An Efficient Bist Scheme Based On Reseeding Of Multiple Polynomial Linear Feedback Shift Registers
S. Venkataraman, J. Rajski, S. Hellebrand, S. Tarnick, in: ACM/IEEE International Conference on Computer Aided Design (ICCAD’93), IEEE, 1993.
LibreCat: /record/13015
DOI: 10.1109/iccad.1993.580117

Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, Institut National Polytechnique de Grenoble, Grenoble, France, 1992.
LibreCat: /record/13023

Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, IEEE Design for Testability Workshop, Vail, CO, USA, 1992.
LibreCat: /record/13076

Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, Workshop on New Directions for Testing, Montreal, Canada, 1992.
LibreCat: /record/13080

The Pseudoexhaustive Test of Sequential Circuits
H.-J. Wunderlich, S. Hellebrand, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 11 (1992) 26–33.
LibreCat: /record/13017
DOI: 10.1109/43.108616

Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, in: IEEE International Test Conference (ITC’92), IEEE, Baltimore, MD, USA, 1992, pp. 120–129.
LibreCat: /record/13016
DOI: 10.1109/test.1992.527812

Synthese vollständig testbarer Schaltungen
S. Hellebrand, Synthese Vollständig Testbarer Schaltungen, Verlag Düsseldorf: VDI Verlag, Verlag Düsseldorf: VDI Verlag, 1991.
LibreCat: /record/13034

Generating Pseudo-Exhaustive Vectors for External Testing
S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, Generating Pseudo-Exhaustive Vectors for External Testing, IEEE Design for Testability Workshop, Vail, CO, USA, 1990.
LibreCat: /record/13103

Tools and Devices Supporting the Pseudo-Exhaustive Test
S. Hellebrand, H.-J. Wunderlich, in: European Design Automation Conference (EDAC’90), IEEE, Glasgow, UK, 1990, pp. 13–17.
LibreCat: /record/13018
DOI: 10.1109/edac.1990.136612

Generating Pseudo-Exhaustive Vectors for External Testing
S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, in: IEEE International Test Conference (ITC’90), IEEE, Washington, DC, USA, 1990, pp. 670–679.
LibreCat: /record/13019
DOI: 10.1109/test.1990.114082

The Pseudo-Exhaustive Test of Sequential Circuits
H.-J. Wunderlich, S. Hellebrand, in: IEEE International Test Conference (ITC’89), IEEE, Washington, DC, USA, 1989, pp. 19–27.
LibreCat: /record/13020
DOI: 10.1109/test.1989.82273

Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits
H.-J. Wunderlich, S. Hellebrand, in: 18th International Symposium on Fault-Tolerant Computing, FTCS-18, Tokyo, Japan, 1988, pp. 36–45.
LibreCat: /record/13021
DOI: 10.1109/ftcs.1988.5294

Integrated Tools for Automatic Design for Testability
D. Schmid, H.-J. Wunderlich, F. Feldbusch, S. Hellebrand, J. Holzinger, A. Kunzmann, in: Tool Integration and Design Environments, F.J. Rammig (Editor), Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP, Amsterdam, The Netherlands, 1988, pp. 233–258.
LibreCat: /record/13058

Automatisierung des Entwurfs vollständig testbarer Schaltungen
S. Hellebrand, H.-J. Wunderlich, in: GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188, Springer Verlag, Hamburg, Germany, 1988, pp. 145–159.
LibreCat: /record/13062

Deformation dicker Punkte und Netze von Quadriken
S. Hellebrand, Deformation Dicker Punkte Und Netze von Quadriken, Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany, 1986.
LibreCat: /record/13022