Sybille, year=1992, pages=26–33 

@inproceedingsHellebrand_Tarnick_Rajski_Courtois_1992, place=Baltimore, MD, USA, title=Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers, DOI=10.1109/test.1992.527812, booktitle=IEEE International Test Conference (ITC’92), publisher=IEEE, author=Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard, year=1992, pages=120–129 

@bookHellebrand_1991, place=Verlag Düsseldorf: VDI Verlag, series=10, title=Synthese vollständig testbarer Schaltungen, publisher=Verlag Düsseldorf: VDI Verlag, author=Hellebrand, Sybille, year=1991, collection=10 

@bookHellebrand_Wunderlich_F. Haberl_1990, place=IEEE Design for Testability Workshop, Vail, CO, USA, title=Generating Pseudo-Exhaustive Vectors for External Testing, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver, year=1990 

@inproceedingsHellebrand_Wunderlich_1990, place=Glasgow, UK, title=Tools and Devices Supporting the Pseudo-Exhaustive Test, DOI=10.1109/edac.1990.136612, booktitle=European Design Automation Conference (EDAC’90), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1990, pages=13–17 

@inproceedingsHellebrand_Wunderlich_F. Haberl_1990, place=Washington, DC, USA, title=Generating Pseudo-Exhaustive Vectors for External Testing, DOI=10.1109/test.1990.114082, booktitle=IEEE International Test Conference (ITC’90), publisher=IEEE, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver, year=1990, pages=670–679 

@inproceedingsWunderlich_Hellebrand_1989, place=Washington, DC, USA, title=The Pseudo-Exhaustive Test of Sequential Circuits, DOI=10.1109/test.1989.82273, booktitle=IEEE International Test Conference (ITC’89), publisher=IEEE, author=Wunderlich, Hans-Joachim and Hellebrand, Sybille, year=1989, pages=19–27 

@inproceedingsWunderlich_Hellebrand_1988, place=Tokyo, Japan, title=Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits, DOI=10.1109/ftcs.1988.5294, booktitle=18th International Symposium on Fault-Tolerant Computing, FTCS-18, author=Wunderlich, Hans-Joachim and Hellebrand, Sybille, year=1988, pages=36–45 

@inproceedingsSchmid_Wunderlich_Feldbusch_Hellebrand_Holzinger_Kunzmann_1988, place=Amsterdam, The Netherlands, title=Integrated Tools for Automatic Design for Testability, booktitle=Tool Integration and Design Environments, F.J. Rammig (Editor), publisher=Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP, author=Schmid, Detlef and Wunderlich, Hans-Joachim and Feldbusch, Fridtjof and Hellebrand, Sybille and Holzinger, Juergen and Kunzmann, Arno, year=1988, pages=233–258 

@inproceedingsHellebrand_Wunderlich_1988, place=Hamburg, Germany, title=Automatisierung des Entwurfs vollständig testbarer Schaltungen, booktitle=GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188, publisher=Springer Verlag, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=1988, pages=145–159 

@bookHellebrand_1986, place=Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany, title=Deformation dicker Punkte und Netze von Quadriken, author=Hellebrand, Sybille, year=1986