M. Kampmann and S. Hellebrand, X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.

M. Kampmann and S. Hellebrand, “Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test,”10.1109/ddecs.2017.7934564__2017, doi:10.1109/ddecs.2017.7934564 .

S. Sadeghi-Kohan, M. Kamal, and Z. Navabi, “Self-Adjusting Monitor for Measuring Aging Rate and Advancement,”10.1109/tetc.2017.2771441__IEEE Transactions on Emerging Topics in Computing, vol. 8, no. 3, pp. 627–641, 2017, doi:10.1109/tetc.2017.2771441 .

M. Jenihhin, A. Kamkin, Z. Navabi, and S. Sadeghi-Kohan, “Universal mitigation of NBTI-induced aging by design randomization,”10.1109/ewdts.2016.7807635__2017, doi:10.1109/ewdts.2016.7807635 .

M. Kampmann and S. Hellebrand, “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test,” in 25th IEEE Asian Test Symposium (ATS’16), 2016, pp. 1–6.

M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, and H.-J. Wunderlich, “Optimized Selection of Frequencies for Faster-Than-at-Speed Test,” in 24th IEEE Asian Test Symposium (ATS’15), 2015, pp. 109–114.

Z. Huang, H. Liang, and S. Hellebrand, “A High Performance SEU Tolerant Latch,” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 31, no. 4, pp. 349–359, 2015.

S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, and H.-J. Wunderlich, Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.

S. Sadeghi-Kohan, A. Kamran, F. Forooghifar, and Z. Navabi, “Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation,”10.1109/dtis.2015.7127373__2015, doi:10.1109/dtis.2015.7127373 .

S. Sadeghi-Kohan, M. Kamal, J. McNeil, P. Prinetto, and Z. Navabi, “Online self adjusting progressive age monitoring of timing variations,”10.1109/dtis.2015.7127368__2015, doi:10.1109/dtis.2015.7127368 .

S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, and H.-J. Wunderlich, “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects,” in IEEE International Test Conference (ITC’14), 2014.

S. Hellebrand and H.-J. Wunderlich, “SAT-Based ATPG beyond Stuck-at Fault Testing,” DeGruyter Journal on Information Technology (it), vol. 56, no. 4, pp. 165–172, 2014.

L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, and H.-J. Wunderlich, “Adaptive Bayesian Diagnosis of Intermittent Faults,” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 30, no. 5, pp. 527–540, 2014.

B. Alizadeh, P. Behnam, and S. Sadeghi-Kohan, “A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs,”10.1109/tc.2014.2329687__IEEE Transactions on Computers, pp. 1–1, 2014, doi:10.1109/tc.2014.2329687 .

M. Mohammadi, S. Sadeghi-Kohan, N. Masoumi, and Z. Navabi, “An off-line MDSI interconnect BIST incorporated in BS 1149.1,”10.1109/ets.2014.6847847__2014, doi:10.1109/ets.2014.6847847 .

S. Sadeghi-Kohan, P. Behnam, B. Alizadeh, M. Fujita, and Z. Navabi, “Improving polynomial datapath debugging with HEDs,”10.1109/ets.2014.6847797__2014, doi:10.1109/ets.2014.6847797 .

S. Hellebrand, “Analyzing and Quantifying Fault Tolerance Properties,” in 14th IEEE Latin American Test Workshop - (LATW’13), 2013.

A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.

S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, and Z. Navabi, “BS 1149.1 extensions for an online interconnect fault detection and recovery,”10.1109/test.2012.6401583__2013, doi:10.1109/test.2012.6401583 .

S. Sadeghi-Kohan, S. Keshavarz, F. Zokaee, F. Farahmandi, and Z. Navabi, “A new structure for interconnect offline testing,”10.1109/ewdts.2013.6673207__2013, doi:10.1109/ewdts.2013.6673207 .