Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, and Hans-Joachim Wunderlich. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.”https://doi.org/10.1109/test.2014.7035360__In IEEE International Test Conference (ITC’14). Seattle, Washington, USA: IEEE, 2014.https://doi.org/10.1109/test.2014.7035360 .

Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” DeGruyter Journal on Information Technology (It) 56, no. 4 (2014): 165–72.

Rodriguez Gomez, Laura, Alejandro Cook, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Adaptive Bayesian Diagnosis of Intermittent Faults.” Journal of Electronic Testing - Theory and Applications (JETTA) 30, no. 5 (2014): 527–40.

Alizadeh, Bijan, Payman Behnam, and Somayeh Sadeghi-Kohan. “A Scalable Formal Debugging Approach with Auto-Correction Capability Based on Static Slicing and Dynamic Ranking for RTL Datapath Designs.”https://doi.org/10.1109/tc.2014.2329687__IEEE Transactions on Computers, 2014, 1–1.https://doi.org/10.1109/tc.2014.2329687 .

Mohammadi, Marzieh, Somayeh Sadeghi-Kohan, Nasser Masoumi, and Zainalabedin Navabi. “An Off-Line MDSI Interconnect BIST Incorporated in BS 1149.1.”https://doi.org/10.1109/ets.2014.6847847__In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014.https://doi.org/10.1109/ets.2014.6847847 .

Sadeghi-Kohan, Somayeh, Payman Behnam, Bijan Alizadeh, Masahiro Fujita, and Zainalabedin Navabi. “Improving Polynomial Datapath Debugging with HEDs.”https://doi.org/10.1109/ets.2014.6847797__In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014.https://doi.org/10.1109/ets.2014.6847797 .

Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.”https://doi.org/10.1109/latw.2013.6562662__In 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina: IEEE, 2013.https://doi.org/10.1109/latw.2013.6562662 .

Cook, Alejandro, Laura Rodriguez Gomez, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.

Sadeghi-Kohan, Somayeh, Majid Namaki-Shoushtari, Fatemeh Javaheri, and Zainalabedin Navabi. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.”https://doi.org/10.1109/test.2012.6401583__In 2012 IEEE International Test Conference. IEEE, 2013.https://doi.org/10.1109/test.2012.6401583 .

Sadeghi-Kohan, Somayeh, Shahrzad Keshavarz, Farzaneh Zokaee, Farimah Farahmandi, and Zainalabedin Navabi. “A New Structure for Interconnect Offline Testing.”https://doi.org/10.1109/ewdts.2013.6673207__In East-West Design &;amp; Test Symposium (EWDTS 2013). IEEE, 2013.https://doi.org/10.1109/ewdts.2013.6673207 .

Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.”https://doi.org/10.1109/latw.2012.6261229__In 13th IEEE Latin American Test Workshop (LATW’12), 1–4. Quito, Ecuador: IEEE, 2012.https://doi.org/10.1109/latw.2012.6261229 .

Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.”https://doi.org/10.1109/ets.2012.6233025__In 17th IEEE European Test Symposium (ETS’12), 1–6. Annecy, France: IEEE, 2012.https://doi.org/10.1109/ets.2012.6233025 .

Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.

Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.”https://doi.org/10.1109/ats.2011.55__In 20th IEEE Asian Test Symposium (ATS’11), 285–90. New Delhi, India: IEEE, 2011.https://doi.org/10.1109/ats.2011.55 .

Polian, Ilia, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, and Peter Maxwell. “Towards Variation-Aware Test Methods.”https://doi.org/10.1109/ets.2011.51__In 16th IEEE European Test Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE, 2011.https://doi.org/10.1109/ets.2011.51 .

Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Robuster Selbsttest Mit Diagnose.” In 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 48–53. Hamburg, Germany, 2011.

Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer 54, no. 4 (2011): 1813–26.

Kamran, Arezoo, Nastaran Nemati, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Virtual Tester Development Using HDL/PLI.”https://doi.org/10.1109/ewdts.2010.5742156__In 2010 East-West Design &;amp; Test Symposium (EWDTS). IEEE, 2011.https://doi.org/10.1109/ewdts.2010.5742156 .

Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.

Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.”https://doi.org/10.1109/dsnw.2010.5542612__In 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10). Chicago, IL, USA: IEEE, 2010.https://doi.org/10.1109/dsnw.2010.5542612 .