Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, and Hans-Joachim Wunderlich. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.”https://doi.org/10.1109/test.2014.7035360__In IEEE International Test Conference (ITC’14). Seattle, Washington, USA: IEEE, 2014.https://doi.org/10.1109/test.2014.7035360 .
LibreCat: /record/12977
DOI: 10.1109/test.2014.7035360

Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” DeGruyter Journal on Information Technology (It) 56, no. 4 (2014): 165–72.
LibreCat: /record/13054

Rodriguez Gomez, Laura, Alejandro Cook, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Adaptive Bayesian Diagnosis of Intermittent Faults.” Journal of Electronic Testing - Theory and Applications (JETTA) 30, no. 5 (2014): 527–40.
LibreCat: /record/13055

Alizadeh, Bijan, Payman Behnam, and Somayeh Sadeghi-Kohan. “A Scalable Formal Debugging Approach with Auto-Correction Capability Based on Static Slicing and Dynamic Ranking for RTL Datapath Designs.”https://doi.org/10.1109/tc.2014.2329687__IEEE Transactions on Computers, 2014, 1–1.https://doi.org/10.1109/tc.2014.2329687 .
LibreCat: /record/46266
DOI: 10.1109/tc.2014.2329687

Mohammadi, Marzieh, Somayeh Sadeghi-Kohan, Nasser Masoumi, and Zainalabedin Navabi. “An Off-Line MDSI Interconnect BIST Incorporated in BS 1149.1.”https://doi.org/10.1109/ets.2014.6847847__In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014.https://doi.org/10.1109/ets.2014.6847847 .
LibreCat: /record/46268
DOI: 10.1109/ets.2014.6847847

Sadeghi-Kohan, Somayeh, Payman Behnam, Bijan Alizadeh, Masahiro Fujita, and Zainalabedin Navabi. “Improving Polynomial Datapath Debugging with HEDs.”https://doi.org/10.1109/ets.2014.6847797__In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014.https://doi.org/10.1109/ets.2014.6847797 .
LibreCat: /record/46267
DOI: 10.1109/ets.2014.6847797

Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.”https://doi.org/10.1109/latw.2013.6562662__In 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina: IEEE, 2013.https://doi.org/10.1109/latw.2013.6562662 .
LibreCat: /record/12979
DOI: 10.1109/latw.2013.6562662

Cook, Alejandro, Laura Rodriguez Gomez, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.
LibreCat: /record/13075

Sadeghi-Kohan, Somayeh, Majid Namaki-Shoushtari, Fatemeh Javaheri, and Zainalabedin Navabi. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.”https://doi.org/10.1109/test.2012.6401583__In 2012 IEEE International Test Conference. IEEE, 2013.https://doi.org/10.1109/test.2012.6401583 .
LibreCat: /record/46271
DOI: 10.1109/test.2012.6401583

Sadeghi-Kohan, Somayeh, Shahrzad Keshavarz, Farzaneh Zokaee, Farimah Farahmandi, and Zainalabedin Navabi. “A New Structure for Interconnect Offline Testing.”https://doi.org/10.1109/ewdts.2013.6673207__In East-West Design &;amp; Test Symposium (EWDTS 2013). IEEE, 2013.https://doi.org/10.1109/ewdts.2013.6673207 .
LibreCat: /record/46270
DOI: 10.1109/ewdts.2013.6673207

Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.”https://doi.org/10.1109/latw.2012.6261229__In 13th IEEE Latin American Test Workshop (LATW’12), 1–4. Quito, Ecuador: IEEE, 2012.https://doi.org/10.1109/latw.2012.6261229 .
LibreCat: /record/12980
DOI: 10.1109/latw.2012.6261229

Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.”https://doi.org/10.1109/ets.2012.6233025__In 17th IEEE European Test Symposium (ETS’12), 1–6. Annecy, France: IEEE, 2012.https://doi.org/10.1109/ets.2012.6233025 .
LibreCat: /record/12981
DOI: 10.1109/ets.2012.6233025

Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.
LibreCat: /record/13074

Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.”https://doi.org/10.1109/ats.2011.55__In 20th IEEE Asian Test Symposium (ATS’11), 285–90. New Delhi, India: IEEE, 2011.https://doi.org/10.1109/ats.2011.55 .
LibreCat: /record/12982
DOI: 10.1109/ats.2011.55

Polian, Ilia, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, and Peter Maxwell. “Towards Variation-Aware Test Methods.”https://doi.org/10.1109/ets.2011.51__In 16th IEEE European Test Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE, 2011.https://doi.org/10.1109/ets.2011.51 .
LibreCat: /record/12984
DOI: 10.1109/ets.2011.51

Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Robuster Selbsttest Mit Diagnose.” In 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 48–53. Hamburg, Germany, 2011.
LibreCat: /record/13053

Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer 54, no. 4 (2011): 1813–26.
LibreCat: /record/13052

Kamran, Arezoo, Nastaran Nemati, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Virtual Tester Development Using HDL/PLI.”https://doi.org/10.1109/ewdts.2010.5742156__In 2010 East-West Design &;amp; Test Symposium (EWDTS). IEEE, 2011.https://doi.org/10.1109/ewdts.2010.5742156 .
LibreCat: /record/46272
DOI: 10.1109/ewdts.2010.5742156

Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.
LibreCat: /record/10670

Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.”https://doi.org/10.1109/dsnw.2010.5542612__In 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10). Chicago, IL, USA: IEEE, 2010.https://doi.org/10.1109/dsnw.2010.5542612 .
LibreCat: /record/12987
DOI: 10.1109/dsnw.2010.5542612