Becker, Bernd, et al. “DFG-Projekt RealTest - Test Und Zuverlässigkeit Nanoelektronischer Systeme.” It - Information Technology, vol. 48, no. 5, 2006, pp. 305–11.
LibreCat: /record/13045

Oehler, Philipp, and Sybille Hellebrand. A Low Power Design for Embedded DRAMs with Online Consistency Checking. 2005.
LibreCat: /record/13046

Ali, Muhammad, et al. Dynamic Routing: A Prerequisite for Reliable NoCs. 2005.
LibreCat: /record/13101

Oehler, Philipp, and Sybille Hellebrand. Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study. 2005.
LibreCat: /record/13102

Ali, Muhammad, et al. “Considerations for Fault-Tolerant Networks on Chips.”10.1109/icm.2005.1590063__IEEE International Conference on Microelectronics (ICM’05), IEEE, 2005, doi:10.1109/icm.2005.1590063.
LibreCat: /record/12999
DOI: 10.1109/icm.2005.1590063

Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.”10.1109/ets.2005.28__10th IEEE European Test Symposium (ETS’05), IEEE, 2005, pp. 148–53, doi:10.1109/ets.2005.28.
LibreCat: /record/13000
DOI: 10.1109/ets.2005.28

Ali, Muhammad, et al. “A Dynamic Routing Mechanism for Network on Chip.”10.1109/norchp.2005.1596991__23rd IEEE NORCHIP Conference, IEEE, 2005, pp. 70–73, doi:10.1109/norchp.2005.1596991.
LibreCat: /record/12998
DOI: 10.1109/norchp.2005.1596991

Liu Jing, Michelle, et al. “Sensor Networks with More Features Using Less Hardware.” GOR/NGB Conference Tilburg 2004, 2004.
LibreCat: /record/13071

Breu, Ruth, et al. Im Westen Viel Neues - Informatik an Der Universität Innsbruck. 2004.
LibreCat: /record/13099

Hellebrand, Sybille, et al. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. 2004.
LibreCat: /record/13100

Wuertenberger, Armin, et al. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.”10.1109/test.2004.1387357__IEEE International Test Conference (ITC’04), IEEE, 2004, pp. 926–35, doi:10.1109/test.2004.1387357.
LibreCat: /record/13001
DOI: 10.1109/test.2004.1387357

Breu, Ruth, et al. Experiences from Teaching Software Development in a Java Environment. 2003.
LibreCat: /record/13098

Wuertenberger, Armin, et al. “A Hybrid Coding Strategy for Optimized Test Data Compression.”10.1109/test.2003.1270870__IEEE International Test Conference (ITC’03), IEEE, 2003, pp. 451–59, doi:10.1109/test.2003.1270870.
LibreCat: /record/13002
DOI: 10.1109/test.2003.1270870

Hellebrand, Sybille, and Armin Wuertenberger. Alternating Run-Length Coding: A Technique for Improved Test Data Compression. 2002.
LibreCat: /record/13097

Hellebrand, Sybille, et al. “Efficient Online and Offline Testing of Embedded DRAMs.”10.1109/tc.2002.1017700__IEEE Transactions on Computers, vol. 51, no. 7, IEEE, 2002, pp. 801–09, doi:10.1109/tc.2002.1017700.
LibreCat: /record/13003
DOI: 10.1109/tc.2002.1017700

Hellebrand, Sybille, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 18, no. 2, 2002, pp. 157–68.
LibreCat: /record/13069

Liang, Huaguo, et al. “A Mixed-Mode BIST Scheme Based on Folding Compression.” Journal on Computer Science and Technology, vol. 17, no. 2, 2002, pp. 203–12.
LibreCat: /record/13070

Liang, Hua-Guo, et al. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. 2001.
LibreCat: /record/13096

Liang, Hua-Guo, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.”10.1109/test.2001.966712__IEEE International Test Conference (ITC’01), IEEE, 2001, pp. 894–902, doi:10.1109/test.2001.966712.
LibreCat: /record/13004
DOI: 10.1109/test.2001.966712

Liang, Hua-Guo, et al. “Deterministic BIST Scheme Based on Reseeding of Folding Counters.” Journal of Computer Research and Development, (Jisuanji Yanjiu Yu Fazhan), vol. 38, no. 8, 2001, p. 931.
LibreCat: /record/13047