Kampmann M, Hellebrand S. X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz.; 2017.

Kampmann M, Hellebrand S. Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. In: 20th IEEE International Symposium on Design &; Diagnostics of Electronic Circuits &; Systems (DDECS’17). IEEE; 2017. doi:10.1109/ddecs.2017.7934564

Sadeghi-Kohan S, Kamal M, Navabi Z. Self-Adjusting Monitor for Measuring Aging Rate and Advancement. IEEE Transactions on Emerging Topics in Computing. 2017;8(3):627-641. doi:10.1109/tetc.2017.2771441

Jenihhin M, Kamkin A, Navabi Z, Sadeghi-Kohan S. Universal mitigation of NBTI-induced aging by design randomization. In: 2016 IEEE East-West Design &; Test Symposium (EWDTS). IEEE; 2017. doi:10.1109/ewdts.2016.7807635

Kampmann M, Hellebrand S. X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In: 25th IEEE Asian Test Symposium (ATS’16). Hiroshima, Japan: IEEE; 2016:1-6. doi:10.1109/ats.2016.20

Kampmann M, A. Kochte M, Schneider E, Indlekofer T, Hellebrand S, Wunderlich H-J. Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In: 24th IEEE Asian Test Symposium (ATS’15). Mumbai, India: IEEE; 2015:109-114. doi:10.1109/ats.2015.26

Huang Z, Liang H, Hellebrand S. A High Performance SEU Tolerant Latch. Journal of Electronic Testing - Theory and Applications (JETTA). 2015;31(4):349-359.

Hellebrand S, Indlekofer T, Kampmann M, Kochte M, Liu C, Wunderlich H-J. Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany; 2015.

Sadeghi-Kohan S, Kamran A, Forooghifar F, Navabi Z. Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation. In: 2015 10th International Conference on Design &; Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE; 2015. doi:10.1109/dtis.2015.7127373

Sadeghi-Kohan S, Kamal M, McNeil J, Prinetto P, Navabi Z. Online self adjusting progressive age monitoring of timing variations. In: 2015 10th International Conference on Design &; Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE; 2015. doi:10.1109/dtis.2015.7127368

Hellebrand S, Indlekofer T, Kampmann M, A. Kochte M, Liu C, Wunderlich H-J. FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects. In: IEEE International Test Conference (ITC’14). Seattle, Washington, USA: IEEE; 2014. doi:10.1109/test.2014.7035360

Hellebrand S, Wunderlich H-J. SAT-Based ATPG beyond Stuck-at Fault Testing. DeGruyter Journal on Information Technology (it). 2014;56(4):165-172.

Rodriguez Gomez L, Cook A, Indlekofer T, Hellebrand S, Wunderlich H-J. Adaptive Bayesian Diagnosis of Intermittent Faults. Journal of Electronic Testing - Theory and Applications (JETTA). 2014;30(5):527-540.

Alizadeh B, Behnam P, Sadeghi-Kohan S. A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs. IEEE Transactions on Computers. Published online 2014:1-1. doi:10.1109/tc.2014.2329687

Mohammadi M, Sadeghi-Kohan S, Masoumi N, Navabi Z. An off-line MDSI interconnect BIST incorporated in BS 1149.1. In: 2014 19th IEEE European Test Symposium (ETS). IEEE; 2014. doi:10.1109/ets.2014.6847847

Sadeghi-Kohan S, Behnam P, Alizadeh B, Fujita M, Navabi Z. Improving polynomial datapath debugging with HEDs. In: 2014 19th IEEE European Test Symposium (ETS). IEEE; 2014. doi:10.1109/ets.2014.6847797

Hellebrand S. Analyzing and Quantifying Fault Tolerance Properties. In: 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina: IEEE; 2013. doi:10.1109/latw.2013.6562662

Cook A, Rodriguez Gomez L, Hellebrand S, Indlekofer T, Wunderlich H-J. Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina; 2013.

Sadeghi-Kohan S, Namaki-Shoushtari M, Javaheri F, Navabi Z. BS 1149.1 extensions for an online interconnect fault detection and recovery. In: 2012 IEEE International Test Conference. IEEE; 2013. doi:10.1109/test.2012.6401583

Sadeghi-Kohan S, Keshavarz S, Zokaee F, Farahmandi F, Navabi Z. A new structure for interconnect offline testing. In: East-West Design &;amp; Test Symposium (EWDTS 2013). IEEE; 2013. doi:10.1109/ewdts.2013.6673207