@inproceedingsHellebrand_Indlekofer_Kampmann_A. Kochte_Liu_Wunderlich_2014, place=Seattle, Washington, USA, title=FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects, DOI=10.1109/test.2014.7035360, booktitle=IEEE International Test Conference (ITC’14), publisher=IEEE, author=Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim, year=2014 
LibreCat: /record/12977
DOI: 10.1109/test.2014.7035360

@articleHellebrand_Wunderlich_2014, title=SAT-Based ATPG beyond Stuck-at Fault Testing, volume=56, number=4, journal=DeGruyter Journal on Information Technology (it), publisher=DeGruyter, author=Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2014, pages=165–172 
LibreCat: /record/13054

@articleRodriguez Gomez_Cook_Indlekofer_Hellebrand_Wunderlich_2014, title=Adaptive Bayesian Diagnosis of Intermittent Faults, volume=30, number=5, journal=Journal of Electronic Testing - Theory and Applications (JETTA), publisher=Springer, author=Rodriguez Gomez, Laura and Cook, Alejandro and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2014, pages=527–540 
LibreCat: /record/13055

@articleAlizadeh_Behnam_Sadeghi-Kohan_2014, title=A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs, DOI=10.1109/tc.2014.2329687, journal=IEEE Transactions on Computers, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Alizadeh, Bijan and Behnam, Payman and Sadeghi-Kohan, Somayeh, year=2014, pages=1–1 
LibreCat: /record/46266
DOI: 10.1109/tc.2014.2329687

@inproceedingsMohammadi_Sadeghi-Kohan_Masoumi_Navabi_2014, title=An off-line MDSI interconnect BIST incorporated in BS 1149.1, DOI=10.1109/ets.2014.6847847, booktitle=2014 19th IEEE European Test Symposium (ETS), publisher=IEEE, author=Mohammadi, Marzieh and Sadeghi-Kohan, Somayeh and Masoumi, Nasser and Navabi, Zainalabedin, year=2014 
LibreCat: /record/46268
DOI: 10.1109/ets.2014.6847847

@inproceedingsSadeghi-Kohan_Behnam_Alizadeh_Fujita_Navabi_2014, title=Improving polynomial datapath debugging with HEDs, DOI=10.1109/ets.2014.6847797, booktitle=2014 19th IEEE European Test Symposium (ETS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Behnam, Payman and Alizadeh, Bijan and Fujita, Masahiro and Navabi, Zainalabedin, year=2014 
LibreCat: /record/46267
DOI: 10.1109/ets.2014.6847797

@inproceedingsHellebrand_2013, place=Cordoba, Argentina, title=Analyzing and Quantifying Fault Tolerance Properties, DOI=10.1109/latw.2013.6562662, booktitle=14th IEEE Latin American Test Workshop - (LATW’13), publisher=IEEE, author=Hellebrand, Sybille, year=2013 
LibreCat: /record/12979
DOI: 10.1109/latw.2013.6562662

@bookCook_Rodriguez Gomez_Hellebrand_Indlekofer_Wunderlich_2013, place=14th Latin American Test Workshop, Cordoba, Argentina, title=Adaptive Test and Diagnosis of Intermittent Faults, author=Cook, Alejandro and Rodriguez Gomez, Laura and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim, year=2013 
LibreCat: /record/13075

@inproceedingsSadeghi-Kohan_Namaki-Shoushtari_Javaheri_Navabi_2013, title=BS 1149.1 extensions for an online interconnect fault detection and recovery, DOI=10.1109/test.2012.6401583, booktitle=2012 IEEE International Test Conference, publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Namaki-Shoushtari, Majid and Javaheri, Fatemeh and Navabi, Zainalabedin, year=2013 
LibreCat: /record/46271
DOI: 10.1109/test.2012.6401583

@inproceedingsSadeghi-Kohan_Keshavarz_Zokaee_Farahmandi_Navabi_2013, title=A new structure for interconnect offline testing, DOI=10.1109/ewdts.2013.6673207, booktitle=East-West Design &;amp; Test Symposium (EWDTS 2013), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Keshavarz, Shahrzad and Zokaee, Farzaneh and Farahmandi, Farimah and Navabi, Zainalabedin, year=2013 
LibreCat: /record/46270
DOI: 10.1109/ewdts.2013.6673207

@inproceedingsCook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place=Quito, Ecuador, title=Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test, DOI=10.1109/latw.2012.6261229, booktitle=13th IEEE Latin American Test Workshop (LATW’12), publisher=IEEE, author=Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim, year=2012, pages=1–4 
LibreCat: /record/12980
DOI: 10.1109/latw.2012.6261229

@inproceedingsCook_Hellebrand_Wunderlich_2012, place=Annecy, France, title=Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test, DOI=10.1109/ets.2012.6233025, booktitle=17th IEEE European Test Symposium (ETS’12), publisher=IEEE, author=Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2012, pages=1–6 
LibreCat: /record/12981
DOI: 10.1109/ets.2012.6233025

@bookCook_Hellebrand_Wunderlich_2012, place=24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, title=Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern, author=Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2012 
LibreCat: /record/13074

@inproceedingsCook_Hellebrand_Indlekofer_Wunderlich_2011, place=New Delhi, India, title=Diagnostic Test of Robust Circuits, DOI=10.1109/ats.2011.55, booktitle=20th IEEE Asian Test Symposium (ATS’11), publisher=IEEE, author=Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim, year=2011, pages=285–290 
LibreCat: /record/12982
DOI: 10.1109/ats.2011.55

@inproceedingsPolian_Becker_Hellebrand_Wunderlich_Maxwell_2011, place=Trondheim, Norway, title=Towards Variation-Aware Test Methods, DOI=10.1109/ets.2011.51, booktitle=16th IEEE European Test Symposium Trondheim (ETS’11), publisher=IEEE, author=Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Maxwell, Peter, year=2011 
LibreCat: /record/12984
DOI: 10.1109/ets.2011.51

@inproceedingsCook_Hellebrand_Indlekofer_Wunderlich_2011, place=Hamburg, Germany, title=Robuster Selbsttest mit Diagnose, booktitle=5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf”, author=Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim, year=2011, pages=48–53 
LibreCat: /record/13053

@articleHopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2011, title=Variation-Aware Fault Modeling, volume=54, number=4, journal=SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer, author=Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2011, pages=1813–1826 
LibreCat: /record/13052

@inproceedingsKamran_Nemati_Sadeghi-Kohan_Navabi_2011, title=Virtual tester development using HDL/PLI, DOI=10.1109/ewdts.2010.5742156, booktitle=2010 East-West Design &;amp; Test Symposium (EWDTS), publisher=IEEE, author=Kamran, Arezoo and Nemati, Nastaran and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin, year=2011 
LibreCat: /record/46272
DOI: 10.1109/ewdts.2010.5742156

@bookFröse_Ibers_Hellebrand_2010, place=22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, title=Testdatenkompression mit Hilfe der Netzwerkinfrastruktur, author=Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille, year=2010 
LibreCat: /record/10670

@inproceedingsBecker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place=Chicago, IL, USA, title=Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits, DOI=10.1109/dsnw.2010.5542612, booktitle=40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), publisher=IEEE, author=Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim, year=2010 
LibreCat: /record/12987
DOI: 10.1109/dsnw.2010.5542612