@inproceedingsJafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title=Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations, booktitle=European Test Symposium, The Hague, Netherlands, May 20-24, 2024, publisher=IEEE, author=Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim, pages=6 

@inproceedingsJafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title=Vmin Testing under Variations: Defect vs. Fault Coverage, booktitle=IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, publisher=IEEE, author=Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim, pages=6 

@inproceedingsHellebrand_Sadeghi-Kohan_Wunderlich, title=Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle, booktitle=International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, author=Hellebrand, Sybille and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim, pages=1 

@inproceedingsWunderlich_Jafarzadeh_Hellebrand, title=Robust Test of Small Delay Faults under  PVT-Variations, booktitle=International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, author=Wunderlich, Hans-Joachim and Jafarzadeh, Hanieh and Hellebrand, Sybille, pages=1 

@bookStiballe_Reimer_Sadeghi-Kohan_Hellebrand_2024, place=Darmstadt, Germany, title=Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression, publisher=37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”  (TuZ’24), Feb. 2024, author=Stiballe, Alisa and Reimer, Jan Dennis and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2024 

@bookGhazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place=Erfurt, Germany, title=On Cryptography Effects on Interconnect Reliability, publisher=35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, author=Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille, year=2023 

@bookSprenger_2023, place=Paderborn, title=Testinstrumente und Testdatenanalyse zur Verarbeitung von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen, DOI=10.17619/UNIPB/1-1787, publisher=Universität Paderborn, author=Sprenger, Alexander, year=2023 

@inproceedingsSadeghi-Kohan_Hellebrand_Wunderlich_2023, title=Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication, DOI=10.1109/dsn-w58399.2023.00056, booktitle=2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2023 

@inproceedingsSadeghi-Kohan_Reimer_Hellebrand_Wunderlich_2023, place=Beijing, China, title=Optimizing the Streaming of Sensor Data with Approximate Communication, booktitle=IEEE Asian Test Symposium (ATS’23), October 2023, author=Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2023 

@articleSadeghi-Kohan_Hellebrand_Wunderlich_2023, title=Workload-Aware Periodic Interconnect BIST, DOI=10.1109/mdat.2023.3298849, journal=IEEE Design &;Test, publisher=Institute of Electrical and Electronics Engineers (IEEE), author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2023, pages=1–1 

@inproceedingsJafarzadeh_Klemme_Reimer_Najafi Haghi _Amrouch_Hellebrand _Wunderlich_2023, place=Anaheim, CA, USA, title=Robust Pattern Generation for Small Delay Faults under Process Variations, booktitle=IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023, publisher=IEEE, author=Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria and  Amrouch, Hussam and Hellebrand, Sybille and  Wunderlich, Hans-Joachim, year=2023 

@articleSadeghi-Kohan_Hellebrand_Wunderlich_2022, title=Stress-Aware Periodic Test of Interconnects, DOI=10.1007/s10836-021-05979-5, journal=Journal of Electronic Testing, publisher=Springer Science and Business Media LLC, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2022 

@bookSadeghi-Kohan_Hellebrand_Wunderlich_2022, place=Online, title=EM-Aware Interconnect BIST, publisher=European Workshop on Silicon Lifecycle Management, March 18, 2022, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2022 

@inproceedingsSprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place=Virtual Conference - Originally Frascati (Rome), Italy, title=Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study, booktitle=IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, author=Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille, year=2020 

@bookSadeghi-Kohan_Hellebrand_2020, place=Ludwigsburg, title=Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, publisher=32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2020 

@inproceedingsSadeghi-Kohan_Hellebrand_2020, place=Virtual Conference - Originally San Diego, CA, USA, title=Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, DOI=10.1109/vts48691.2020.9107591, booktitle=38th IEEE VLSI Test Symposium (VTS), publisher=IEEE, author=Sadeghi-Kohan, Somayeh and Hellebrand, Sybille, year=2020 

@inproceedingsHolst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020, place=Virtual Conference - Originally Washington, DC, USA, title=Logic Fault Diagnosis of Hidden Delay Defects, booktitle=IEEE International Test Conference (ITC’20), November 2020, author=Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing, year=2020 

@bookMaaz_Sprenger_Hellebrand_2019, place=Prien am Chiemsee, title=A Hybrid Space Compactor for Varying X-Rates, publisher=31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), author=Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille, year=2019 

@articleSprenger_Hellebrand_2019, title=Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test, volume=28, DOI=10.1142/s0218126619400012, number=1, journal=Journal of Circuits, Systems and Computers, publisher=World Scientific Publishing Company, author=Sprenger, Alexander and Hellebrand, Sybille, year=2019, pages=1–23 

@articleKampmann_A. Kochte_Liu_Schneider_Hellebrand_Wunderlich_2019, title=Built-in Test for Hidden Delay Faults, volume=38, number=10, journal=IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), publisher=IEEE, author=Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider, Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim, year=2019, pages=1956–1968