@inproceedingsJafarzadeh_Klemme_Reimer_Najafi Haghi _Amrouch_Hellebrand _Wunderlich_2023, place=Anaheim, CA, USA, title=Robust Pattern Generation for Small Delay Faults under Process Variations, booktitle=IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023, publisher=IEEE, author=Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria and  Amrouch, Hussam and Hellebrand, Sybille and  Wunderlich, Hans-Joachim, year=2023 
LibreCat: /record/45830

@articleSadeghi-Kohan_Hellebrand_Wunderlich_2022, title=Stress-Aware Periodic Test of Interconnects, DOI=10.1007/s10836-021-05979-5, journal=Journal of Electronic Testing, publisher=Springer Science and Business Media LLC, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2022 
LibreCat: /record/29351
DOI: 10.1007/s10836-021-05979-5

@bookSadeghi-Kohan_Hellebrand_Wunderlich_2022, place=Online, title=EM-Aware Interconnect BIST, publisher=European Workshop on Silicon Lifecycle Management, March 18, 2022, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2022 
LibreCat: /record/29890

@inproceedingsSprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place=Virtual Conference - Originally Frascati (Rome), Italy, title=Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study, booktitle=IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, author=Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille, year=2020 
LibreCat: /record/19422

@bookSadeghi-Kohan_Hellebrand_2020, place=Ludwigsburg, title=Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, publisher=32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2020 
LibreCat: /record/15419

@inproceedingsSadeghi-Kohan_Hellebrand_2020, place=Virtual Conference - Originally San Diego, CA, USA, title=Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, DOI=10.1109/vts48691.2020.9107591, booktitle=38th IEEE VLSI Test Symposium (VTS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2020 
LibreCat: /record/29200
DOI: 10.1109/vts48691.2020.9107591

@inproceedingsHolst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020, place=Virtual Conference - Originally Washington, DC, USA, title=Logic Fault Diagnosis of Hidden Delay Defects, booktitle=IEEE International Test Conference (ITC’20), November 2020, author=Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing, year=2020 
LibreCat: /record/19421

@bookMaaz_Sprenger_Hellebrand_2019, place=Prien am Chiemsee, title=A Hybrid Space Compactor for Varying X-Rates, publisher=31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), author=Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille, year=2019 
LibreCat: /record/8112

@articleSprenger_Hellebrand_2019, title=Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test, volume=28, DOI=10.1142/s0218126619400012, number=1, journal=Journal of Circuits, Systems and Computers, publisher=World Scientific Publishing Company, author=Sprenger, Alexander and Hellebrand, Sybille, year=2019, pages=1–23 
LibreCat: /record/8667
DOI: 10.1142/s0218126619400012

@articleKampmann_A. Kochte_Liu_Schneider_Hellebrand_Wunderlich_2019, title=Built-in Test for Hidden Delay Faults, volume=38, number=10, journal=IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), publisher=IEEE, author=Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider, Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2019, pages=1956–1968 
LibreCat: /record/13048

@inproceedingsMaaz_Sprenger_Hellebrand_2019, place=Washington, DC, USA, title=A Hybrid Space Compactor for Adaptive X-Handling, booktitle=50th IEEE International Test Conference (ITC), publisher=IEEE, author=Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille, year=2019, pages=1–8 
LibreCat: /record/12918

@bookSprenger_Hellebrand_2018, place=Freiburg, Germany, title=Stochastische Kompaktierung für den Hochgeschwindigkeitstest, publisher=30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), author=Sprenger, Alexander and Hellebrand, Sybille, year=2018 
LibreCat: /record/4576

@articleHellebrand_Henkel_Raghunathan_Wunderlich_2018, title=Guest Editors’ Introduction - Special Issue on Approximate Computing, volume=10, DOI=10.1109/les.2018.2789942, number=1, journal=IEEE Embedded Systems Letters, publisher=IEEE, author=Hellebrand, Sybille and Henkel, Joerg and Raghunathan, Anand and Wunderlich, Hans-Joachim, year=2018, pages=1–1 
LibreCat: /record/12974
DOI: 10.1109/les.2018.2789942

@articleKampmann_Hellebrand_2018, title=Design For Small Delay Test - A Simulation Study, volume=80, journal=Microelectronics Reliability, author=Kampmann, Matthias and Hellebrand, Sybille, year=2018, pages=124–133 
LibreCat: /record/13057

@bookKampmann_Hellebrand_2018, place=19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, title=Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test, author=Kampmann, Matthias and Hellebrand, Sybille, year=2018 
LibreCat: /record/13072

@inproceedingsRezaeizadeh Rookerd_Sadeghi-Kohan_Navabi_2018, title=Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture, DOI=10.1145/3194554.3194599, booktitle=Proceedings of the 2018 on Great Lakes Symposium on VLSI, publisher=ACM, author=Rezaeizadeh Rookerd, Ramin and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin, year=2018 
LibreCat: /record/29460
DOI: 10.1145/3194554.3194599

@inproceedingsSprenger_Hellebrand_2018, place=Budapest, Hungary, title=Tuning Stochastic Space Compaction to Faster-than-at-Speed Test, DOI=10.1109/ddecs.2018.00020, booktitle=2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits &; Systems (DDECS), publisher=IEEE, author=Sprenger, Alexander and Hellebrand, Sybille, year=2018 
LibreCat: /record/4575
DOI: 10.1109/ddecs.2018.00020

@inproceedingsLiu_Schneider_Kampmann_Hellebrand_Wunderlich_2018, title=Extending Aging Monitors for Early Life and Wear-Out Failure Prevention, DOI=10.1109/ats.2018.00028, booktitle=27th IEEE Asian Test Symposium (ATS’18), author=Liu, Chang and Schneider, Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2018 
LibreCat: /record/10575
DOI: 10.1109/ats.2018.00028

@inproceedingsSadeghi-Kohan_Vafaei_Navabi_2018, title=Near-Optimal Node Selection Procedure for Aging Monitor Placement, DOI=10.1109/iolts.2018.8474120, booktitle=2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Vafaei, Arash and Navabi, Zainalabedin, year=2018 
LibreCat: /record/29459
DOI: 10.1109/iolts.2018.8474120

@inproceedingsDeshmukh_Kunz_Wunderlich_Hellebrand_2017, place=Caesars Palace, Las Vegas, Nevada, USA, title=Special Session on Early Life Failures, DOI=10.1109/vts.2017.7928933, booktitle=35th IEEE VLSI Test Symposium (VTS’17), publisher=IEEE, author=Deshmukh, Jyotirmoy and Kunz, Wolfgang and Wunderlich, Hans-Joachim and Hellebrand, Sybille, year=2017 
LibreCat: /record/12973
DOI: 10.1109/vts.2017.7928933