Wuertenberger, Armin, et al. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.”10.1109/test.2004.1387357__IEEE International Test Conference (ITC’04), IEEE, 2004, pp. 926–35, doi:10.1109/test.2004.1387357.

Breu, Ruth, et al. Experiences from Teaching Software Development in a Java Environment. 2003.

Wuertenberger, Armin, et al. “A Hybrid Coding Strategy for Optimized Test Data Compression.”10.1109/test.2003.1270870__IEEE International Test Conference (ITC’03), IEEE, 2003, pp. 451–59, doi:10.1109/test.2003.1270870.

Hellebrand, Sybille, and Armin Wuertenberger. Alternating Run-Length Coding: A Technique for Improved Test Data Compression. 2002.

Hellebrand, Sybille, et al. “Efficient Online and Offline Testing of Embedded DRAMs.”10.1109/tc.2002.1017700__IEEE Transactions on Computers, vol. 51, no. 7, IEEE, 2002, pp. 801–09, doi:10.1109/tc.2002.1017700.

Hellebrand, Sybille, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 18, no. 2, 2002, pp. 157–68.

Liang, Huaguo, et al. “A Mixed-Mode BIST Scheme Based on Folding Compression.” Journal on Computer Science and Technology, vol. 17, no. 2, 2002, pp. 203–12.

Liang, Hua-Guo, et al. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. 2001.

Liang, Hua-Guo, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.”10.1109/test.2001.966712__IEEE International Test Conference (ITC’01), IEEE, 2001, pp. 894–902, doi:10.1109/test.2001.966712.

Liang, Hua-Guo, et al. “Deterministic BIST Scheme Based on Reseeding of Folding Counters.” Journal of Computer Research and Development, (Jisuanji Yanjiu Yu Fazhan), vol. 38, no. 8, 2001, p. 931.

Hellebrand, Sybille, et al. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 17, no. 3/4, 2001, pp. 341–49.

Hellebrand, Sybille, and Hans-Joachim Wunderlich. Hardwarepraktikum Im Diplomstudiengang Informatik. 2000.

Hellebrand, Sybille, et al. A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. 2000.

Hellebrand, Sybille, et al. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.”10.1109/test.2000.894274__IEEE International Test Conference (ITC’00), IEEE, 2000, pp. 778–84, doi:10.1109/test.2000.894274.

Hellebrand, Sybille. Selbsttestbare Steuerwerke - Strukturen Und Syntheseverfahren. Verlag Dr. Kovac, Hamburg, 1999.

Hellebrand, Sybille, et al. Exploiting Symmetries to Speed Up Transparent BIST. 1999.

Hellebrand, Sybille, et al. “Error Detecting Refreshment for Embedded DRAMs.”10.1109/vtest.1999.766693__17th IEEE VLSI Test Symposium (VTS’99), IEEE, 1999, pp. 384–90, doi:10.1109/vtest.1999.766693.

N. Yarmolik, Vyacheslav, et al. “Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms.” Third European Dependable Computing Conference (EDCC-3), 1999.

Hellebrand, Sybille, et al. “Symmetric Transparent BIST for RAMs.” Design Automation and Test in Europe (DATE’99), 1999, pp. 702–07.

Hellebrand, Sybille, and Hans-Joachim Wunderlich. Test Und Synthese Schneller Eingebetteter Systeme. 1998.