Hellebrand, Sybille, et al. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.”10.1109/test.2014.7035360__IEEE International Test Conference (ITC’14), IEEE, 2014, doi:10.1109/test.2014.7035360.

Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” DeGruyter Journal on Information Technology (It), vol. 56, no. 4, DeGruyter, 2014, pp. 165–72.

Rodriguez Gomez, Laura, et al. “Adaptive Bayesian Diagnosis of Intermittent Faults.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 30, no. 5, Springer, 2014, pp. 527–40.

Alizadeh, Bijan, et al. “A Scalable Formal Debugging Approach with Auto-Correction Capability Based on Static Slicing and Dynamic Ranking for RTL Datapath Designs.”10.1109/tc.2014.2329687__IEEE Transactions on Computers, Institute of Electrical and Electronics Engineers (IEEE), 2014, pp. 1–1, doi:10.1109/tc.2014.2329687.

Mohammadi, Marzieh, et al. “An Off-Line MDSI Interconnect BIST Incorporated in BS 1149.1.”10.1109/ets.2014.6847847__2014 19th IEEE European Test Symposium (ETS), IEEE, 2014, doi:10.1109/ets.2014.6847847.

Sadeghi-Kohan, Somayeh, et al. “Improving Polynomial Datapath Debugging with HEDs.”10.1109/ets.2014.6847797__2014 19th IEEE European Test Symposium (ETS), IEEE, 2014, doi:10.1109/ets.2014.6847797.

Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.”10.1109/latw.2013.6562662__14th IEEE Latin American Test Workshop - (LATW’13), IEEE, 2013, doi:10.1109/latw.2013.6562662.

Cook, Alejandro, et al. Adaptive Test and Diagnosis of Intermittent Faults. 2013.

Sadeghi-Kohan, Somayeh, et al. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.”10.1109/test.2012.6401583__2012 IEEE International Test Conference, IEEE, 2013, doi:10.1109/test.2012.6401583.

Sadeghi-Kohan, Somayeh, et al. “A New Structure for Interconnect Offline Testing.”10.1109/ewdts.2013.6673207__East-West Design &;amp; Test Symposium (EWDTS 2013), IEEE, 2013, doi:10.1109/ewdts.2013.6673207.

Cook, Alejandro, et al. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.”10.1109/latw.2012.6261229__13th IEEE Latin American Test Workshop (LATW’12), IEEE, 2012, pp. 1–4, doi:10.1109/latw.2012.6261229.

Cook, Alejandro, et al. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.”10.1109/ets.2012.6233025__17th IEEE European Test Symposium (ETS’12), IEEE, 2012, pp. 1–6, doi:10.1109/ets.2012.6233025.

Cook, Alejandro, et al. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 2012.

Cook, Alejandro, et al. “Diagnostic Test of Robust Circuits.”10.1109/ats.2011.55__20th IEEE Asian Test Symposium (ATS’11), IEEE, 2011, pp. 285–90, doi:10.1109/ats.2011.55.

Polian, Ilia, et al. “Towards Variation-Aware Test Methods.”10.1109/ets.2011.51__16th IEEE European Test Symposium Trondheim (ETS’11), IEEE, 2011, doi:10.1109/ets.2011.51.

Cook, Alejandro, et al. “Robuster Selbsttest Mit Diagnose.” 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 2011, pp. 48–53.

Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer, vol. 54, no. 4, 2011, pp. 1813–26.

Kamran, Arezoo, et al. “Virtual Tester Development Using HDL/PLI.”10.1109/ewdts.2010.5742156__2010 East-West Design &;amp; Test Symposium (EWDTS), IEEE, 2011, doi:10.1109/ewdts.2010.5742156.

Fröse, Viktor, et al. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 2010.

Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.”10.1109/dsnw.2010.5542612__40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), IEEE, 2010, doi:10.1109/dsnw.2010.5542612.